05/2009 - Državni zavod za intelektualno vlasništvo
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05/2009 - Državni zavod za intelektualno vlasništvo

05/2009 - Državni zavod za intelektualno vlasništvo

05/2009 - Državni zavod za intelektualno vlasništvo

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1962 HR - Patenti - Hrvatski glasnik <strong>intelektualno</strong>g vlasništva 16, <strong>2009</strong>, 5, 1863 – 2065C07K 14/495 (2006.01)C07K 14/61 (2006.01)A61K 47/42 (2006.01)A61K 39/00 (2006.01)C07K 14/52 (2006.01)C07K 14/59 (2006.01)C07K 1/04 (2006.01)C07K 7/54 (2006.01)(86) PCT/NL2007<strong>05</strong>0374 26.07.2007.(96) EP 07793875.1 26.07.2007.(87) WO2008013454, 31.01.2008. 2008<strong>05</strong>(97) EP 2<strong>05</strong>2253, 29.04.<strong>2009</strong>. <strong>2009</strong>18, En(31) 06076478 (32) 26.07.2006. (33) EP(54) IMMUNOGENIC COMPOUNDS AND PROTEIN MIMICS(71) PEPSCAN SYSTEMS B.V., Edelhertweg 15, 8219 PH Lelystad, NL(72) TIMMERMAN, Peter, Rozengaard 19-44, NL-8212 DT Lelystad, NLPUIJK, Wouter, Cornelis, Schoener 43-40, NL-8243 VZ Lelystad,NLMELOEN, Robbert, Hans, Karveel 10-04, NL-8231 AP Lelystad, NL(51) MKPG01R 23/10 (2006.01) (97) EP 2<strong>05</strong>2266 *(86) PCT/IB2007<strong>05</strong>3043 02.08.2007.(96) EP 078<strong>05</strong>284.2 02.08.2007.(87) WO2008017988, 14.02.2008. 200807(97) EP 2<strong>05</strong>2266, 29.04.<strong>2009</strong>. <strong>2009</strong>18, En(31) 06118622 (32) 08.08.2006. (33) EP(54) DEVICE AND METHOD FOR MEASURING THE FREQUENCY OFA SIGNAL CODED MODULATED CARRIER SIGNAL(71) NXP B.V., High Tech Campus 60, 5656 AG Eindhoven, NL(72) PIEBER, Michael, c/o NXP Semiconductors Austria GmbHIntellectual Property Department Gutheil-Schoder-Gasse 8-12, A-1102 Vienna, ATBREITFUSS, Klemens, c/o NXP Semiconductors Austria GmbHIntellectual Property Department Gutheil-Schoder-Gasse 8-12, A-1102 Vienna, AT(51) MKPG01V 3/12 (2006.01) (97) EP 2<strong>05</strong>4740 *(86) PCT/GB2007003201 23.08.2007.(96) EP 07804<strong>05</strong>1.6 23.08.2007.(87) WO2008023174, 28.02.2008. 200809(97) EP 2<strong>05</strong>4740, 06.<strong>05</strong>.<strong>2009</strong>. <strong>2009</strong>19, En(31) 0616784 (32) 24.08.2006. (33) GB(54) REDUCTION OF NOISE IN ELECTRICAL FIELDMEASUREMENTS(71) MTEM Ltd., 10 Bankhead Crossway South, Edinburgh EH11 4EP,GB(72) ZIOLKOWSKI, Anton, 10 Bankhead Crossway South, EdinburghEH11 4EP, GBCARSON, Richard, 10 Bankhead Crossway South, EdinburghEH11 4EP, GB(51) MKPG02B 27/34 (2006.01) (97) EP 2<strong>05</strong>4753 *G02B 27/30 (2006.01)G02B 23/10 (2006.01)(86) PCT/US2007017682 08.08.2007.(96) EP 07811208.3 08.08.2007.(87) WO2008021158, 21.02.2008. 200808(97) EP 2<strong>05</strong>4753, 06.<strong>05</strong>.<strong>2009</strong>. <strong>2009</strong>19, En(31) 822207 P (32) 11.08.2006. (33) US(54) COMBINING OUTPUTS OF DEFFERENT LIGHT SOURCES(71) Light Prescriptions Innovators, LLC., 2400 Lincoln Avenue,Altadena, CA 91001, US(72) CHAVES, Julio Cesar, Calle Ortiz Compos 5 Portal 1, 2A, 28026Madrid, ESFALICOFF, Waqidi, 24979 Constitution Avenue Apt. 1138,Stevenson Ranch, CA 91381, USMINANO, Juan Carlos, Celle Santa Cruz De Marcenado 31, 28015Madrid, ESBENITEZ, Pablo, Calle Villa De Marin 37, 8A, 28029 Madrid, ESPARKYN, William A., 2531 Neko Drive, Lomita, CA 90717, US(51) MKPG01T 1/29 (2006.01) (97) EP 2047295 *G01T 1/167 (2006.01)(86) PCT/EP2007<strong>05</strong>6022 18.06.2007.(96) EP 07765469.7 18.06.2007.(87) WO2008009528, 24.01.2008. 200804(97) EP 2047295, 15.04.<strong>2009</strong>. <strong>2009</strong>16, De(31) 102006033661 (32) 20.07.2006. (33) DE(54) DETECTOR ASSEMBLY FOR DETECTING RADIATION WITHANGULAR RESOLUTION AND METHOD FOR OPERATING SAIDASSEMBLY(71) Forschungszentrum Dresden - Rossendorf e.V., BautznerLandstrasse 128, 01328 Dresden, DEKraft, Gerhard, Im Elsee 1, 64291 Darmstadt, DE(72) KRAFT, Gerhard, Im Elsee 1, 64291 Darmstadt, DEENGHARDT, Wolfgang, Schillerstr. 5, 01454 Radeberg, DEWÜRSCHIG, Thomas, Winterbergstr. 101, 01237 Dresden, DE(51) MKPG01T 1/36 (2006.01) (97) EP 2047298 *G01V 5/00 (2006.01)G01T 1/202 (2006.01)(86) PCT/EP2007<strong>05</strong>60<strong>05</strong> 18.06.2007.(96) EP 07730217.2 18.06.2007.(87) WO2008009526, 24.01.2008. 200804(97) EP 2047298, 15.04.<strong>2009</strong>. <strong>2009</strong>16, De(31) 102006033662 (32) 20.07.2006. (33) DE(54) METHOD FOR DETERMINING THE MATERIAL COMPOSITIONOF A MATERIAL SAMPLE(71) Forschungszentrum Dresden - Rossendorf e.V., BautznerLandstrasse 128, 01328 Dresden, DEKraft, Gerhard, Im Elsee 1, 64291 Darmstadt, DE(72) KRAFT, Gerhard, Im Elsee 1, 64291 Darmstadt, DEENGHARDT, Wolfgang, Schillerstr. 5, 01454 Radeberg, DEWÜRSCHIG, Thomas, Winterbergstr. 101, 01237 Dresden, DE(51) MKPG02B 3/14 (2006.01) (97) EP 2<strong>05</strong>4743 *G02B 1/06 (2006.01)B29D 11/00 (2006.01)G02B 7/04 (2006.01)(86) PCT/SG2006000243 24.08.2006.(96) EP 06769720.1 24.08.2006.(87) WO2008024071, 28.02.2008.(97) EP 2<strong>05</strong>4743, 06.<strong>05</strong>.<strong>2009</strong>. <strong>2009</strong>19, En(54) VARIABLE FOCUS ZOOM LENSES(71) Agency for Science, Technology and Research, 1 Fusionopolis WayNo 20-10 Connexis, Singapore 138632, SG(72) DHARMATILLEKE, Saman, Institute of Materials Research adnEngineering 3 Research Link, Singapore 117602, SG(51) MKPG<strong>05</strong>F 3/30 (2006.01) (97) EP 2013679 *(86) PCT/IB2007<strong>05</strong>1373 17.04.2007.(96) EP 07735518.8 17.04.2007.(87) WO2007122551, 01.11.2007. 200744(97) EP 2013679, 14.01.<strong>2009</strong>. <strong>2009</strong>03, En(31) 06113026 (32) 25.04.2006. (33) EP(54) CIRCUIT ARRANGEMENT AND CORRESPONDING METHODFOR VOLTAGE REFERENCE AND/OR FOR CURRENTREFERENCE(71) NXP B.V., High Tech Campus 60, 5656 AG Eindhoven, NL(72) KADNER, Martin, c/o NXP Semiconductors Austria GmbHIntellectual Property Department Gutheil-Schoder-Gasse 8-12, A-1102 Vienna, AT(51) MKPG06F 1/32 (2006.01) (97) EP 2<strong>05</strong>1157H04M 1/73 (2006.01)(96) EP 07118532.6 15.10.2007.(97) EP 2<strong>05</strong>1157, 22.04.<strong>2009</strong>. <strong>2009</strong>17, En(54) Method and System for Enabling or Disabling Features Basedon a Battery Level ThresholdISSN 1331-2030

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