WinXRD - spekom
WinXRD - spekom
WinXRD - spekom
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Product Specifications<br />
→ Indexing and lattice refinement:<br />
there is an automatic calculation of crystal<br />
system, lattice parameter and Miller indices<br />
based only on experimental peak file and<br />
thanks to:<br />
• Auto-indexing Treor and Manual hkl<br />
indexing<br />
• Lattice refinement with or without<br />
assigned hkl<br />
→ Export flexibility:<br />
Export function of Thermo XRD raw data<br />
format to a variety of ASCII formats allows<br />
data exploitation with other specific<br />
programs (GSAS TM , BEARTEX TM , PopLa TM ,<br />
SIROQUANT TM , etc.)<br />
→ High quality of graphics display<br />
makes sense for interpretation and<br />
presentation of data with:<br />
• Peak annotation (intensity, 2Θ position,<br />
d-spacings) from raw data<br />
• Accurate peak positioning (inserting and<br />
dragging function to adjust peak<br />
position), background subtraction.<br />
→ Multi-graph display tool is well<br />
suited for 3D displaying of multiple<br />
data files:<br />
• A well thought tool for temperature<br />
• Pre-defined variables but user can edit its<br />
own variables<br />
• Zoom, rotation, cursor to determine peak<br />
position, intensity etc..<br />
Multi-graph display<br />
Advanced data analysis with<br />
third party software<br />
→ SIROQUANT TM<br />
Based on Rietveld method, SIROQUANT has<br />
been designed for standard-less quantitative<br />
analysis<br />
• Calculation of a theoretical XRD profile to<br />
fit it to the measured pattern by<br />
refinement of the Rietveld parameters<br />
• Correction for the effects of particle size<br />
and absorption contrast<br />
• Optional internal standard addition (spike)<br />
to calculate amorphous content<br />
→ Advanced Search/Match<br />
identification thanks to DDview and<br />
SIeve software based on PDF2 or<br />
PDF4 databases<br />
• Standard and fuzzy logic search with<br />
periodic table filter and search logic filter<br />
• Clear display of results<br />
• Semi quantitative analysis based on RIR<br />
value<br />
→ Automated Quantitative analyses<br />
• Set batch job settings: angular range,<br />
speed, optic, calibration curve…<br />
• Automatic saving and printing of the<br />
quantitative results<br />
Rietveld quantification<br />
Advanced Search/Match<br />
©2005 Thermo Electron Corporation. Windows is a registered trademark of Microsoft Corp. SIROQUANT is a registered trademark of Sietronics Pty Ltd.<br />
DDView and SIeve is a registered trademark of the International Centre for Diffraction Data. GSAS is Copyright, 1984-2001, The Regents of the University of<br />
California. BEARTEX is a trademark of University at California, Berkeley CA 94720. PopLa is a trademark of Los Alamos National Laboratory. All other<br />
trademarks are the property of Thermo Electron Corporation and its subsidiaries. Specifications, terms and pricing are subject to change. Not all products are<br />
available in all countries. Please consult your local sales representative for details.<br />
PS41148_E 11/05C<br />
Thermo Electron SA, Ecublens, Switzerland is ISO certified.<br />
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