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Etudes par microscopie en champ proche des phénomènes de ...

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11IV.CONCLUSIONWe have studied spin-polarized electron transport ina ferromagnetic metal/oxi<strong>de</strong>/semiconductor junction asa function of the injection <strong>en</strong>ergy. We have observedan increase in the electron transmission and in the spin<strong>de</strong>p<strong>en</strong>d<strong>en</strong>ttransmission over several or<strong>de</strong>rs of magnitu<strong>de</strong>.Theriseinthetransmittedcurr<strong>en</strong>tcomesfromtothemultiplication by secondary electron excitation and fromthe increase in the mean <strong>en</strong>ergy of the electron distributionreaching the junction barrier. The increase in themean electron <strong>en</strong>ergy is related to the increase in the distancecrossed by electrons in the metal layer before theirvelocity is relaxed. In<strong>de</strong>ed, the electrons are scatteredforward as long as their mean velocity is not randomized.A diffusion-like transport th<strong>en</strong> takes place which favors<strong>en</strong>ergy relaxation. Wh<strong>en</strong> the injection <strong>en</strong>ergy becomessignificantly larger than the Fermi <strong>en</strong>ergy, the distanc<strong>en</strong>ecessary for the relaxation the electron velocity startsto increase. This reduces the remaining distance towardsthe metal/oxi<strong>de</strong> interface that electrons have to cross ina three-dim<strong>en</strong>sional random diffusion regime. Therefore,<strong>en</strong>ergy relaxation is reduced and the mean electron <strong>en</strong>ergyat the junction increases.This latter effect is reinforced by the two-step structureof the metal/oxi<strong>de</strong>/semiconductor junction: the lowbarrier φ SC of the semiconductor band b<strong>en</strong>ding and thehigher barrier φ Ox of the oxi<strong>de</strong> layer. This junctionstructure induces a transition betwe<strong>en</strong> two transmissionregimes : at low injection <strong>en</strong>ergy, the curr<strong>en</strong>t collectedin the semiconductor is dominated by electrons transmittedabove φ SC after crossing the oxi<strong>de</strong> layer with apoor effici<strong>en</strong>cy, and at high injection <strong>en</strong>ergy, the transmissionexhibits a stiff increase due to hot electrons whichovercome φ Ox with a transmission effici<strong>en</strong>cy of the or<strong>de</strong>rof unity. At the transition betwe<strong>en</strong> these two transmissionregimes the spin-<strong>de</strong>p<strong>en</strong>d<strong>en</strong>t compon<strong>en</strong>t of the transmittedcurr<strong>en</strong>t also exhibits a large increase, over morethan three or<strong>de</strong>rs of magnitu<strong>de</strong>, which is ev<strong>en</strong> more pronouncedthan the transmission increase. As a result, thetransmission asymmetry surges by about a factor 10 atthe transition betwe<strong>en</strong> the two regimes. A simple analysisof the spin-polarized electron transmission shows thatthe transmission spin asymmetry A C is in fact mainlygiv<strong>en</strong> by the ratio of the electron exit <strong>en</strong>ergy, which is<strong>de</strong>termined by the barrier height φ, to the electron injection<strong>en</strong>ergy : A C ≈ P 0 φ/E 0 . Therefore, the experim<strong>en</strong>taljump in asymmetry is related to the rise in the mean electrontransmission <strong>en</strong>ergy from φ SC to φ Ox . This appearsas a simple rule for the <strong>de</strong>termination of the transmissionspin-asymmetry which may be very useful, in <strong>par</strong>ticularfor the <strong><strong>de</strong>s</strong>ign of optimized spin <strong>de</strong>tector based on thinmagnetic spin-filter.This rule holds as long as the exit <strong>en</strong>ergy of the transmitte<strong>de</strong>lectrons remains close to the barrier height.But wh<strong>en</strong> the mean electron transmission <strong>en</strong>ergy becomessignificantly higher than the barrier height, thespin-selectivity of the junction dramatically <strong>de</strong>creases.As a consequ<strong>en</strong>ce, the spin-filtering effect vanishes andmay ev<strong>en</strong> be counterbalanced by the effect of the spin<strong>de</strong>p<strong>en</strong>d<strong>en</strong>tsecondary electron multiplication. Th<strong>en</strong>, thetransmission spin-asymmetry should become negative.Single barrier junction with transfer effici<strong>en</strong>cy varyingslowly versus <strong>en</strong>ergy would be appropriate structures toevid<strong>en</strong>ce the predicted negative spin-<strong>de</strong>p<strong>en</strong>d<strong>en</strong>t transmission.But in the pres<strong>en</strong>t experim<strong>en</strong>t, this effect is notobserved since it is masked by the transmission regimeabove the oxi<strong>de</strong> barrier. This is a major result for <strong>de</strong>vicesusing spin-filtering effects through a ferromagneticmetal base. In<strong>de</strong>ed, because of the pres<strong>en</strong>ce of the oxi<strong>de</strong>barrier with height φ Ox and transfer effici<strong>en</strong>cy α Ox closeto1aboveφ Ox , the spin-selectivity of the magnetic layeris fully exploited ev<strong>en</strong> at high injection <strong>en</strong>ergy. This is<strong>de</strong>monstrated by the fact that, over the whole probed injection<strong>en</strong>ergy range, the measured spin-<strong>de</strong>p<strong>en</strong>d<strong>en</strong>t transmissionis well <strong><strong>de</strong>s</strong>cribed with the simple approximationA p (ε) ≈ 1, which corresponds to spin-selectivity of 100%.Therefore, high transmission (much larger than unity)and high spin-filtering effici<strong>en</strong>cy (close to 100%) are obtainedtogether wh<strong>en</strong> operating at high injection <strong>en</strong>ergy.Of course, not only the primary electrons are effici<strong>en</strong>tlyspin-filtered, as <strong>de</strong>monstrated in the pres<strong>en</strong>t work, butalso the secondary electrons. 29 In the configuration ofthe pres<strong>en</strong>t experim<strong>en</strong>t, we can only measure the transmissionasymmetry related to the primary electron polarization.Therefore, the polarization of the secondaryelectrons can not be evid<strong>en</strong>ced since its ori<strong>en</strong>tation is<strong>de</strong>termined by that of the magnetic layer magnetizationand not by the primary electron polarization. To evid<strong>en</strong>cethe spin-filtering of secondary electrons one shoul<strong>de</strong>ither use a spin-valve structure or measure the polarizationof the transmitted electrons. This has two importantconsequ<strong>en</strong>ces. First, ev<strong>en</strong> for unpolarized injected electrons,the amplified transmitted curr<strong>en</strong>t must be highlyspin-polarized <strong>par</strong>allel to the majority spins in the ferromagneticlayer. Therefore the electron multiplicationprocess by the secondary electron casca<strong>de</strong> can be an effici<strong>en</strong>ttool for the study of highly spin-polarized electroninjection from a ferromagnetic metal into a semiconductor.Second, transistor-like <strong>de</strong>vices exhibiting largemagneto-curr<strong>en</strong>t asymmetry together with curr<strong>en</strong>t gainlarger than unity can be <strong>en</strong>visage wh<strong>en</strong> using a spin valvestructure as metallic base with a controlled base-collectorbarrier shape. The price to pay is to <strong><strong>de</strong>s</strong>ign a <strong>de</strong>vicewhich emitter-base junction may be operated at high injection<strong>en</strong>ergy.Acknowledgm<strong>en</strong>tsThe authors thank D. Paget and A. Rowe for fruitfuldiscussions and a critical reading of the manuscript.

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