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Curriculum Vitae - APC - Université Paris Diderot-Paris 7

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Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of<br />

nanoparticles<br />

Ultramicroscopy, 109, 788-796 (2009).<br />

E. Guillotel and M. Ravaro and F. Ghiglieno and C. Langlois and C. Ricolleau and S. Ducci and<br />

I Favero and G. Leo<br />

Parametric amplification in GaAs/AlOx waveguide<br />

Applied Physics Letters, 94, 171110 (2009).<br />

D. Alloyeau, C. Ricolleau, C. Mottet, T. Oikawa, C. Langlois, Y. Le Bouar, N. Braidy, A.<br />

Loiseau<br />

Size and shape effects on the order-disorder phase transition in CoPt nanoparticles<br />

Nature Materials, 8, 940-946 (2009).<br />

N. Braidy, Y. Le Bouar, M. Fèvre, C. Ricolleau<br />

Determination of the long-range order parameter from the tetragonality ratio of L10 alloys<br />

Phys. Rev. B, 81, n° 5, 054202 (2010).<br />

D. Alloyeau, G. Prévot, Y. Le Bouar, T; Oikawa, C. Langlois, A. Loiseau and C. Ricolleau<br />

Ostwald ripening in nanoalloys : when thermodynamics drives a size-dependent particle<br />

composition<br />

Phys. Rev. Letters, 105, 255901 (2010).<br />

D. Alloyeau, C. Ricolleau, C. Langlois, Y. Le Bouar and A. Loiseau<br />

Flash laser annealing for controlling size and shape of magnetic alloy nanoparticles<br />

Bilstein J. of Nanotech., 1, 55-59, (2010).<br />

M. Valamanesh, C. Langlois, D. Alloyeau, E. Lacaze, C. Ricolleau<br />

Combining moire´ patterns and high resolution transmission electron microscopy for in-plane thin<br />

films thickness determination<br />

Ultramicroscopy, 111, 149-154 (2011).<br />

D. Alloyeau, B. Stéphanidis, X. Zhao, E. Larquet, N. Boisset and C. Ricolleau<br />

Biotemplated synthesis of metallic nanoclusters organized in tunable two-dimensional<br />

superlattices<br />

Journal of Phys. Chem. C, 115, 20926-20930 (2011).<br />

C. Malgrange, C. Ricolleau, F. Lefaucheux<br />

Symétrie et Propriétés physiques des cristaux<br />

EDP Sciences / CNRS Editions (2011).

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