Untitled - Materials Science Institute of Madrid - Consejo Superior de ...
Untitled - Materials Science Institute of Madrid - Consejo Superior de ...
Untitled - Materials Science Institute of Madrid - Consejo Superior de ...
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tron beam analysis.<br />
Escobar Galindo, R.; van Veen, A.; Schut, H.; Rabbani,<br />
F.; Janssen, G.C.A.M.; <strong>de</strong> Hosson, J.Th.M.<br />
Surf. Coat. Techn. 180-181, 207-212 (2004).<br />
29. Influence <strong>of</strong> the substrate surface termination<br />
on the properties <strong>of</strong> bcc-cobalt films: GaAs(110)<br />
versus Sb/GaAs(110).<br />
Izquierdo, M.; Dávila, M.E.; Teodorescu, C.M.; Chrost,<br />
J.; Ascolani, H.; Avila, J.; Asensio, M.C.<br />
Appl. Surf. Sci. 234, 468-474 (2004).<br />
30. Surface phase transitions at metal-semiconductor<br />
interfaces: a revisit is nee<strong>de</strong>d.<br />
Dávila, M.E.; Avila, J.; Ascolani, H.; Le Lay, G.; Göthelid,<br />
M.; Karlsson, U.O.; Asensio, M.C.<br />
Appl. Surf. Sci. 234, 274-285 (2004).<br />
31. Photoelectron diffraction study <strong>of</strong> Ag growth<br />
mediated by an arsenic layer on Si(111) 1×1.<br />
Pantín, V.; Avila, J.; Dávila, M.E.; Bonnet, J.E.; Asensio,<br />
M.C.<br />
J. Electron Spectrosc. 137-140, 155-160 (2004).<br />
32. Photon energy and polarization <strong>de</strong>pen<strong>de</strong>nce <strong>of</strong><br />
the Fermi surface in optimally doped<br />
Bi 2 Sr 2 CaCu 2 O8+ superconductors.<br />
Roca, L.; Izquierdo, M.; Avila, J.; Gu, G.D.; Asensio,<br />
M.C.<br />
J. Electron Spectrosc. 137-140, 657-661 (2004).<br />
33. A new method to study hydriding processes<br />
from the inner surfaces <strong>of</strong> fuel claddings.<br />
Sacedón, J.L.; Díaz, M.; Moya, J.S.; Remartínez, B.;<br />
Izquierdo, J.<br />
J. Nucl. Mater. 327, 11-18 (2004).<br />
34. A FORTRAN-90 Low-Energy Electron Diffraction<br />
program (LEED90 v1.1).<br />
Blanco-Rey, M.; <strong>de</strong> Andres, P.; Held, G.; King, D.A.<br />
Comput. Phys. Commun. 161, 151-165 (2004).<br />
35. Molecular t-matrices for Low-Energy Electron<br />
Diffraction (TMOL v1.1).<br />
Blanco-Rey, M.; <strong>de</strong> Andres, P.; Held, G.; King, D.A.<br />
Comput. Phys. Commun. 161, 166-178 (2004).<br />
36. A combined LEIS/STM study <strong>of</strong> two types <strong>of</strong> surface<br />
reconstruction <strong>of</strong> magnetic Fe 4 N layers.<br />
Grachev, S.Yu.; Gallego, J.M.; Écija, D.; Boerma, D.O.;<br />
González-Arrabal, R.; Miranda, R.<br />
Nucl. Instrum. Meth. B 219-220, 593-598 (2004).<br />
37. A <strong>de</strong>scription <strong>of</strong> bubble growth and gas release<br />
during thermal annealing <strong>of</strong> helium implanted copper.<br />
Evans J.H.; Escobar Galindo, R.; van Veen, A.<br />
Nucl. Instrum. Meth. B 217, 276-280 (2004).<br />
38. Protrusion formation and surface porosity <strong>de</strong>velopment<br />
on thermally annealed helium implanted<br />
copper.<br />
Escobar Galindo, R.; van Veen, A.; Evans, J.H.; Schut,<br />
H.; <strong>de</strong> Hosson, J.Th.M.<br />
Nucl. Instrum. Meth. B 217, 262-275 (2004).<br />
39. A study <strong>of</strong> the formation <strong>of</strong> yttrium silici<strong>de</strong>s epitaxyally<br />
grown on Si(111).<br />
Rogero, C.; Polop, C.; Sacedón, J.L.; Martín Gago, J.A.<br />
Surf. Interface Anal. 36, 1195-1198 (2004).<br />
40. Surface characterization <strong>of</strong> the oxi<strong>de</strong> layer<br />
grown on Ti-Nb-Zr and Ti-Nb-Al alloys.<br />
Gutiérrez, A.; López, M.F.; Jiménez, J.A.; Morant, C.;<br />
Paszti, F.; Climent, A.<br />
Surf. Interface Anal. 36, 977-980 (2004).<br />
41. Experimental <strong>de</strong>termination <strong>of</strong> residual stress in<br />
silicon nitri<strong>de</strong> ceramic diffusion bonds by highenergy<br />
X- ray diffraction.<br />
Vila, M.; Martínez, M.L.; Prieto, C.; Miranzo, P.; Osendi,<br />
M.I.; Terry, A.; Vaughan G.<br />
Pow<strong>de</strong>r Technol. 148, 60-63 (2004).<br />
42. Porosity in silicon and silica thin films monitored<br />
by positrons and positronium.<br />
van Veen, A.; Escobar Galindo, R.; Eijt, S.W.H.; Schut,<br />
H.; van Gog, H.; Balkenen<strong>de</strong>, A.R.; <strong>de</strong> Theije, F.K.<br />
Mater. Sci. Forum 445-446, 254-258 (2004).<br />
43. X-ray scattering evi<strong>de</strong>nce <strong>of</strong> a new short range<br />
or<strong>de</strong>r or correlation in the high Tc superconductor<br />
Bi2Sr2CaCU2O8+<strong>de</strong>lta.<br />
Megtert, S.; Avila, J.; Izquierdo, M.; Albouy, P.A.; Gu,<br />
G.; Asensio, M.C.; Comes, R.<br />
J. Phys. IV 118, 333-341 (2004).<br />
44. Depósito <strong>de</strong> TiN sobre herramientas <strong>de</strong> corte<br />
para uso industrial.<br />
Auger, M.A.; Sánchez, O.; Albella, J.M.<br />
Bol. Soc. Esp. Ceram. V. 43, 226-228 (2004).<br />
45. Direct photo<strong>de</strong>position <strong>of</strong> nanostructured TiO 2<br />
thin films from B-diketonate complexes, and their<br />
photocatalytic behaviour.<br />
Tejos, M.; Buono-Core, G.E.; Díaz, F.R.; <strong>de</strong>l Valle, M.A.;<br />
Palomares, F.J.<br />
J. Chil. Chem. Soc. 49, 297-301 (2004).<br />
46. Pinturas rupestres <strong>de</strong> la Cueva <strong>de</strong> La Graja.<br />
Caracterización <strong>de</strong> pigmentos y análisis digital <strong>de</strong><br />
imágenes.<br />
Palomo, A.;Blanco-Varela, M.T.;Herrero, P.; Pren<strong>de</strong>s, N.<br />
Mater. Construcc. 54, 57-71 (2004).<br />
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