The SWIFT BAT Software Guide Version 6.3 30 ... - HEASARC - Nasa
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The SWIFT BAT Software Guide Version 6.3 30 ... - HEASARC - Nasa

The SWIFT BAT Software Guide Version 6.3 30 ... - HEASARC - Nasa The SWIFT BAT Software Guide Version 6.3 30 ... - HEASARC - Nasa

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D.3. BATCLEAN 121 • original: Write the input DPI filtered by the detector mask. • fit: Write the fit DPI. • bkgcleaned: Write the background cleaned DPI (input minus fit to background only). • bkgfit: Write the fit to the background only. • Choice of outversion parameter dictates what value is written to the HDUCLAS2 keyword. Possible values are: – original: HDUCLAS2 is unchanged – cleaned or bkgcleaned: HDUCLAS2 = RESIDUAL – fit or bkgfit: HDUCLAS2 = PREDICTED (clobber = NO) [boolean ] If the output file already exists, then setting “clobber = yes” will cause it to be overwritten. (chatter = 1) [integer, 0 - 5 ] Controls the amount of informative text written to standard output. Setting chatter = 4 or higher will produce detailed diagnostic output; chatter = 2 prints out a basic diagnostic message. The default is to produce no printed output. (history = NO) [boolean ] If history = YES, then a set of HISTORY keywords will be written to the header of the specified HDU in the output file to record the value of all the ftcopy task parameters that were used to produce the output file. D.3.5 EXAMPLES Note that when commands are issued on the Unix command line, strings containing special characters such as ‘[’ or ‘]’ must be enclosed in single or double quotes.The following examples illustrate ways in which batclean can be used. 1. Fit the simple background model to a DPI with a detector mask file. Output the cleaned DPI and a background exposure map. batclean input.dpi cleaned.dpi detmask=bat.mask backexp=backexp2.dph srcclean=NO 2. Fit a set of source models along with a simple background model to a DPI, using the default aperture file. Output the fit to the focal plane instead of the cleaned focal plane. A flat-fielding correction is applied in the forward projection. batclean input.dpi fit.dpi catalog.tbl detmask=bat.mask outversion="fit" corrections="flatfield" 3. Fit two user-supplied background models in addition to the hard-coded model.

122 APPENDIX D. BAT SOFTWARE TOOL REFERENCE batclean input.dpi cleaned.dpi detmask=bat.mask bkgmodel=model1.dpi,model2.dpi 4. Same example, except the user gives the two model files as lines in the text file “models.lst.” batclean input.dpi cleaned.dpi detmask=bat.mask bkgmodel=@models.lst 5. Balancing is performed after cleaning, applying the Module and InOut balancings. batclean input.dpi cleaned.dpi detmask=bat.mask balance=Module,InOut D.3.6 BUGS D.3.7 SEE ALSO batcelldetect, batmaskwtimg D.3.8 REFERENCES • Based on Netlib code http://www.netlib.org/c/numcomp-free-c Name : svd.c.Z (8704 bytes) Where : in pub/C-numanal on ftp.usc.edu Description : SVD based on pascal from J. C. Nash book Author : Bryant Marks (bryant@sioux.stanford.edu) Brian Collett (bcollett@hamilton.edu) Version : 14 April 1993 • Statistics for low count rates from K. Mighell (ApJ 518, p. 380, 1999) D.3.9 LAST MODIFIED Apr 2007

122 APPENDIX D. <strong>BAT</strong> SOFTWARE TOOL REFERENCE<br />

batclean input.dpi cleaned.dpi detmask=bat.mask bkgmodel=model1.dpi,model2.dpi<br />

4. Same example, except the user gives the two model files as lines in the text file “models.lst.”<br />

batclean input.dpi cleaned.dpi detmask=bat.mask bkgmodel=@models.lst<br />

5. Balancing is performed after cleaning, applying the Module and InOut balancings.<br />

batclean input.dpi cleaned.dpi detmask=bat.mask balance=Module,InOut<br />

D.3.6 BUGS<br />

D.3.7 SEE ALSO<br />

batcelldetect, batmaskwtimg<br />

D.3.8 REFERENCES<br />

• Based on Netlib code http://www.netlib.org/c/numcomp-free-c<br />

Name : svd.c.Z (8704 bytes)<br />

Where : in pub/C-numanal on ftp.usc.edu<br />

Description : SVD based on pascal from J. C. Nash book<br />

Author : Bryant Marks (bryant@sioux.stanford.edu)<br />

Brian Collett (bcollett@hamilton.edu)<br />

<strong>Version</strong> : 14 April 1993<br />

• Statistics for low count rates from K. Mighell (ApJ 518, p. 380, 1999)<br />

D.3.9 LAST MODIFIED<br />

Apr 2007

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