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Conference Program - LOPE-C 2011

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SCIENTIFIC CONF. | THURSDAY-JUNE 30, <strong>2011</strong><br />

Track 4<br />

Inorganic Materials (11:30 am - 01:20 pm) | LOCATION HARMONIE D / LEVEL C2<br />

01:00 pm Electrical Properties of SAM Modified ITO Surface using Aromatic Small Molecules with Double Bond Carboxylic Acid Groups for OLED Applications<br />

Mr Ali Kemal Havare,<br />

Ege University, PhD student, Turkey<br />

The energy level alignment and charge injection in organic light emitting diodes (OLED) device is a significant step to elucidate this organic semiconductors and to optimize<br />

their performance. The weak bonding at the organic/inorganic interface in OLEDs due to incompatible structural difference is one of the limiting parameters for the stability<br />

and performance of OLEDs. One of the most important issues in OLED devices is to be able to control electrode/organic interface and the differences between the work<br />

function of the anode (ITO) and HOMO level of the organic semiconducting hole transport layer (HTL) material. This difference can cause high turn on voltage, low<br />

efficiency and restricts hole-injection [1-2].<br />

In this work, 5-[(3-Metifenil)(fenil)amino]izoftalic acid (5-MePIFA) and 5-(Difenil)amino]izoftalic acid (5-DPIFA) organic molecules were synthesized to form self-assembled<br />

monolayer on indium tin oxide (ITO) anode to enhance hole transport from ITO to organic hole transport layers such as TPD and NPB. SAM molecules with 1mM were<br />

prepared at room temperature in ethanol solution. ITO substrates were kept in ethanol-SAM solution for 48 hours to be covered with SAM monolayer. The modified surface<br />

was characterized by atomic force microscopy (AFM) and Scanning Tunneling Microscopy (STM). The change in the surface potential was measured by Kelvin probe force<br />

microscopy (KPFM). Our Kelvin Probe Force Microscopy (KPFM) measurements showed that the surface potentials increased more than 100 mV with reference to bare<br />

indium tin-oxide. The Schottky barrier parameters have been obtained from I-V measurements. The results show that the threshold voltage on OLEDs with modified ITO is<br />

lowered significantly compare to OLEDs with unmodified ITO.<br />

[1] C.N. Li, C.Y. Kwong,A.B. Djuris?ic,P.T., Thin Solid Films 2005, 477,57-62<br />

[2] Y. Rosenwaks, R. Shikler, Th. Glatzel, S. Sadewasser, Phys. Rev. B.,2004, 70,085320.<br />

01:20 pm LUNCH BREAK<br />

page 90

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