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Catalytic Synthesis and Characterization of Biodegradable ...

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Chapter 1<br />

the device is switched to a low resistance near –4.5 V as the threshold voltage. The low<br />

resistance state is maintained during the reverse sweep <strong>of</strong> the voltage from –5 to +1.4 V. The<br />

low-resistance or ON state was observed for repeated sweeps, regardless <strong>of</strong> the sweep<br />

direction. When a bias <strong>of</strong> –1.5 V was applied, the device sharply switched to the<br />

high-resistance or OFF state again. In the hysteretic curve, the ON–OFF ratio amounted to<br />

four orders <strong>of</strong> magnitude. The retention cycles <strong>of</strong> the ON <strong>and</strong> OFF states under open-circuit<br />

conditions persisted for more than 10 4 times. Furthermore, each state survived for a month<br />

after the corresponding once-time-only pulse as well as consecutive pulses.<br />

The charge injection at the radical polymer/electrode interface <strong>and</strong> transport in the bulk <strong>of</strong><br />

the radical polymer layer are dominated by the Schottky barrier <strong>and</strong> the Poole–Frenkel<br />

mechanism. In the ON state, charges are trapped at the radical polymer/PVDF interfaces, <strong>and</strong><br />

induce accumulation <strong>of</strong> the opposite charge at the radical polymer/electrode interfaces <strong>and</strong><br />

reduction the Schottky barriers, allowing charges to transfer across the radical<br />

polymer/electrode interfaces even at low voltages. 192 The SOMO levels <strong>of</strong> the p-type PTMA<br />

<strong>and</strong> the n-type PGSt are near 5.4 <strong>and</strong> 4.7 eV, respectively.<br />

Figure 1.6.5 p-type <strong>and</strong> n-type radical polymer-based memory architecture, <strong>and</strong> charge injection,<br />

transporting, <strong>and</strong> trapping configuration.<br />

The p-type layer accepts holes, <strong>and</strong> electrons are injected into the n-type layer. The<br />

injected holes <strong>and</strong> electrons are transported by the hopping mechanism, <strong>and</strong> are stored at the<br />

radical polymer/PVDF interfaces. Under open-circuit conditions, the trapped holes <strong>and</strong><br />

electrons were nonvolatile due to charge trapping at the radical polymer/PVDF interfaces <strong>and</strong><br />

to blocking <strong>of</strong> the charge transfer in the polymer layers having sufficient resistances. The<br />

asymmetric configuration <strong>of</strong> the electrodes with the different work functions allows<br />

‐ 44 ‐

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