Application Compendium - Agilent Technologies

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For a number of years, the progress in AFM is in part related to the developments and applications of FM mode. Nowadays this technique, which was originally employed in UHV as the alternative (to AM) way of detection tip-sample force interactions and scanning, is also used for highresolution imaging in air and under liquid. The high-resolution images of mica, self-assemblies of alkanethiols, and polydiacetylene (PDA) crystals were recorded with FM using the homemade set-ups [6–7]. These periodical structures are characterized by spacings above 0.5nm and in some cases the molecular-scale individual defects were observed. The similar findings were reported with AM mode [8]. Several high-resolution images, which were obtained in AM with the 5500 microscope, are shown at the right. A number of molecular-resolution images in AM mode were obtained in air on surface of PDA crystal. This crystal can be cleaved and the largest atomically-smooth face of the PDA crystal with few linear defects (Fig. 6, top right) is most suitable for molecular-scale imaging. At higher magnification, the periodical pattern mimicking the crystalline structure of the bc-plane can be obtained, Figs. 6 (top right and bottom). This lattice with the orthogonal spacings of 0.5nm (the repeat distance along the c-axis) and 0.7nm (a half of the repeat distance along the b-axis) is detected in the experiments with different probes, Figs. 7. Despite the similarity of the image patterns obtained with different probes the image variations are noticeable and there is definitely a lack of high-resolution of fine atomic-scale features. The latter is the common feature of the images obtained in AM and FM modes in air and under liquid is that the spacings smaller than 0.5nm are poorly resolved. The situation is only slightly better for the images in the contact mode, where in addition to visualization of mica surface the lattices of MoS2 or graphite can be also observed. The contact mode images of these layered materials are shown in Figs. 8. The original images are quite noisy and the periodical lattices can be enhanced with FFT procedure that leads 20nm Figure 6. AFM images of polydiacetylene crystal obtained in amplitude modulation mode in air. A red rectangle indicates the crystallographic lattice on the bc-plane of this crystal. Figure 8. Top row – topography images of three layered crystals obtained in the contact AFM mode. The topography contours along these images are presented underneath them in the middle row. Bottom row – 3D representations of the crystallographic surface structure of carbon, Se and potassium atoms. 3 topography 23nm Figure 7. AFM images of polydiacetylene crystal obtained in amplitude modulation mode in air. The probe was different from that in the experiment in Figure 6. Graphite (2.5Å) WSe2 (3.2Å) 15nm Mica (5.2Å) 8nm 10nm 10nm
to perfect hexagonal patterns, which are imbedded in the top part of the images. The topography traces along the images are presented underneath, and they show that the surface corrugations increase from 40pm (graphite) to 300pm (mica). Therefore, the molecular-scale imaging of mica is less demanding due to the larger corrugations and interatomic separations as seen from the 3D sketches of the atomic surface structure of the crystals (see the bottom of Figs. 8). In summary, the current status of the atomic-scale imaging in AFM is not satisfactory and there is a room for further improvements. The progress of the high-resolution imaging in the oscillatory AM and FM modes is most desirable because these modes can be applied to much broader range of materials including soft objects as compared with the contact mode AFM. This progress relies on instrumental improvements (better signal-to-noise characteristics, low thermal drift, improved detection and control of the tip-sample forces, etc.) and the use of sharp probes. The other issue is related to the better understanding of the nature of atomic-scale resolution in AFM, which is discussed since first successful visualization of atomic- and molecular-scale lattices in the contact mode. In this mode the single atomic-scale defects have never been practically recorded. Therefore, such imaging provides only the lattice resolution in the contrast to true atomic resolution where a detection of such defects is expected. The imaging of the periodical lattices with the defects was later demonstrated in FM and AM images (first in UHV and later in ambient conditions) yet the results of the computer simulation revealed that visualization of the defects does not necessarily mean that the surrounding molecular order is correctly reproduced in the images [9–10]. These findings emphasize a need of a thorough interplay between the experiment and theory in the analysis of the atomicscale data. References 1. W. Stocker et al Polym. Bull. 1991, 26, 215–222 2. G. C. McGonigal, R. H. Bernhardt, and D. J. Thomson, Appl. Phys. Lett. 1990, 57, 28. 3. W. Liang et al Adv. Mater. 1993, 5, 817–821. 4. S. N. Magonov, and N. A. Yerina Langmuir 2003, 19, 500–504. 5. L. Gross et al, Science 2009, 324, 142. 6. T. Fukuma et. al. Appl. Phys. Lett. 2005, 86, 193108. 7. T. Fukuma et. al. Appl. Phys. Lett. 2005, 86, 034103. 8. D. Klinov, and S. Magonov Appl. Phys. Lett. 2004, 84, 2697. 9. S. Belikov, and S. Magonov Jap. Jour. Appl. Phys. 2006, 45, 2158. 10. S. Belikov, and S. Magonov Proc. Amer. Control Soc., St. Louis, 2009, 979. AFM Instrumentation from Agilent Technologies Agilent Technologies offers high-precision, modular AFM solutions for research, industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies. www.agilent.com/find/afm Americas Canada (877) 894 4414 Latin America 305 269 7500 United States (800) 829 4444 Asia Pacific Australia 1 800 629 485 China 800 810 0189 Hong Kong 800 938 693 India 1 800 112 929 Japan 0120 (421) 345 Korea 080 769 0800 Malaysia 1 800 888 848 Singapore 1 800 375 8100 Taiwan 0800 047 866 Thailand 1 800 226 008 Europe & Middle East Austria 43 (0) 1 360 277 1571 Belgium 32 (0) 2 404 93 40 Denmark 45 70 13 15 15 Finland 358 (0) 10 855 2100 France 0825 010 700* *0.125 €/minute Germany 49 (0) 7031 464 6333 Ireland 1890 924 204 Israel 972-3-9288-504/544 Italy 39 02 92 60 8484 Netherlands 31 (0) 20 547 2111 Spain 34 (91) 631 3300 Sweden 0200-88 22 55 Switzerland 0800 80 53 53 United Kingdom 44 (0) 118 9276201 Other European Countries: www.agilent.com/find/contactus Product specifications and descriptions in this document subject to change without notice. © Agilent Technologies, Inc. 2010 Printed in USA, March 6, 2010 5990-5479EN
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MATERIALS TESTING AND RESEARCH SOLU
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When accuracy and reliability in me
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AGILENT TECHNOLOGIES APPLICATIONS F
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Figure 1. Agilent Cary 630 FTIR spe
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The calibration samples were measur
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Author Frank Higgins Agilent Techno
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Figure 1. The overlaid aliphatic be
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Author John Seelenbinder Agilent Te
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Figure 3. Sample is lightly pressed
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Author Dr. Mustafa Kansiz Agilent T
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microscopy provides for a factor of
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Standard ATR IR Image No Pressure (
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A visual inspection of the sample u
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Experimental Instrumentation To per
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Authors Jonah Kirkwood † and Must
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Spectra were collected from each lo
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Infrared mapping allows for multipl
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The spectra in Figure 2 are visuall
Page 37 and 38: Conclusion Agilent‟s Cary 610 FTI
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 51 and 52: The calibration curve for the deter
Page 53 and 54: Figure 6. The MicroLab PC FTIR soft
Page 55 and 56: Summary An analytically representat
Page 57 and 58: Figure 3. The Irganox 1010 peak are
Page 61 and 62: The calibration curve and equation
Page 63 and 64: Select ‘Peak Ratio’ - from the
Page 65 and 66: Summary An analytically representat
Page 67 and 68: Figure 3. The GMS peak height absor
Page 69 and 70: Advanced Atomic Force Microscopy: E
Page 71 and 72: signal) image indicating the overwh
Page 73 and 74: A dependence of surface potential o
Page 75 and 76: A B C Figure 6A-C. The topography (
Page 77 and 78: A B Figure 10A-C. The topography (A
Page 79 and 80: KFM with AM-FM operation in the int
Page 81 and 82: ibbons is only slightly different f
Page 83 and 84: References 1. G. Binnig, C.F. Quate
Page 85 and 86: Figure 1. AFM topographic image of
Page 87: 100nm 100nm 350nm 100nm Figure 3. A
Page 91 and 92: Single-pass KFM studies have been k
Page 93 and 94: images due to the difference of the
Page 95 and 96: 0.5 V) of the nanowires. Additional
Page 97 and 98: appeared in the topography image. T
Page 99 and 100: of PSS component. TEM studies of mo
Page 101 and 102: Atomic Force Microscopy Studies in
Page 103 and 104: on graphite and MoS2 are shown in F
Page 105 and 106: A B C D Scan size: 5 µm. Scan size
Page 107 and 108: images of PEDOT:PSS blend, (PEDOT -
Page 109 and 110: Young’s Modulus of Dielectric ‘
Page 111 and 112: Figure 3. Young’s modulus as a fu
Page 113 and 114: Nanoindentation, Scratch, and Eleva
Page 115 and 116: The samples listed as “D” sampl
Page 117 and 118: Figure 6. Elastic modulus results f
Page 119 and 120: Figure 11. Elastic modulus results
Page 121 and 122: Sample B Figure 16. Scratch curves
Page 123 and 124: Conclusions Nanoindentation and scr
Page 125 and 126: measurement technique has been expl
Page 127 and 128: References 1. J.L. Hay, “Using In
Page 129 and 130: Theory The complex shear modulus (G
Page 131 and 132: References 1. Jain, S.K., Bhattacha
Page 133 and 134: LCCC relies on carrying out isocrat
Page 135 and 136: log Mp 5 4.6 4.2 3.8 0.5 15% Water
Page 137 and 138: Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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