Application Compendium - Agilent Technologies

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31. R.V. Martinez, N.S. Losilla, J. Martinez, Y. Huttel, and R. Garcia “Patterning Polymeric Structures with 2 nm Resolution at 3 nm Half Pitch in Ambient Conditions” Nano Letters 2007, 7, 1846-1850. 32. S.N. Magonov, and N. Yerina “High Temperature Atomic Force Microscopy of Normal Alkane C60H122 Films on Graphite” Langmuir 2003, 19, 500-504. 33. A. Mourran, B. Tartsch, M. Gallyamov, S. Magonov, D. Lambreva, B.I. Ostrovskii, I.P. Dolbnya, W.H. de Jeu, and M. Moeller “Self-assembly of the perfluoroalkylalkane F14H20 in ultrathin films” Langmuir 2005, 21, 2308-2316. 34. M. Nakamura, and T. Yamada in “Roadmap 2005 of Scanning Probe Microscopy” ed. S. Morita, Ch.6 “Electrostatic Force Microscopy” pp. 43-51, Springer, (Springer, Berlin, 2006). 35. J. Colchero, A. Gil, A.M. Baro “Resolution enhancement and improved data interpretation in electrostatic force microscopy” Phys. Rev. B 2001, 64, 245403 (11). 36. U. Zerweck, CH. Loppacher, T. Otto, S. Grafstroem, and L.M. Eng “Accuracy and resolution limits of Kelvin probe force microscopy“ Phys. Rev. B 2005, 71, 125424 (10). 37. A. El Abed, M-C. Faure, E. Pouzet, and O. Abilon “Experimental evidence for an original two-dimensional phase structure: An antiparallel semifluorinated monolayer at the air-water interface” Phys. Rev. E 2002, 5, 051603 (4). 38. T. Kato, M. Kameyama, M. Eahara, and K. Iimura “Monodisperse Two- Dimensional Nanometer Size Clusters of Partially Fluorinated Long-Chain Acids” Langmuir 1998, 14, 1786-1798. 39. Y. Ren, K. Iimura, A. Ogawa, and T. Kato “Surface micelles of CF3(CF2)7(CH2)10COOH on aqueous La3+ subphase investigated by atomic force microscopy and infrared spectroscopy” J. Phys. Chem. B 2001, 105, 4305-4312. 40. M. Maaloum, P. Muller, and M.P. Krafft “Monodisperse surface micelles of nonpolar amphiphiles in Langmuir monolayers” Angew. Chem. 2002, 114, 4507-4510. 41. J. Alexander, S. Magonov, M. Moeller “Topography and Surface Potential in Kelvin Force Microscopy of Perfluoroalkyl Alkanes Self-Assemblies” JVST, 2008, submitted. 42. M. Zhao, V. Sharma, H. Wei, R.R. Birge, J.A. Stuart, F. Papadimitrakopoulos and B.D. Huey “Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging” Nanotechnology 2008, 19, 235707 (7) 43. J. Alexander, and S. Magonov “Exploring organization of amphiphilic compounds with atomic force microscopy” Proceedings of X. Annual AFM Winter Workshop, Linz, 2008, in press. 44. H. Sugimura, Y. Ishida, K. Hayashi, O. Takai, and N. Nakagiri “Potential shielding by the surface water layer in Kelvin probe force microscopy” Appl. Phys. Lett. 2002, 80, 1459-1461. 45. R.W. Stark, N. Naujoks, and A. Stemmer “Multifrequency electrostatic force microscopy in the repulsive regime” Nanotechnology 2007, 18, 0655023 (7). AFM Instrumentation from Agilent Technologies Agilent Technologies offers high-precision, modular AFM solutions for research, industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies. www.agilent.com/find/afm www.agilent.com For more information on Agilent Technologies’ products, applications or services, please contact your local Agilent office. The complete list is available at: www.agilent.com/find/contactus Phone or Fax United States: (tel) 800 829 4444 (fax) 800 829 4433 Canada: (tel) 877 894 4414 (fax) 800 746 4866 China: (tel) 800 810 0189 (fax) 800 820 2816 Europe: (tel) 31 20 547 2111 Japan: (tel) (81) 426 56 7832 (fax) (81) 426 56 7840 Korea: (tel) (080) 769 0800 (fax) (080) 769 0900 Latin America: (tel) (305) 269 7500 Taiwan: (tel) 0800 047 866 (fax) 0800 286 331 Other Asia Pacific Countries: tm_ap@agilent.com (tel) (65) 6375 8100 (fax) (65) 6755 0042 Product specifications and descriptions in this document subject to change without notice. © Agilent Technologies, Inc. 2008 Printed in USA, December 15, 2008 5989-9740EN
Figure 1. AFM topographic image of n-C36H74 on graphite. Scan size: 350 nm × 350 nm. Figure 2. AFM topographic image of n-C36H74 on graphite. Scan size: 55 nm × 55 nm. Agilent 5600LS AFM High-resolution Imaging Molecular-level Understanding of n-Alkanes Self-Assembly onto Graphite Application Note Jing-jiang Yu, Ph.D. Agilent Technologies The adsorption of organic molecules from solution onto a solid surface has attracted tremendous attention as it is fundamentally associated to many phenomena of both industrial and academic relevance. Governed by an intricate balance between adsorbate-substrate and adsorbateadsorbate interactions, spontaneous self-organization of molecules at the interface may lead to the formation of delicate ultrathin films with nanometerscale ordered surface structures due to the molecular-level packing in a particular way. Various techniques have been reported to investigate those organic layers. For instance, differential scanning calorimetry (DSC) provides an effective means to probe the surface phase behavior. The structural information normal to the interface, to some extent, can be extracted from neutron reflectivity measurements. So far, the real time 3D structural characterization with atomic or molecular scale details of the assemblies especially the top layer comes mainly from scanning probe microscopy techniques. In this application brief, the capability of atomic force microscopy (AFM) to directly visualize soft thin film materials with true molecular resolution is demonstrated using self-assembly of n-C36H74 molecules on graphite as an example. All the data displayed here are acquired from an Agilent 5600LS system with a 90 μm large scanner. A typical AFM topographic image of n-C36H74 upon adsorption on HOPG is shown in Figure 1, from which rich information about this sample is revealed. First, molecules are aligned on the substrate with long-range order and exhibit a striped morphology. Second, existence of local defect areas is captured. As can be seen, the whole image is divided into four segments by two long and one short domain boundaries and a protrusion island is observed near the bottom location. Those surface features correspond to adsorbed molecules in an amorphous state. Third, two different orientations of the molecular packing are identified. The stripes in the left-upper corner are exactly 60° rotated with respect to those in the remaining three domains, reflecting the impact of underneath substrate (i.e., the 6-fold symmetry graphite) on n-C36H74 alignment on the surface. Figure 2 is another n-C36H74 / graphite topography image with a larger magnification to deliver important information at single molecular level. It shows that the stripe width is about 4.5 nm, which is matching well with the molecular length of n-C36H74 with a fully extended configuration. Furthermore, the linear backbones (i.e., hydrocarbon chains with an all-tans configuration) of individual n-C36H74 molecules are resolved at lower part of the image. These results unambiguously illustrate that n-C36H74 molecules are lying down and orderly aligned on graphite to form a lamellar packing structure. In conclusion, AFM is a powerful surface characterization tool with an unprecedented high-resolution. Materials surface structures with sub-5 nm size in lateral dimensions can be resolved clearly, thus making it possible to achieve molecular-level understanding of the adsorption behavior of long-chain molecules at the solid-solution interface.
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MATERIALS TESTING AND RESEARCH SOLU
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When accuracy and reliability in me
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AGILENT TECHNOLOGIES APPLICATIONS F
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Figure 1. Agilent Cary 630 FTIR spe
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The calibration samples were measur
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Author Frank Higgins Agilent Techno
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Figure 1. The overlaid aliphatic be
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Author John Seelenbinder Agilent Te
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Figure 3. Sample is lightly pressed
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Author Dr. Mustafa Kansiz Agilent T
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microscopy provides for a factor of
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Standard ATR IR Image No Pressure (
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A visual inspection of the sample u
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Experimental Instrumentation To per
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Authors Jonah Kirkwood † and Must
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Spectra were collected from each lo
Page 33 and 34: Infrared mapping allows for multipl
Page 35 and 36: The spectra in Figure 2 are visuall
Page 37 and 38: Conclusion Agilent‟s Cary 610 FTI
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 51 and 52: The calibration curve for the deter
Page 53 and 54: Figure 6. The MicroLab PC FTIR soft
Page 55 and 56: Summary An analytically representat
Page 57 and 58: Figure 3. The Irganox 1010 peak are
Page 61 and 62: The calibration curve and equation
Page 63 and 64: Select ‘Peak Ratio’ - from the
Page 65 and 66: Summary An analytically representat
Page 67 and 68: Figure 3. The GMS peak height absor
Page 69 and 70: Advanced Atomic Force Microscopy: E
Page 71 and 72: signal) image indicating the overwh
Page 73 and 74: A dependence of surface potential o
Page 75 and 76: A B C Figure 6A-C. The topography (
Page 77 and 78: A B Figure 10A-C. The topography (A
Page 79 and 80: KFM with AM-FM operation in the int
Page 81 and 82: ibbons is only slightly different f
Page 83: References 1. G. Binnig, C.F. Quate
Page 87 and 88: 100nm 100nm 350nm 100nm Figure 3. A
Page 89 and 90: to perfect hexagonal patterns, whic
Page 91 and 92: Single-pass KFM studies have been k
Page 93 and 94: images due to the difference of the
Page 95 and 96: 0.5 V) of the nanowires. Additional
Page 97 and 98: appeared in the topography image. T
Page 99 and 100: of PSS component. TEM studies of mo
Page 101 and 102: Atomic Force Microscopy Studies in
Page 103 and 104: on graphite and MoS2 are shown in F
Page 105 and 106: A B C D Scan size: 5 µm. Scan size
Page 107 and 108: images of PEDOT:PSS blend, (PEDOT -
Page 109 and 110: Young’s Modulus of Dielectric ‘
Page 111 and 112: Figure 3. Young’s modulus as a fu
Page 113 and 114: Nanoindentation, Scratch, and Eleva
Page 115 and 116: The samples listed as “D” sampl
Page 117 and 118: Figure 6. Elastic modulus results f
Page 119 and 120: Figure 11. Elastic modulus results
Page 121 and 122: Sample B Figure 16. Scratch curves
Page 123 and 124: Conclusions Nanoindentation and scr
Page 125 and 126: measurement technique has been expl
Page 127 and 128: References 1. J.L. Hay, “Using In
Page 129 and 130: Theory The complex shear modulus (G
Page 131 and 132: References 1. Jain, S.K., Bhattacha
Page 133 and 134: LCCC relies on carrying out isocrat
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log Mp 5 4.6 4.2 3.8 0.5 15% Water
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Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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