Application Compendium - Agilent Technologies

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A B Figure 5A-C. The topography (A) and surface potential (B) images of SRAM. The cross-section profiles along the directions indicated with white arrows in (A) and (B) are shown in the top and bottom parts of (C). at velec=10 kHz by optimizing servo gain parameters. The experimental protocol for KFM also includes a compensation of the occasional contribution to surface potential measurements from the probe and sample surroundings; which causes a dependence of surface potential on the probe-sample separation. This dependence is eliminated by finding the proper offset voltage. The optimization procedures for KFM measurements are described in more detail in 27 . In the single-pass KFM experiment one needs to select vmech and velec. A mechanical drive of the probe is typically done at vmech chosen near the first flexural resonance of the cantilever, whereas the electric servo loop is set either at much lower frequency or at the second or even third flexural mode. The following arguments are usually considered in the choice of velec. The electrostatic probe response is higher at the resonant frequencies, yet this also increases the possibility the cross-talk between different force interactions. The cross-talk is less probable when velec
A B C Figure 6A-C. The topography (A) and surface potential (B) images of a SiGe structure. The cross-section profiles along the directions indicated with white arrows in (A) and (B) are shown in the top and bottom parts of (C). structure. In KFM of semiconductors a correlation between the surface potential as the probe location and surface Fermi level is established by a following equation: (6) EFs – Evac – Vprobe – fp, where EFs - the surface Fermi level, Evac – vacuum level, Vprobe – surface potential measured by the probe, and fp – work function of the probe material. Therefore, evaluation of local surface Fermi level is a feasible task in KFM of semiconductor samples, 29 after a proper calibration of the probe, an appropriate sample preparation and thoroughly performed the experiments. These applications are beyond the scope of this paper. In further evaluation of KFM operation we conducted experiments similar to those described in 10 , which are often used for surface lithography. 30-31 In these experiments, surface charges were deposited by a tip-sample voltage discharge on surface of PMMA and normal alkane C60H122 layers on Si and graphite, respectively. The charges were deposited above the voltage threshold, which is around 5-10 V (depending on a layer thickness and annealing state), and a 2 msec pulse was used. The first pair of images in Figures 7A-B shows the PMMA topography and a circular surface charge pattern with maximum around 1.5 V. In this case, there is no discernible cross-talk between the charge and topography. The situation is different when a higher voltage impulse was applied, Figures 7C-D. The topography image exhibits a pattern of complex shape with negative and positive levels, thus demonstrating a strong involvement of the electrostatic forces in the tracking feedback when the local charge is large, Figure 7D. In other words, the large spatial dimensions and high A B C D E F Figure 7A-F. The topography (A, C, E) and surface potential (B, D, F) images of PMMA layers on Si around the locations subjected to tip-voltage pulses. The inserts in the (B-D) show the cross-section profiles along the directions indicated with white arrows. (E) - (F) The topography and surface potential images of normal alkane C60H122 adsorbate on graphite around the location subjected to a tip-voltage pulse. 7
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MATERIALS TESTING AND RESEARCH SOLU
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When accuracy and reliability in me
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AGILENT TECHNOLOGIES APPLICATIONS F
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Figure 1. Agilent Cary 630 FTIR spe
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The calibration samples were measur
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Author Frank Higgins Agilent Techno
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Figure 1. The overlaid aliphatic be
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Author John Seelenbinder Agilent Te
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Figure 3. Sample is lightly pressed
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Author Dr. Mustafa Kansiz Agilent T
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microscopy provides for a factor of
Page 23 and 24: Standard ATR IR Image No Pressure (
Page 25 and 26: A visual inspection of the sample u
Page 27 and 28: Experimental Instrumentation To per
Page 29 and 30: Authors Jonah Kirkwood † and Must
Page 31 and 32: Spectra were collected from each lo
Page 33 and 34: Infrared mapping allows for multipl
Page 35 and 36: The spectra in Figure 2 are visuall
Page 37 and 38: Conclusion Agilent‟s Cary 610 FTI
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 51 and 52: The calibration curve for the deter
Page 53 and 54: Figure 6. The MicroLab PC FTIR soft
Page 55 and 56: Summary An analytically representat
Page 57 and 58: Figure 3. The Irganox 1010 peak are
Page 61 and 62: The calibration curve and equation
Page 63 and 64: Select ‘Peak Ratio’ - from the
Page 65 and 66: Summary An analytically representat
Page 67 and 68: Figure 3. The GMS peak height absor
Page 69 and 70: Advanced Atomic Force Microscopy: E
Page 71 and 72: signal) image indicating the overwh
Page 73: A dependence of surface potential o
Page 77 and 78: A B Figure 10A-C. The topography (A
Page 79 and 80: KFM with AM-FM operation in the int
Page 81 and 82: ibbons is only slightly different f
Page 83 and 84: References 1. G. Binnig, C.F. Quate
Page 85 and 86: Figure 1. AFM topographic image of
Page 87 and 88: 100nm 100nm 350nm 100nm Figure 3. A
Page 89 and 90: to perfect hexagonal patterns, whic
Page 91 and 92: Single-pass KFM studies have been k
Page 93 and 94: images due to the difference of the
Page 95 and 96: 0.5 V) of the nanowires. Additional
Page 97 and 98: appeared in the topography image. T
Page 99 and 100: of PSS component. TEM studies of mo
Page 101 and 102: Atomic Force Microscopy Studies in
Page 103 and 104: on graphite and MoS2 are shown in F
Page 105 and 106: A B C D Scan size: 5 µm. Scan size
Page 107 and 108: images of PEDOT:PSS blend, (PEDOT -
Page 109 and 110: Young’s Modulus of Dielectric ‘
Page 111 and 112: Figure 3. Young’s modulus as a fu
Page 113 and 114: Nanoindentation, Scratch, and Eleva
Page 115 and 116: The samples listed as “D” sampl
Page 117 and 118: Figure 6. Elastic modulus results f
Page 119 and 120: Figure 11. Elastic modulus results
Page 121 and 122: Sample B Figure 16. Scratch curves
Page 123 and 124: Conclusions Nanoindentation and scr
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measurement technique has been expl
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References 1. J.L. Hay, “Using In
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Theory The complex shear modulus (G
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References 1. Jain, S.K., Bhattacha
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LCCC relies on carrying out isocrat
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log Mp 5 4.6 4.2 3.8 0.5 15% Water
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Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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