Application Compendium - Agilent Technologies

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Figure 6. Typical ester carbonyl absorbance for glycerol monostearate in polypropylene With the ratio defined from the Method Configuration section, the new method is ready to be used to obtain at least triplicate measurements of each calibration standard. Unknown polymer coupons should also be run with a minimum of three measurements around the coupon. This process is made simple and convenient with the DialPath or TumblIR transmission cells. Users can see the exact point of measurement in real time, and quickly reposition the sample for the replicate measurements. Plot the values measured for the ratio relative to the GMS concentration (Figure 2), and insert the slope and offset values back into the method as shown in Figures 5 and 6. Once the slope and offset values have been entered, the Microlab PC FTIR software method will report the GMS concentration. The MicroLab PC FTIR software method, Polymer — Glycerol Monostearate in Polypropylene v1, includes the calibration data from Figure 2. This calibrated method is available with the Agilent 5500 and 4500 Series DialPath or TumblIR FTIR spectrometers, as well as the Cary 630 FTIR spectrometers. This method and software performs all the calculations automatically and reports the final value as % Glycerol Monostearate (Figure 7). The values obtained from triplicate determinations should be averaged to give the final reported concentration. Conclusion Figure 7. The MicroLab PC FTIR software prediction result for a 0.1% GMS in polypropylene sample This analytical method demonstrates how the Agilent Cary 630 FTIR can be used to easily and accurately measure polymer thin films. The unique sampling capabilities of the DialPath and TumblIR provide a simple mechanism to mount your sample, while the step-by-step method-driven software with color-coded, actionable results guides you through your analysis to ensure that your samples are measured with minimum effort and highest accuracy. 5
Advanced Atomic Force Microscopy: Exploring Measurements of Local Electric Properties Application Note Sergei Magonov, John Alexander Agilent Technologies Introduction In the past two decades Atomic Force Microscopy (AFM) 1 has been recognized as a powerful characterization method of surfaces at small scales and in different environments. In addition to high-resolution visualization of surface morphology and nanoscale structures, AFM microscopes are also broadly applied for examination of mechanical, electromagnetic, optical and other properties. The core of this technology is the measurement and control of force interactions between a minute probe and a sample surface. Practically, such measurements can be performed at a single location and applied for surface imaging with contact or oscillatory techniques. The techniques complement each other yet studies of soft matter are mostly carried out with oscillatory amplitude modulation (AM) mode. 2-3 Despite an expanding penetration of AFM and the related scanning probe microscopy methods into academic and industrial research, a critical analysis of the existing capabilities of this method reveals a number of undeveloped areas that are essential for further progress of the field. We will mention only a few of them. The current efforts towards imaging with true molecular and atomic resolution in different environments benefit from an extension of frequency modulation (FM) mode 4 to measurements in air and under liquid. 5 The improvement of noise characteristics of AFM electronics and the minimization of thermal drift of the microscopes will undoubtedly assist researchers using extremely sharp probes in achieving superior imaging resolution. In the probing of local mechanical and electric properties increasing attention is paid to multi-frequency measurements that offer new capabilities for quantitative analysis. Studies employing multifrequency measurements in the broad frequency range help avoid cross-talk of topography with mechanical and electric tip-sample force effects and have other advantages. A successful realization of these possibilities simultaneously with improved resolution of imaging and mapping of materials’ properties will open new horizons for AFM characterization especially if these applications can be performed in the properly-controlled environments. This goal can be achieved only in direct interplay of instrumentation developments and their practical verification on various samples. This is our vision of advanced AFM and we hope that this paper supports it. In the commercial scanning probe microscopes made by Agilent Technologies the first steps towards advanced AFM measurements were undertaken with the introduction of the MAC III accessory especially useful for multi-frequency measurements. The MAC III has three dual phase lock-in amplifiers (LIA) converting the AC inputs to amplitude and phase. These digitally-controlled analog LIA have a broad bandwidth (up to 6 MHz) that covers the operation bandwidth of the photodetector employed in the microscope. The auxiliary inputs and drive outputs are accessible through the MACIII signal access box. The software, which is flexible in routing signals back to the microscope controller, supports two servo systems related to these LIA. One LIA is used for AM tracking of sample topography with the probe peak-to-peak amplitude or its X-, Y- vector components used for feedback. The other servo can be applied to electric or mechanical measurements. The third LIA can be used for tuning the operational parameters or for recording various signals (lateral response, torsional signal, harmonics, etc) during measurements. Voltages up to 20 V in DC or in different pulse regimes can be applied to the probesample junction as an external stimulus for lithography or other applications.
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MATERIALS TESTING AND RESEARCH SOLU
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When accuracy and reliability in me
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AGILENT TECHNOLOGIES APPLICATIONS F
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Figure 1. Agilent Cary 630 FTIR spe
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The calibration samples were measur
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Author Frank Higgins Agilent Techno
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Figure 1. The overlaid aliphatic be
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Author John Seelenbinder Agilent Te
Page 17 and 18: Figure 3. Sample is lightly pressed
Page 19 and 20: Author Dr. Mustafa Kansiz Agilent T
Page 21 and 22: microscopy provides for a factor of
Page 23 and 24: Standard ATR IR Image No Pressure (
Page 25 and 26: A visual inspection of the sample u
Page 27 and 28: Experimental Instrumentation To per
Page 29 and 30: Authors Jonah Kirkwood † and Must
Page 31 and 32: Spectra were collected from each lo
Page 33 and 34: Infrared mapping allows for multipl
Page 35 and 36: The spectra in Figure 2 are visuall
Page 37 and 38: Conclusion Agilent‟s Cary 610 FTI
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 51 and 52: The calibration curve for the deter
Page 53 and 54: Figure 6. The MicroLab PC FTIR soft
Page 55 and 56: Summary An analytically representat
Page 57 and 58: Figure 3. The Irganox 1010 peak are
Page 61 and 62: The calibration curve and equation
Page 63 and 64: Select ‘Peak Ratio’ - from the
Page 65 and 66: Summary An analytically representat
Page 67: Figure 3. The GMS peak height absor
Page 71 and 72: signal) image indicating the overwh
Page 73 and 74: A dependence of surface potential o
Page 75 and 76: A B C Figure 6A-C. The topography (
Page 77 and 78: A B Figure 10A-C. The topography (A
Page 79 and 80: KFM with AM-FM operation in the int
Page 81 and 82: ibbons is only slightly different f
Page 83 and 84: References 1. G. Binnig, C.F. Quate
Page 85 and 86: Figure 1. AFM topographic image of
Page 87 and 88: 100nm 100nm 350nm 100nm Figure 3. A
Page 89 and 90: to perfect hexagonal patterns, whic
Page 91 and 92: Single-pass KFM studies have been k
Page 93 and 94: images due to the difference of the
Page 95 and 96: 0.5 V) of the nanowires. Additional
Page 97 and 98: appeared in the topography image. T
Page 99 and 100: of PSS component. TEM studies of mo
Page 101 and 102: Atomic Force Microscopy Studies in
Page 103 and 104: on graphite and MoS2 are shown in F
Page 105 and 106: A B C D Scan size: 5 µm. Scan size
Page 107 and 108: images of PEDOT:PSS blend, (PEDOT -
Page 109 and 110: Young’s Modulus of Dielectric ‘
Page 111 and 112: Figure 3. Young’s modulus as a fu
Page 113 and 114: Nanoindentation, Scratch, and Eleva
Page 115 and 116: The samples listed as “D” sampl
Page 117 and 118: Figure 6. Elastic modulus results f
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Figure 11. Elastic modulus results
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Sample B Figure 16. Scratch curves
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Conclusions Nanoindentation and scr
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measurement technique has been expl
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References 1. J.L. Hay, “Using In
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Theory The complex shear modulus (G
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References 1. Jain, S.K., Bhattacha
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LCCC relies on carrying out isocrat
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log Mp 5 4.6 4.2 3.8 0.5 15% Water
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Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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