Application Compendium - Agilent Technologies

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Method configuration To determine the vinyl concentration, measure the area under the absorbance band for the vinyl CH wag group at 908 cm -1 relative to a baseline drawn between 926 and 898 cm -1 . A typical spectrum is shown in Figure 3. The specified peak areas and baseline points can easily be set in an Agilent MicroLab PC FTIR software method. Each peak measurement is called a component and the baseline limits are easily set as shown in Figure 4. The peak type of ‘Peak Area with Duel Baseline’ is first set. Then parameters for measurement of the area under the reference polyethylene absorbance band at 2019 cm -1 relative to a baseline drawn between 2097 and 1987 cm -1 (Figure 5) are set. The component is further configured to report the absorbance value to five decimal places as shown in Figures 4 and 5. Figure 3. Typical spectrum for the measurement of the vinyl group (CH wag) in polyethylene A ratio of the analyte band absorbance to the reference band is used for this analysis. Number C=C per 1000 C atoms = M x [A 908 / A 2019 ] + N with M and N as determined in the the Calibration section. The ratio calibration equation for this analysis is: Number C=C per 1000 C atoms = 2.751 x [A 908 / A 2019 ] – 0.111 Figure 4. The vinyl peak area absorbance (component) measurement at 908 cm -1 in the MicroLab PC FTIR software. The peak start and stop refers to the area under the peak to be integrated. Single point baselines should be set up with the same baseline start and stop points Figure 5. The polyethylene reference peak component addition in the MicroLab PC FTIR software The MicroLab PC FTIR software makes the peak ratio calculation easy to set up. Simply edit the method by selecting the ‘Peak Ratio’ calculation type and the peak components that are to be ratioed (Figure 6). 4
Select ‘Peak Ratio’ - from the drop-down menu. Add linear calibration slope and Y-axis offset. Figure 6. The peak ratio component addition in the MicroLab PC FTIR software. After plotting the calibration data, the resulting linear regression line’s slope is entered in the ‘Scale’ field and the Y-axis offset in the ‘Offset’ field. Analysis With the ratio defined, the new method is ready to be used to obtain at least triplicate measurements of each calibration standard. Unknown polymer coupons should also be run with a minimum of three measurements around the coupon. This process is made simple and convenient with the DialPath or TumblIR transmission cells. Users can see the exact point of measurement in real time, and quickly reposition the sample for the replicate measurements. Plot the values measured for the ratio relative to the vinyl group concentration (Figure 2), and insert the slope and offset values back into the method as shown in Figure 6. Once the slope and offset values have been entered, the Microlab FTIR software method will report the vinyl group concentration. The MicroLab PC FTIR software method, Polymer – Vinyl Content in Polyethylene v1, includes the calibration data from Figure 2. This calibrated method is available with the Agilent 5500 and 4500 Series DialPath or TumblIR FTIR spectrometers, as well as the Cary 630 FTIR spectrometers. This method and software performs all the calculations automatically and reports the final value as Number C=C per 1000 C Atoms (Figure 7). The values obtained from triplicate determinations should be averaged to give the final reported concentration. Conclusion This analytical method demonstrates how the Agilent Cary 630 FTIR can be used to easily and accurately measure polymer thin films. The unique sampling capabilities of the DialPath and TumblIR provide a simple mechanism to mount your sample, while the step-by-step method-driven software with color-coded, actionable results guides you through your analysis to ensure that your samples are measured with minimum effort and highest accuracy. Figure 7. The MicroLab PC FTIR software prediction result for a 1.38 vinyl C=C groups per 1000 C atoms in polyethylene sample 5
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MATERIALS TESTING AND RESEARCH SOLU
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When accuracy and reliability in me
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AGILENT TECHNOLOGIES APPLICATIONS F
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Figure 1. Agilent Cary 630 FTIR spe
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The calibration samples were measur
Page 11 and 12: Author Frank Higgins Agilent Techno
Page 13 and 14: Figure 1. The overlaid aliphatic be
Page 15 and 16: Author John Seelenbinder Agilent Te
Page 17 and 18: Figure 3. Sample is lightly pressed
Page 19 and 20: Author Dr. Mustafa Kansiz Agilent T
Page 21 and 22: microscopy provides for a factor of
Page 23 and 24: Standard ATR IR Image No Pressure (
Page 25 and 26: A visual inspection of the sample u
Page 27 and 28: Experimental Instrumentation To per
Page 29 and 30: Authors Jonah Kirkwood † and Must
Page 31 and 32: Spectra were collected from each lo
Page 33 and 34: Infrared mapping allows for multipl
Page 35 and 36: The spectra in Figure 2 are visuall
Page 37 and 38: Conclusion Agilent‟s Cary 610 FTI
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 51 and 52: The calibration curve for the deter
Page 53 and 54: Figure 6. The MicroLab PC FTIR soft
Page 55 and 56: Summary An analytically representat
Page 57 and 58: Figure 3. The Irganox 1010 peak are
Page 61: The calibration curve and equation
Page 65 and 66: Summary An analytically representat
Page 67 and 68: Figure 3. The GMS peak height absor
Page 69 and 70: Advanced Atomic Force Microscopy: E
Page 71 and 72: signal) image indicating the overwh
Page 73 and 74: A dependence of surface potential o
Page 75 and 76: A B C Figure 6A-C. The topography (
Page 77 and 78: A B Figure 10A-C. The topography (A
Page 79 and 80: KFM with AM-FM operation in the int
Page 81 and 82: ibbons is only slightly different f
Page 83 and 84: References 1. G. Binnig, C.F. Quate
Page 85 and 86: Figure 1. AFM topographic image of
Page 87 and 88: 100nm 100nm 350nm 100nm Figure 3. A
Page 89 and 90: to perfect hexagonal patterns, whic
Page 91 and 92: Single-pass KFM studies have been k
Page 93 and 94: images due to the difference of the
Page 95 and 96: 0.5 V) of the nanowires. Additional
Page 97 and 98: appeared in the topography image. T
Page 99 and 100: of PSS component. TEM studies of mo
Page 101 and 102: Atomic Force Microscopy Studies in
Page 103 and 104: on graphite and MoS2 are shown in F
Page 105 and 106: A B C D Scan size: 5 µm. Scan size
Page 107 and 108: images of PEDOT:PSS blend, (PEDOT -
Page 109 and 110: Young’s Modulus of Dielectric ‘
Page 111 and 112: Figure 3. Young’s modulus as a fu
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Nanoindentation, Scratch, and Eleva
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The samples listed as “D” sampl
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Figure 6. Elastic modulus results f
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Figure 11. Elastic modulus results
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Sample B Figure 16. Scratch curves
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Conclusions Nanoindentation and scr
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measurement technique has been expl
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References 1. J.L. Hay, “Using In
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Theory The complex shear modulus (G
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References 1. Jain, S.K., Bhattacha
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LCCC relies on carrying out isocrat
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log Mp 5 4.6 4.2 3.8 0.5 15% Water
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Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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Application Compendium - Agilent Technologies

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