Application Compendium - Agilent Technologies

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A B C D Abs. at 3692 cm -1 Abs. Range 1180-1060 cm -1 Abs. at 3265 cm -1 Abs. at 1370 cm -1 Layer 1 Layer 2 Layer 3 Layer 4 Figure 4. Feature images based on spectral peaks that are unique to each layer in the four-layer paint chip sample. The feature image in „A‟ is based on the absorbance of the peak centered at 3692 cm -1 , which is primarily found in layer 1 of the paint chip; while the feature image in „B‟ was generated from the absorbance peaks between 1180–1060 cm -1 , which are largely found in the second layer; „C‟ shows the spatial distribution of the absorbance peak centered at 3265 cm -1 ; while „D‟ shows the feature image of the clear coating layer of the paint sample based on the absorbance at 1370 cm -1 . Legend for feature images: red = high intensity, green = medium intensity, blue = low intensity. The chemical image display of the infrared mapping software was particularly useful to highlight the clear external coating of the paint sample, designated by layer 4 in Figure 4D. Depending on the visible contrast of a sample, it is occasionally easier to view the distribution of a selected spectral peak (or range) in different feature image views. From the feature images it is a simple task to estimate the approximate width of each stratified vertical layer; layer 1 is ~80 µm, layer 2 is ~80 µm, layer 3 is ~40 µm, while layer 4 is ~120 µm. It is equally possible to probe the heterogeneity within each layer for an improved characterization of the sample. For example, layer 1 in Figure 4A is not uniform in chemical composition and has a number of visible defects that can also be observed in the visible and feature images. With Resolutions Pro software, it is simple to investigate the chemical differences between adjacent spectra by displaying spectra simultaneously. However, for a more in-depth understanding of the samples‟ heterogeneity on the micro-scale, a higher spatial resolution infrared image would be required. An alternate approach to acquiring IR spectra with a significantly higher spatial resolution involves the use of an infrared imaging system equipped with a focal plane array (FPA*) detector. An FPA-FTIR system would provide a superior means of investigating the subtle chemical differences found in each layer of the paint sample. Unlike infrared mapping using a singleelement detector, an FPA* detector collects hundreds to thousands of spectra simultaneously within seconds, thereby providing dramatic savings in spectral acquisition time compared to infrared mapping techniques that perform sequential data collection. In practical terms, this infrared map required ~40 minutes acquisition time to collect 361 spectra for the area of 380 × 380 µm using a 20 µm spatial resolution; comparatively, Agilent‟s 128 × 128 FPA-FTIR system could acquire over 16,000 spectra with an identical signal-to-noise ratio from an area of 700 × 700 µm within a few seconds using an even higher spatial resolution of 5.5 µm per spectrum. In addition, Agilent‟s FPA-FTIR imaging spectrometers have a number of easily user-changeable spatial resolution modes including: 1.1 µm (ATR Analysis), 5.5 µm, 11 µm, 22 µm and even larger sizes with pixel binning or macro imaging (for example, >40 µm). FPA- FTIR analysis would involve the same minimal sample preparation and could be used to reveal even the smallest features of the forensic evidence sample. While this experiment focused on the characterization of a sample obtained from a crime scene, the application of FTIR microscopy and mapping in paint analysis extends far beyond forensic applications. They are commonly used for the characterization of historical art works, and for the development of conservation and preservation strategies for paintings and photographs. FTIR microscopy and mapping are equally important in the QC analysis of raw materials used in the manufacture of paints and inks, and are routinely applied to the analysis of resins, pigments, solvents and additives. 5
Conclusion Agilent‟s Cary 610 FTIR Microscope provides the ability to collect high quality chemical information from multi-layer samples with a high spatial resolution. It provides an excellent means of probing a sample‟s chemistry as it can be used to visualize the relative distribution of specific components across a sample area of several centimeters. In this experiment, a 380 × 380 µm infrared map was automatically collected using a pre-defined acquisition grid to investigate the chemical heterogeneity of a paint chip sample. Four chemically distinct layers were resolved in the forensic evidence, including a miniscule layer measuring ~40 µm. Feature images also were used to highlight each layer within the infrared map and to probe localized areas with varying chemical compositions within the stratified layers. The rapid nature and the simplicity of automated infrared mapping make it a key technique for the advanced characterization of material and polymer samples. References *This product is regulated by the U.S. Department of State under the International Traffic in Arms Regulations, 22 CFR 120-130 (“ITAR”). An export license from the U.S. government is therefore required to export this product from the United States, and other ITAR restrictions apply to the shipment, use, service and other aspects of this product and the FTIR instrument in which it is us www.agilent.com/chem © Agilent Technologies, Inc., 2009, 2011 Published March, 2011 Publication Number SI-02255
Page 1 and 2: MATERIALS TESTING AND RESEARCH SOLU
Page 3 and 4: When accuracy and reliability in me
Page 5 and 6: AGILENT TECHNOLOGIES APPLICATIONS F
Page 7 and 8: Figure 1. Agilent Cary 630 FTIR spe
Page 9 and 10: The calibration samples were measur
Page 11 and 12: Author Frank Higgins Agilent Techno
Page 13 and 14: Figure 1. The overlaid aliphatic be
Page 15 and 16: Author John Seelenbinder Agilent Te
Page 17 and 18: Figure 3. Sample is lightly pressed
Page 19 and 20: Author Dr. Mustafa Kansiz Agilent T
Page 21 and 22: microscopy provides for a factor of
Page 23 and 24: Standard ATR IR Image No Pressure (
Page 25 and 26: A visual inspection of the sample u
Page 27 and 28: Experimental Instrumentation To per
Page 29 and 30: Authors Jonah Kirkwood † and Must
Page 31 and 32: Spectra were collected from each lo
Page 33 and 34: Infrared mapping allows for multipl
Page 35: The spectra in Figure 2 are visuall
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 51 and 52: The calibration curve for the deter
Page 53 and 54: Figure 6. The MicroLab PC FTIR soft
Page 55 and 56: Summary An analytically representat
Page 57 and 58: Figure 3. The Irganox 1010 peak are
Page 61 and 62: The calibration curve and equation
Page 63 and 64: Select ‘Peak Ratio’ - from the
Page 65 and 66: Summary An analytically representat
Page 67 and 68: Figure 3. The GMS peak height absor
Page 69 and 70: Advanced Atomic Force Microscopy: E
Page 71 and 72: signal) image indicating the overwh
Page 73 and 74: A dependence of surface potential o
Page 75 and 76: A B C Figure 6A-C. The topography (
Page 77 and 78: A B Figure 10A-C. The topography (A
Page 79 and 80: KFM with AM-FM operation in the int
Page 81 and 82: ibbons is only slightly different f
Page 83 and 84: References 1. G. Binnig, C.F. Quate
Page 85 and 86: Figure 1. AFM topographic image of
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100nm 100nm 350nm 100nm Figure 3. A
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to perfect hexagonal patterns, whic
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Single-pass KFM studies have been k
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images due to the difference of the
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0.5 V) of the nanowires. Additional
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appeared in the topography image. T
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of PSS component. TEM studies of mo
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Atomic Force Microscopy Studies in
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on graphite and MoS2 are shown in F
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A B C D Scan size: 5 µm. Scan size
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images of PEDOT:PSS blend, (PEDOT -
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Young’s Modulus of Dielectric ‘
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Figure 3. Young’s modulus as a fu
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Nanoindentation, Scratch, and Eleva
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The samples listed as “D” sampl
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Figure 6. Elastic modulus results f
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Figure 11. Elastic modulus results
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Sample B Figure 16. Scratch curves
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Conclusions Nanoindentation and scr
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measurement technique has been expl
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References 1. J.L. Hay, “Using In
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Theory The complex shear modulus (G
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References 1. Jain, S.K., Bhattacha
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LCCC relies on carrying out isocrat
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log Mp 5 4.6 4.2 3.8 0.5 15% Water
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Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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