Application Compendium - Agilent Technologies
Application Compendium - Agilent Technologies
Application Compendium - Agilent Technologies
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References<br />
1. Y. Martin, D. A. Abraham, and H. K. Wickramasinghe “High-resolution capacitance<br />
measurement and potentiometry by force microscopy” Appl. Phys. Lett. 1988, 52,<br />
1103–10005.<br />
2. M. Nonnenmacher, M. P. O’Boyle, and H. K. Wickramasinghe “Kelvin probe force<br />
microscopy” Appl. Phys. Lett. 1991, 58, 2921–23.<br />
3. V. B. Elings, and J. A. Gurley “Scanning probe microscope using stored data for vertical<br />
probe positioning” US Patent 5,308,974, 1994.<br />
4. J. Alexander, S. Magonov and M. Moeller “Topography and surface potential in Kelvin force<br />
microscopy of perfluoroalkyl alkanes self-assemblies” J. Vac. Sci. Techn. B, 2009, 27,<br />
903–911.<br />
5. U. Zerweck, CH. Loppacher, T. Otto, S. Grafstroem, and L. M. Eng “Accuracy and resolution<br />
limits of Kelvin probe force microscopy“ Phys. Rev. B, 2005, 71, 125424.<br />
6. H. B. Michaelson “The work function of the elements and its periodicity” J. Appl. Phys.<br />
1977, 48, 4729–4733.<br />
7. R. Berger, H.-J. Butt, M. Retschke, S. Weber “Electrical Modes in Scanning Probe<br />
Microscopy“ Macromolecular Rapid Communications 2009, 30, 1167.<br />
8. T. Matsukawa, S. Kanemaru, M. Masahara, M. Nagao, H. Tanoue, and J. Itoh “Doping<br />
diagnosis by evaluation of the surface Fermi level using scanning Maxwell-stress<br />
microscopy” Appl. Phys. Lett. 2003, 82, 2166–2169.<br />
9. T. W. Kelley and C. D. Frisbie, “Gate Voltage Dependent Resistance of a Single Organic<br />
Semiconductor Grain Boundary “ J. Phys. Chem. B 105, 4538, 2001.<br />
10. D. Knipp, R. A. Street, and A. R. Voelkel “Morphology and electronic transport of<br />
polycrystalline pentacene thin-film transistors” Appl. Phys. Lett. 2003, 82, 3907–3909.<br />
11. V. Kalihari, David J. Ellison, G. Haugstad, and C. D. Frisbie “Observation of unusual<br />
homoepitaxy in ultrathin pentacene films and correlation with surface electrostatic<br />
potential” Adv. Mater. 2009, 21, 1–7.<br />
12. L. Chen, R. Ludeke, X. Cui, A. G. Schrott, C. R. Kagan, and L. E. Brus “Electrostatic field<br />
and partial level pinning at the pentacene-SiO2 interface” J. Phys. Chem. B 2005, 109,<br />
1834–1838.<br />
13. S. G. J. Mathijssen, E. C. P. Smits, P. A. van Hal, H. J. Wondergem, S. A. Ponomarenko,<br />
A. Moser, R. Resel, P. A. Bobbert, M. Kemerink, R. A. J. Janssen, and D. M. de Leeuw<br />
“Monolayer coverage and channel length set the mobility in self-assembled monolayer<br />
field-effect transistors” Nature Nanotechnology 2009, 4, 674–680.<br />
14. S. N. Magonov “AFM in Analysis of Polymers” in Encyclopedia of Analytical Chemistry,<br />
(R. A. Meyers, Ed.), pp. 7432–7491, John Willey & Sons Ltd, Chichester, 2000.<br />
15. M. Chiesa, L. Buergi, J.-S. Kim, R. Shikler, R. H. Friend and H. Sirringhaus “Correlation<br />
between surface photovoltage and blend morphology in polyfluorene-based photodiodes”<br />
Nano Letters 2005, 5, 559–563.<br />
16. J.-J. Kim, S.-D. Jung, and W.-Y. Hwang “Molecular Conformation and <strong>Application</strong> of<br />
Stereoregular PMMA Langmuir-Blodgett Films” ETRI Journal 1996, 18, 195–206.<br />
17. M. Retschke, R. Berger, H.-J. Butt, and S. Magonov, the manuscript in preparation.<br />
18. K. Schmidt-Rohr, Q. Chen “Parallel cylindrical water nanochannels in Nafion fuel cell<br />
membranes” Nature Mater. 2008, 7, 75-83.<br />
19. R. S. McLean, M. Doyle, and B. B. Sauer “High-resolution imaging of ionic domains<br />
and crystal morphology in ionomers using AFM techniques” Macromolecules 2000, 33,<br />
6541–6550<br />
20. L. S. C. Pingree, B. A. MacLeod, and D. S. Ginger “The changing face of PEDOT:PSS Films:<br />
substrate, bias, and processing effects on vertical charge transport” J. Phys. Chem. 2008,<br />
112, 7922–7929.<br />
21. U. Lang, E. Mueller, N. Naujoks, and J. Dual “Microscopical Investigations of PEDOT:PSS<br />
Thin Films” Adv. Funct. Mater. 2009, 19, 1215–1220.<br />
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