XIX Sympozjum Srodowiskowe PTZE - materialy.pdf
XIX Sympozjum Srodowiskowe PTZE - materialy.pdf
XIX Sympozjum Srodowiskowe PTZE - materialy.pdf
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<strong>XIX</strong> <strong>Sympozjum</strong> <strong>PTZE</strong>, Worliny 2009<br />
placed on the inner surface of the specimen. Inner surface means that the detecting sensor and<br />
the crack are on the same side. A U-shaped yoke placed above the specimen is used to<br />
generate the magnetic field inside the specimen. The current of coil wounded around the yoke<br />
can be a direct current or an alternating current supplied by a computer controlled current<br />
amplifier. The function of current can be set by LabVIEW functions.<br />
Fig. 2. Result of the simulation and the measurement<br />
The paper presents the building of a computer controlled measurement system based on<br />
National Instruments (NI) Data Acquisition card and NI LabVIEW software package. The<br />
aim of this research is to detect manufactured surface cracks on steels by applying a magnetic<br />
flux leakage method. A finite element procedure based on edge elements and on the magnetic<br />
vector potential has been implemented. The full paper will show a comparison between<br />
measured and simulated data. Fig. 2 presents an example about simulated and measured data.<br />
Acknowledgement<br />
This paper was supported by the János Bolyai Research Scholarship of the Hungarian<br />
Academy of Sciences (BO/00064/06), by Széchenyi István University, and by the Hungarian<br />
Scientific Research Fund.<br />
References<br />
[1] G. Kovács, M. Kuczmann, Simulation of a Magnetic Flux Leakage System, Proceedings of the<br />
2nd Symposium on Applied Electromagnetics, SAEM08, Zamosc, Poland, June 1-4, 2008,<br />
pp. 97-100, CD Proceedings.<br />
[2] M. Kuczmann, A. Iványi, The Finite Element Method in Magnetism, Akadémiai Kiadó,<br />
Budapest, 2008.<br />
[3] O. Bíró, Edge Element Formulations of Eddy Current Problems, Comput. Meth. Appl., Mech.<br />
Engrg., vol. 169, 391-405, 1999.<br />
[4] O. Bíró, CAD in Electromagnetism, Advances in Electronics and Electron Physics, vol. 82,<br />
pp. 1-96, 1991.<br />
[5] National Instruments. LabVIEW, Basics Manual. 2000.<br />
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