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XIX Sympozjum Srodowiskowe PTZE - materialy.pdf

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<strong>XIX</strong> <strong>Sympozjum</strong> <strong>PTZE</strong>, Worliny 2009<br />

placed on the inner surface of the specimen. Inner surface means that the detecting sensor and<br />

the crack are on the same side. A U-shaped yoke placed above the specimen is used to<br />

generate the magnetic field inside the specimen. The current of coil wounded around the yoke<br />

can be a direct current or an alternating current supplied by a computer controlled current<br />

amplifier. The function of current can be set by LabVIEW functions.<br />

Fig. 2. Result of the simulation and the measurement<br />

The paper presents the building of a computer controlled measurement system based on<br />

National Instruments (NI) Data Acquisition card and NI LabVIEW software package. The<br />

aim of this research is to detect manufactured surface cracks on steels by applying a magnetic<br />

flux leakage method. A finite element procedure based on edge elements and on the magnetic<br />

vector potential has been implemented. The full paper will show a comparison between<br />

measured and simulated data. Fig. 2 presents an example about simulated and measured data.<br />

Acknowledgement<br />

This paper was supported by the János Bolyai Research Scholarship of the Hungarian<br />

Academy of Sciences (BO/00064/06), by Széchenyi István University, and by the Hungarian<br />

Scientific Research Fund.<br />

References<br />

[1] G. Kovács, M. Kuczmann, Simulation of a Magnetic Flux Leakage System, Proceedings of the<br />

2nd Symposium on Applied Electromagnetics, SAEM08, Zamosc, Poland, June 1-4, 2008,<br />

pp. 97-100, CD Proceedings.<br />

[2] M. Kuczmann, A. Iványi, The Finite Element Method in Magnetism, Akadémiai Kiadó,<br />

Budapest, 2008.<br />

[3] O. Bíró, Edge Element Formulations of Eddy Current Problems, Comput. Meth. Appl., Mech.<br />

Engrg., vol. 169, 391-405, 1999.<br />

[4] O. Bíró, CAD in Electromagnetism, Advances in Electronics and Electron Physics, vol. 82,<br />

pp. 1-96, 1991.<br />

[5] National Instruments. LabVIEW, Basics Manual. 2000.<br />

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