Derwent World Patents Index (DWPI) - EPI ... - Thomson Reuters
Derwent World Patents Index (DWPI) - EPI ... - Thomson Reuters
Derwent World Patents Index (DWPI) - EPI ... - Thomson Reuters
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1002 Subject <strong>Index</strong><br />
vessel details V05-D07A5<br />
CRT beam deflection coil<br />
TV receiver V02-F01A<br />
V05-D01B<br />
V05-D06B1A<br />
W03-A08A1B<br />
VDU T04-H01<br />
V02-F01A<br />
V05-D01B<br />
V05-D06B1A<br />
CRT deflection circuits<br />
TV receiver W03-A08A1<br />
VDU T04-H01<br />
CRT degaussing<br />
coil (general) V05-D01B3<br />
V05-D08A5<br />
coil in TV receiver W03-A08A4A<br />
control circuitry (general) V05-D01B3<br />
V05-D08A1<br />
control circuitry in TV receiver W03-A08A4C<br />
CRT display<br />
antireflective filter V05-D01B<br />
V05-D07C3<br />
associated optics V05-D01B<br />
V05-D07C5<br />
color tube control, computer peripheral<br />
T04-H01B1<br />
control, computer peripheral type T04-H01<br />
focussing arrangement, TV receiver W03-A08A3<br />
head-up W04-Q01A<br />
W04-Q01K<br />
single beam tube control, computer<br />
peripheral T04-H01A<br />
storage tube control, computer<br />
peripheral T04-H01B<br />
tube per se - see Cathode ray tube V05-D01<br />
TV receiver circuits W03-A08<br />
CRT manufacture V05-L05D<br />
ageing V05-L07E3<br />
assembly V05-L03C<br />
cathode mfr. V05-L01A<br />
electrode system insertion V05-L03C1<br />
electron gun mfr. V05-L01B4<br />
exhausting V05-L03C5C<br />
getter flashing V05-L03C7A<br />
getter mfr. V05-L06<br />
inserting gun V05-L03C1A<br />
screen V05-L02<br />
screen coating processes V05-L02C<br />
screen exposure and development V05-L02E<br />
screen exposure appts. V05-L02E5<br />
screen protection layer application V05-L02F<br />
screen testing V05-L02H<br />
shadow mask V05-L01B5<br />
tension band fitting V05-L03C7C<br />
tension band mfr. V05-L03D<br />
tube ageing V05-L07E3<br />
tube assembly V05-L03C<br />
tube rectification V05-L07E5<br />
tube salvage V05-L07E6<br />
tube shipping/packing V05-L07E7<br />
tube testing V05-L07E1<br />
vessel coating and marking V05-L03B<br />
vessel part joining V05-L03C5<br />
vessel per se V05-L03A<br />
vessel sealing V05-L03C5A<br />
CRT screen<br />
manufacture V05-L02<br />
V05-L05D1B<br />
non-phosphor aspects V05-D05B7<br />
phosphor composition V05-D05B1<br />
single phosphor screen V05-D05B3<br />
Crushing X25-J<br />
control T06-D04<br />
X25-J<br />
Cryogenic cooling, semiconductor devices<br />
U11-D02C<br />
Cryogenics X25-V<br />
Cryostat X12-C02A3A<br />
superconducting coil X12-C05<br />
superconducting magnet X12-C05A<br />
Cryosurgery S05-B06<br />
Cryptographic communication W01-A05A<br />
wireless W01-A05A1<br />
quantum cryptography W01-A05E<br />
Crystal filter U25-B<br />
V06-V01B<br />
V06-V04D1<br />
Crystal growth apparatus for<br />
semiconductor manufacture<br />
crucibles, crystal holders U11-B05A<br />
crystal pulling mechanisms U11-B03B<br />
heating arrangements for growth U11-B05A<br />
Crystal growth, semiconductor U11-B<br />
AII-BVI compounds U11-B03B<br />
AIII-BV compounds U11-B03A<br />
AIV elements, compounds U11-B03C<br />
apparatus- see Crystal growth apparatus<br />
for semiconductor manufacture U11-B05<br />
Bridgman method U11-B02B<br />
casting U11-B04<br />
Czochralski method U11-B01<br />
edge-defined film fed growth U11-B04<br />
gradient freeze method U11-B02X<br />
materials U11-B03<br />
pulling from melt (boules) U11-B01<br />
ribbon techniques U11-B04<br />
spherical, e.g. drop method U11-B03A<br />
zone refining U11-B02A<br />
sinusoidal output U23-A01A<br />
Crystal oscillator<br />
analogue circuit U23-A01A<br />
astable pulse generator U22-A04A2<br />
Crystal resonator thermometer S03-B01C<br />
Crystallographic orientation<br />
Crystallographic orientation, semiconductor<br />
U11-B03<br />
Crystallography S03-E06C<br />
CSMA data network access W01-A06F1A<br />
CT (current transformer) V02-G01B<br />
X12-C01G<br />
measurement S01-D01D1A<br />
V02-G01B<br />
X12-C01G<br />
protection V02-G01B<br />
X12-C01G<br />
X13-C01X
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