Derwent World Patents Index (DWPI) - EPI ... - Thomson Reuters
Derwent World Patents Index (DWPI) - EPI ... - Thomson Reuters Derwent World Patents Index (DWPI) - EPI ... - Thomson Reuters
1170 Subject Index headphones V06-V03B V06-V04A4 high power inductive device S01-G12E X12-C01D3 HV networks S01-H02 hybrid circuits U11-F01F U14-H04B hydrodynamic S02-J07 IC engine of aircraft S02-J01A1 IC engines S02-J01A indicating and recording appts. S02-K07 inductive components S01-G12E V02-H08 X12-C01D3 insulator S01-G13 integrated circuits S01-G01 S01-G01A1 integrated circuits, packaged device, die U11-F01C3 integrated circuits, wafer level U11-F01D lasers V08-A06 LCD S02-J04A3A U14-K01A8 lenses and lens systems S02-J04A5 level indicating S02-C07 light guide S02-J04A1 line transmission systems W02-C01D liquid crystals S02-J04A3 logic analyser S01-G01A5 logic circuits U21-C03D1 low power inductive device S01-G12E V02-H08 machine parts S02-J03 machines S02-J magnetic heads T03-A04A5 magnetic record carriers T03-A02C5 memories U14-D03 military equipment W07-H modules, cards S01-G01A3 motors, electric V06-M11M X11-J08M moulded case circuit breakers X13-D08 noise generators, electrical S01-G08B1 optical amplifiers S02-J04A1C optical appts. S02-J04A optical communication W02-C04C1 optical disk T03-B01D1 T03-B01E7 optical fibre S02-J04A1A V07-J optical instruments S03-A05A optical test equipment- materials investigation S03-E04P passive electric components S01-G12 PCB S01-G01B V04-R06 phase lock loop U23-D01E pressure measurement S02-F04F prisms S02-J04A9 probes, contacts at wafer level U11-F01D1 probes, for IC packaged device U11-F01C1 radio antennas S01-G08A5 W02-B08A radio equipment S01-G08 radio receivers S01-G08A3 radio repeaters S01-G08A1 W02-C05B W02-G05C radio transmitters S01-G08A1 reactor, HF S01-G12E5 V02-F01 V02-H08 reactor, power S01-G12E5 X12-C01D3 X12-C01F reactor, power supply S01-G12E5 V02-G01C V02-H08 recording equipment (dynamic) T03-K07 W04-J07 relays with contacts V03-D06B resistors S01-G12A V01-A04H1 resonators, electromechanical V06-V01E V06-V03B scientific instruments S03-H03A medical apparatus S05-Y01 semiconductor circuits, at wafer level U11-F01D semiconductor circuits, using electron microscope U11-F01D3 semiconductor device packages U11-F01E semiconductor devices S01-G02B semiconductors, film parameters U11-F01B ship W06-C05 shock absorbers of vehicle S02-J02A short circuit S01-G04A1 signal generators, electrical S01-G08B1 signal testing W02-F04A1 special purpose measurement of force S02-F03X speed/acceleration measurement S02-G07E static stores U14-D03 steam turbine S02-J01E X11-A10 structures S02-J structures by applying shock S02-J08 structures by vibration S02-J08 switches with contacts S01-G10 V03-C07 X13-A04F switchgear X13-E08 telephone equipment (general) W01-C08C telephone exchange W01-C02A1 telephone selection equipment W01-B08 telephone subscriber equip. W01-C01K telephone subscriber line W01-C02A5 telephone transducer V06-V01 V06-V03B V06-V04B1 W01-C01M television systems W02-F04A thermometers S03-B01H1 time division multiplex systems W02-K02B5B transducers S02-K07 transducers, acoustoelectric V06-V03B transformer, hf S01-G12E1 V02-F02 V02-H08 transformer, power S01-G12E1 X12-C01D3 X12-C01E
transformer, power supply S01-G12E1 V02-G01A V02-H08 transformers S01-G12E1 transmission of machine S02-J03A transmission of vehicle S02-J02X transmission systems (general) W02-C05 TV receiver W02-F04A5C TV repeater W02-F04A5B TV studio equipment W02-F04A5A TV transmitter W02-F04A5B vehicle S02-J02 vehicle braking S02-J02B vehicle crash dummy S02-J02F1 vehicle crash/impact S02-J02F vehicle electrical system S02-J02E X22-A05 X22-X06 vehicle steering S02-J02A vehicle transmission S02-J02X vehicle tyre performance S02-J02A vehicle wheels S02-J02A video camera W04-M01D2J volume and mass flow measurement S02-C07 VSWR W02-B08A1 weighing appts. S02-D09 wires (with fault location) S01-G05 wires (without fault location) S01-G12F Testing digital computers T01-G02 ATE (automatic test equipment) T01-G02A2A built in T01-G02A2B by comparison T01-G02A2C Defective hardware location T01-G02A diagnostics T01-G08 T01-G08A environment monitoring T01-G11B fault simulation T01-G07 hardware T01-G02 hardware, on IC T01-G02A1 logic simulation T01-G logic simulation, compiled code T01-G06A logic simulation, hardware accelerator T01-G06C logic simulation, table driven T01-G06B marginal T01-G02B measuring non-processing parameters T01-G11 power monitoring T01-G11A system/field T01-G02A2 test program T01-G02A2D test sequence generation T01-G07A user stress monitoring T01-G11C Testing dynamic recording equipment T03-K07 W04-J07 Testing semiconductor active semiconductor material properties U11-F01A device U11-F01C device, at wafer/die level S01-G02B1 device, completed(encapsulated) S01-G02B5 Tetrode, vacuum tubes V05-B01A5 Text character generator for TV receiver Textile W03-A10C EPI Manual Codes 2011 1171 Part 3 analysis S03-E14G embroidery machine X25-T04C fabric manufacture, control T06-D03C knitting machine X25-T04B2 printing X25-T04D sewing machine X25-T04C textile loom X25-T04B1 textile loom, control T06-D03C X25-T04B1 weaving X25-T04B1 yarn manufacture, control T06-D03B X25-T04A Theater general systems W04-X03G1 lighting X26-K Theft alarms W05-B01 audio/video recording equipment W04-J01C Theme park equipment W04-X03G3 Theodolites S02-B05 Therapy, medical S05-A applying current S05-A04 aromatherapy S05-A09 cardiac massage S05-A05A cooling S05-A05B electromagnetic S05-A03E2 heat S05-A05B homeopathy S05-A09 Infrared S05-A03A1 IR, UV, laser, light S05-A03A laser S05-A03A2 magnetic S05-A03E1 optical S05-A03 other radiation S05-A03X pacemakers and defibrillators S05-A01 physical S05-A05E relaxation S05-A09 respiratory massage S05-A05A speech S05-A09 ultraviolet S05-A03A3 using electric fields S05-A03B using magnetic fields S05-A03E using microwaves S05-A03D using ultrasound S05-A03C using visible light S05-A03A9 using X-rays S05-A03F Thermal computer printer S06-H cutoffs X13-D12 fuses X13-D12 ink-jet computer printer S06-G01 paper, for printer S06-H01 prospecting S03-C04A protectors X13-D12 switches with contacts V03-C06B Thermal analysis calorimetry S03-E01C differential S03-E01E distillation S03-E01A emissivity determination S03-E01E flaw detection S03-E01B3 psychrometry S03-E01B pyrolysis S03-E01A sintering S03-E01A thermal cycling-see also fatigue testing S03-E01B1
- Page 179 and 180: ushing X12-C01C bushing, manufactur
- Page 181 and 182: electroerosive S06-J electrographic
- Page 183 and 184: lens/optics associated with CRT V05
- Page 185 and 186: overvoltage limiter U24-F02 X13-C03
- Page 187 and 188: Q Q-factor measurement S01-D05A5 QA
- Page 189 and 190: audio amplifier W02-G03F baseband b
- Page 191 and 192: Rankine cycle plant X11-C05 Rapid p
- Page 193 and 194: duplication prevention, audio W04-G
- Page 195 and 196: components, frost sensor X27-F02C2
- Page 197 and 198: ultrasonic link (general) W05-D06A5
- Page 199 and 200: impact type S06-F03 Rice cooker, el
- Page 201 and 202: Satellite airborne radio relay W02-
- Page 203 and 204: Secondary emission electrodes, mfr.
- Page 205 and 206: adiation treatment U11-C03A U11-C03
- Page 207 and 208: Shift stores U14-A01 charge transfe
- Page 209 and 210: mechanical transmission W05-A01A pn
- Page 211 and 212: Solar cell U12-A02A X15-A02A array
- Page 213 and 214: power supplies W06-B03B propulsion
- Page 215 and 216: Sports and leisure activities W04-X
- Page 217 and 218: Stereophonic decoder radio receiver
- Page 219 and 220: short circuit current limiter X12-C
- Page 221 and 222: control V03-U16 domestic V03-U01 do
- Page 223 and 224: T TAB - see Tape automated bonding
- Page 225 and 226: party line systems W01-C04 portable
- Page 227 and 228: loudspeaker type W01-C01G2A memory
- Page 229: using photoluminescence quenching S
- Page 233 and 234: using acoustic effect S03-B01X usin
- Page 235 and 236: liquid S06-E04B1 liquid, applicatio
- Page 237 and 238: ultrasonic, sensor V06-V01N V06-V04
- Page 239 and 240: general X12-D02A1 LCD U14-K01A1B Tr
- Page 241 and 242: connection to external HiFi system
- Page 243 and 244: stations-based W03-A02B1A channel n
- Page 245 and 246: Undersampling U21-A03F6C Under-volt
- Page 247 and 248: helical potentiometer V01-A03D5A he
- Page 249 and 250: Vehicle continued engine Q17-E Q51
- Page 251 and 252: lighting X22-B X26 load weighing sy
- Page 253 and 254: traction control using transmission
- Page 255 and 256: control systems T05-H08C reverse ve
- Page 257 and 258: shoulder mount W04-M01G7 shutter W0
- Page 259 and 260: emote control W04-B10C W04-E04A rev
- Page 261 and 262: soil collection & management system
- Page 263 and 264: Weapon guidance systems W07-A01 Wea
- Page 265 and 266: terminating, high power superconduc
- Page 267: Y Yoke CRT deflection V02-F01A V05-
- Page 271 and 272: Appendix 1: EPI Subject Matter Cove
- Page 273: Appendix 2: EPI Manual Coding Crite
- Page 276 and 277: 1216 Appendix 3: IPC to EPI manual
- Page 278 and 279: 1218 Appendix 3: IPC to EPI manual
1170 Subject <strong>Index</strong><br />
headphones V06-V03B<br />
V06-V04A4<br />
high power inductive device S01-G12E<br />
X12-C01D3<br />
HV networks S01-H02<br />
hybrid circuits U11-F01F<br />
U14-H04B<br />
hydrodynamic S02-J07<br />
IC engine of aircraft S02-J01A1<br />
IC engines S02-J01A<br />
indicating and recording appts. S02-K07<br />
inductive components S01-G12E<br />
V02-H08<br />
X12-C01D3<br />
insulator S01-G13<br />
integrated circuits S01-G01<br />
S01-G01A1<br />
integrated circuits, packaged device, die<br />
U11-F01C3<br />
integrated circuits, wafer level U11-F01D<br />
lasers V08-A06<br />
LCD S02-J04A3A<br />
U14-K01A8<br />
lenses and lens systems S02-J04A5<br />
level indicating S02-C07<br />
light guide S02-J04A1<br />
line transmission systems W02-C01D<br />
liquid crystals S02-J04A3<br />
logic analyser S01-G01A5<br />
logic circuits U21-C03D1<br />
low power inductive device S01-G12E<br />
V02-H08<br />
machine parts S02-J03<br />
machines S02-J<br />
magnetic heads T03-A04A5<br />
magnetic record carriers T03-A02C5<br />
memories U14-D03<br />
military equipment W07-H<br />
modules, cards S01-G01A3<br />
motors, electric V06-M11M<br />
X11-J08M<br />
moulded case circuit breakers X13-D08<br />
noise generators, electrical S01-G08B1<br />
optical amplifiers S02-J04A1C<br />
optical appts. S02-J04A<br />
optical communication W02-C04C1<br />
optical disk T03-B01D1<br />
T03-B01E7<br />
optical fibre S02-J04A1A<br />
V07-J<br />
optical instruments S03-A05A<br />
optical test equipment- materials<br />
investigation S03-E04P<br />
passive electric components S01-G12<br />
PCB S01-G01B<br />
V04-R06<br />
phase lock loop U23-D01E<br />
pressure measurement S02-F04F<br />
prisms S02-J04A9<br />
probes, contacts at wafer level U11-F01D1<br />
probes, for IC packaged device U11-F01C1<br />
radio antennas S01-G08A5<br />
W02-B08A<br />
radio equipment S01-G08<br />
radio receivers S01-G08A3<br />
radio repeaters S01-G08A1<br />
W02-C05B<br />
W02-G05C<br />
radio transmitters S01-G08A1<br />
reactor, HF S01-G12E5<br />
V02-F01<br />
V02-H08<br />
reactor, power S01-G12E5<br />
X12-C01D3<br />
X12-C01F<br />
reactor, power supply S01-G12E5<br />
V02-G01C<br />
V02-H08<br />
recording equipment (dynamic) T03-K07<br />
W04-J07<br />
relays with contacts V03-D06B<br />
resistors S01-G12A<br />
V01-A04H1<br />
resonators,<br />
electromechanical V06-V01E<br />
V06-V03B<br />
scientific instruments S03-H03A<br />
medical apparatus S05-Y01<br />
semiconductor circuits, at wafer level<br />
U11-F01D<br />
semiconductor circuits, using electron<br />
microscope U11-F01D3<br />
semiconductor device packages U11-F01E<br />
semiconductor devices S01-G02B<br />
semiconductors, film parameters U11-F01B<br />
ship W06-C05<br />
shock absorbers of vehicle S02-J02A<br />
short circuit S01-G04A1<br />
signal generators, electrical S01-G08B1<br />
signal testing W02-F04A1<br />
special purpose measurement of force<br />
S02-F03X<br />
speed/acceleration measurement S02-G07E<br />
static stores U14-D03<br />
steam turbine S02-J01E<br />
X11-A10<br />
structures S02-J<br />
structures by applying shock S02-J08<br />
structures by vibration S02-J08<br />
switches with contacts S01-G10<br />
V03-C07<br />
X13-A04F<br />
switchgear X13-E08<br />
telephone equipment (general) W01-C08C<br />
telephone exchange W01-C02A1<br />
telephone selection equipment W01-B08<br />
telephone subscriber equip. W01-C01K<br />
telephone subscriber line W01-C02A5<br />
telephone transducer V06-V01<br />
V06-V03B<br />
V06-V04B1<br />
W01-C01M<br />
television systems W02-F04A<br />
thermometers S03-B01H1<br />
time division multiplex systems W02-K02B5B<br />
transducers S02-K07<br />
transducers,<br />
acoustoelectric V06-V03B<br />
transformer, hf S01-G12E1<br />
V02-F02<br />
V02-H08<br />
transformer, power S01-G12E1<br />
X12-C01D3<br />
X12-C01E
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