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Deutsche Tagung f ¨ur Forschung mit ... - SNI-Portal

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Nanostrukturen und Grenzflächen Poster: Do., 13:00–15:30 D-P302<br />

Structure Determination of ZnO and CdSe/ZnS Core-Shell particles<br />

Franziska Niederdraenk 1 , Pawel Luczak 1 , Reinhard Neder 2 , Christine<br />

Barglik-Chory 3 , Sofia Dembski 4 , Christina Graf 4 , Eckart Rühl 4 , Eberhard<br />

Umbach 1<br />

1 Experimentelle Physik II, Universität Würzburg – 2 Mineralogisches Institut, Universität<br />

Würzburg – 3 Institut für Physikalische Chemie, Universität Würzburg –<br />

4 Lehrstuhl für Silicatchemie, Universität Würzburg<br />

During the last 15 years, semiconductor nanoparticles have attracted more and more<br />

attention in both, fundamental and applied research. Some applications, e.g. in bioimaging<br />

or quantum electronics, are already under way. Yet, the basic knowledge is<br />

still far from complete, in particular for nanoparticles with diameters well below 5 nm.<br />

The size range between 1 and 5 nm is also of fundamental interest since it represents<br />

the transition regime between solid state, cluster, and molecular physics.<br />

One important aspect is the determination of precise geometric parameters like size,<br />

shape, crystallinity, ” lattice“ constants, and structural defects. In principle, powder diffraction<br />

methods can provide detailed structural information. However, the diffraction<br />

peaks become very broad for particle diameters fairly below 5 nm, and the analysis<br />

of the data is crucial. Commonly used approaches for a grain size evaluation like the<br />

Rietveld refinement or the Scherrer equation are based on periodic structures, an assumption<br />

which is often not sustainable for nanoparticles with diameters below 5 nm.<br />

Other more intricate parameters like relaxation effects or stacking faults cannot be<br />

considered at all.<br />

Here we use an alternative, more direct way for the data analysis. We model the entire<br />

particle and calculate the powder diffraction pattern using the Debye formula. In this<br />

way, all important parameters like size, shape, stacking faults, strain, etc. are intrinsically<br />

included in the calculated data. Furthermore, parameter distributions, e.g., the<br />

size distribution, can now be taken into account, which are essential since they are<br />

likely to occur in wet-chemically synthesized particles.<br />

We report on powder diffraction data with high signal-to-noise quality and low background<br />

measured at beamline BW2 at HASYLAB. The measured data are fitted using<br />

an evolutionary algorithm which includes the Debye method described above. Our<br />

results show that a stacking fault probability needs to be considered in most cases.<br />

This means that the particles are not necessarily single crystalline but consist of both<br />

zincblende- and wurtzite-like stacked layers. Distributions or probabilities are implemented<br />

by averaging the diffraction patterns of several different particles with different<br />

sizes, stacking sequences, or other parameters. Since the atomic model is highly flexible,<br />

the method can easily be expanded to core-shell particles by adding an outer layer<br />

consisting of different atoms with different lattice parameters.<br />

In our contribution we present several examples demonstrating the capability of our<br />

new data analysis method. Diffraction data for ZnO and CdSe/ZnS core-shell particles<br />

will be shown.

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