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Magnetismus Poster: Do., 13:00–15:30 D-P225<br />

Antiferromagnetic-Ferromagnetic Phase Transition in Fe50Pt50−xRhx Thin<br />

Films<br />

Jochen Fenske 1 , Dieter Lott 1 , Gary J. Mankey 2 , Prakesh Mani 2 , Frank<br />

Klose 3 , Wolfgang Schmidt 4 , Andreas Schreyer 1<br />

1 GKSS Research Centre, Institute for Material Science – 2 MINT Center, The University<br />

of Alabama, Tuscaloosa, AL – 3 SNS, Oak Ridge Nat. Laboratory – 4 IN12, ILL,<br />

Grenoble, France<br />

In the last years perpendicular recording has been in the focus of scientific and technological<br />

interest on the search for materials to overcome the li<strong>mit</strong>ations in the storage<br />

density of conventional magnetic recording media. In order to reach the required<br />

high writing magnetic fields a soft underlayer is needed to provide a closure field during<br />

the writing process. An interesting candidate for such a magnetic underlayer is<br />

Fe50Pt50−xRhx. For certain compositions an antiferromagnetic (AF) state exists at<br />

lower temperatures which turns into a ferromagnetic (F) state at higher temperatures<br />

[1]. Used as a magnetic underlayer it can provide a closure field when heated lowering<br />

the write field. After the writing process the underlayer can be cooled again becoming<br />

AF and hence helps to stabilize the recording media via exchange interactions. The<br />

advantage of Fe50Pt50−xRhx compared to conventional underlayers like permalloy is<br />

that even thinner system may be sufficient to provide the same closure field.<br />

Neutron diffraction measurements were carried out to study the AF-F switching of thin<br />

films of Fe50Pt50−xRhx in dependence of temperature and magnetic field. Three kinds<br />

of AF ordering were observed, the (1/2 1/2 1/2), (0 0 1/2) and (1/2 1/2 3/2) depending<br />

on temperature and magnetic field. Both magnetization and neutron diffraction<br />

studies show the coexistence of an AF and F phase in a Fe50Pt40Rh10.<br />

[1]P. A. Algarabel et al, Journal of Applied Physics, 79 (8) 4659(1996)

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