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Mikroskopie und Tomographie Poster: Mi., 14:00–16:30 M-P113 Coherent X-ray Diffraction Imaging Ivan Vartaniants 1 1 HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany Coherent x-ray diffraction (CXD) imaging is a new experimental method for studying perfect and imperfect crystals. The method has become available by the recent development of high-brilliance third generation sources of synchrotron radiation (ESRF, APS, SPRING-8). The beams coherence volume being of the order of few microns can entirely enclose a nano-size object. Instead of incoherent averaging, a coherent sum of amplitudes produces a coherent diffraction pattern originating from the real space arrangement of the sample. If high-quality x-ray lenses were available as they are for electrons, such diffraction patterns could be transformed to magnified images directly. However such x-ray microscopes still suffer a lot from optics aberration and resolution is often limited to the pixel size of the CCD. In this talk it will be shown how the objective lens of the microscope can be replaced by a special iterative phase reconstruction procedure that inverts intensity measurements of the CXD pattern to real space image. The method is based on the fact that the diffraction pattern can be oversampled relative to its spatial Nyquist frequency so that the Fourier transform can be overdetermined in spite of missing phase information. In principle this method does not have any limitations on the available resolution. Several applications of the method will be given in the talk. It will be shown how 3D images of the interiors of Au nanocrystals that show 50 nm wide bands of contrast with 111 orientation can be obtained applying this technique [1]. The size of the objects can be further reduced to the size of the quantum dots samples if repetitive motive in the form of 2D crystal is used. It will be demonstrated that in the case of coherent illumination of these samples the correct shape and orientation of individual island can be obtained. In the case of partially coherent illumination the correct shape of the particle can be obtained only when the coherence of the incoming beam is reduced to match the size of the island [2]. In the last example experimental results of CXD scattering on the sample of specially fabricated GeSi islands of nanometer size and in a regular array embedded to Si substrate will be shown [3]. Two geometries of scattering that is grazing incidence diffraction (GID) and grazing incidence small angle x-ray scattering (GISAXS) were used. Applying a microfocuse coherent beam on our sample give rise to coherent diffraction pattern with Bragg spots and broad diffuse maxima in GID geometry. The GISAXS pattern has a typical shape resulting from the periodic array of identical islands. This diffraction pattern was used to reconstruct the average shape of the islands using a model independent phase retrieval algorithms. [1] G.J. Williams, et al., Phys. Rev.B 73(2006)094112. [2] I.A. Vartanyants, and I.K. Robinson, J. Synchrotron Rad. 10(2003) 409. [3] I.A. Vartanyants, et al., Phys Rev.B 71 (2005)245302.
Mikroskopie und Tomographie Poster: Mi., 14:00–16:30 M-P114 Radiographie und Tomographie bei ANKA: die Strahllinie IMAGE Timm Weitkamp 1 , Lukas Helfen 1 , Daniel Lübbert 1 , Alexander Rack 1 , Rolf Simon 1 , Tilo de Castro 1 1 Institut für Synchrotronstrahlung / ANKA, Forschungszentrum Karlsruhe, Postfach 36 40, D-76021 Karlsruhe An der Synchrotronstrahlungsquelle ANKA am Forschungszentrum Karlsruhe ist derzeit eine neue Beamline IMAGE für bildgebende Verfahren wie Mikroradiographie und -tomographie im Bereich harter Röntgen-Photonenenergien (7 bis 65 keV) in Planung. Die Beamline soll im Jahr 2009 in Betrieb gehen. IMAGE soll Strahlung von einem supraleitenden Insertion device erhalten. Verschiedene Möglichkeiten der spektralen Filterung des Strahls (Multilayer-Monochromator, Kristall-Monochromator, weißer Strahl) bieten einerseits ausreichende Auflösung im reziproken Raum für bildgebende Beugungsverfahren (z. B. Rocking-curve imaging), andererseits bei Bedarf hohen Fluss für hohe Bildfolgen zur Verfolgung von Prozessen in Echtzeit. Bereits vor der Inbetriebnahme von IMAGE wird – voraussichtlich ab Anfang 2007 – an der Ablenkmagnet-Strahllinie TOPO-TOMO ein Messplatz für Mikrotomographie bereitgestellt. Die Poster-Präsentation stellt den Planungsstand und einige wesentliche Anwendungsbereiche vor.
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Deutsche Tagung für Forschung mit
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Impressum: Herausgeber: A. Schreyer
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8:00 9:30 10:00 10:30 11:00 12:30 1
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Postersitzung A Mittwoch, 4. Oktobe
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Postersitzung B Donnerstag, 5. Okto
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12:30 - 13:35 Mittagspause Plenarsi
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Allgemeine Hinweise Tagungsort Die
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Lageplan Mensa Studierendenhaus (Ha
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Plenarvortrag Mi., 10:00-10:30 M-PV
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Plenarvortrag Mi., 17:00-17:30 M-PV
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Plenarvortrag Do., 13:00-15:30 D-PV
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Plenarvortrag Fr., 09:00-09:30 F-PV
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SNI für Neugierige Do., 16:30-17:0
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Senatsempfang Do., nach 18:00 D-AV1
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Mikroskopie und Tomographie Vortrag
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Mikroskopie und Tomographie Vortrag
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Dynamik Vortrag: Mi., 11:00-11:30 M
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Dynamik Vortrag: Mi., 11:50-12:10 M
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Nanostrukturen und Grenzflächen Vo
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Magnetismus Vortrag: Fr., 10:00-10:
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Biologische Systeme und Medizin Vor
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Index Autoren und ihre Beiträge: u
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Index M-P98, M-P100, M-P101, M-P195
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Index Deák, L. D-P300 Decker, H. M
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Index Gavrila, G. D-P276 Gebhardt,
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Index Homeyer, J. D-P377, D-P389 Ho
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Index Kravtsov, E. D-P231, D-P252 K
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Index Mezei, F. M-P13, M-P22, D-V27
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Index Ponce, M.L. D-P214 Ponkratz,
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Index Schmidt, O. M-P132, M-P153 Sc
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Index Stürmer, D. D-P405 Stuermer,
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Index Wochner, P. F-V68 Woiterski,
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