18.12.2012 Views

Deutsche Tagung f ¨ur Forschung mit ... - SNI-Portal

Deutsche Tagung f ¨ur Forschung mit ... - SNI-Portal

Deutsche Tagung f ¨ur Forschung mit ... - SNI-Portal

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

Chemische Prozesse und Phasenübergänge Vortrag: Fr., 12:10–12:30 F-V65<br />

Coherence experiments with white synchrotron radiation<br />

Tobias Panzner 1 , Wolfram Leitenberger 2 , Gudrun Gleber 1 , Tushar Sant 1 ,<br />

Ullrich Pietsch 1<br />

1 Festkörperphysik, Universität Siegen – 2 Institut für Physik, Universität Potsdam<br />

The third-generation X-ray source BESSYII (Berlin, Germany) provides a certain<br />

portion of coherent x-ray radiation which can be used for static and dynamic speckle<br />

analysis. Since about three years our group follows the concept of using “white”<br />

radiation for coherence experiments. Exploiting the exponentially decaying part of<br />

the BESSYII emission spectrum (critical energy 1 keV) we can use energies between 5<br />

< E < 20 keV with sufficient coherent flux.<br />

Various experiments were performed to test and to measure the coherence properties<br />

at the white-beam bending-magnet beamline (EDR). We measured static speckles<br />

from plane and surface patterend semiconductor and polymer surfaces under grazingincidence<br />

over a wide energy range simultaneous. In this scattering geometry the<br />

Fourier-back transformation is influenced by the incindence spectrum which already<br />

contains features of Fresnel diffraction of the coherent beam at the incident pinhole.<br />

This apparatus function has been measured at the samples site for different incidence<br />

conditions and was simulated in terms of Lommel formalism. Knowing this function<br />

one is able to deconvolute measured reciprocal space maps by the apparatus function<br />

to receive the speckle pattern of the measured surface. On the other hand one can<br />

consider this function as input for reconstruction of the true sample surface.<br />

Using this setup we performed first XCPS studies at polymer surfaces. On time scale<br />

of several 10 seconds we detected the dynamics of molecular movement initiated by<br />

laser light at the surface of light-sensitive azopolymer film. Considering the apparatus<br />

function one can discriminate between static features due to Fresnel scattering from<br />

incident pinhole and dynamic speckles induced by the light. Both show different autocorrelation<br />

function as well. The features can be observed simulataneous over a broad<br />

energy band which help to distinguish between diffusion and not-diffusion controlled<br />

processes.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!