Lattice ispMACH 4000 ZC/ZE Product Family Qualification Summary
Lattice ispMACH 4000 ZC/ZE Product Family Qualification Summary
Lattice ispMACH 4000 ZC/ZE Product Family Qualification Summary
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Electrostatic Discharge-Charged Device Model:<br />
<strong>ispMACH</strong><strong>4000</strong><strong>ZC</strong>/<strong>ZE</strong> product family was tested per the JESD22-C101, Field-Induced Charged-Device Model Test<br />
Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components procedure and <strong>Lattice</strong><br />
Procedure # 70-100844.<br />
All units were tested at 25˚C prior to reliability stress and after reliability stress. No failures were observed within<br />
the passing Classification.<br />
Table 3.4.3 <strong>ispMACH</strong> <strong>4000</strong><strong>ZC</strong>/<strong>ZE</strong> (Commercial/Industrial) ESD-CDM Data<br />
Device CDM Passing Voltage JEDEC CDM Classification<br />
LC4032<strong>ZC</strong>-TN44 > 1000V Class IV<br />
LC4032<strong>ZE</strong>-TN48 > 1000V Class IV<br />
LC4032<strong>ZE</strong>-MN64 > 1000V Class IV<br />
LC4064<strong>ZE</strong>-TN48 > 1000V Class IV<br />
LC4064<strong>ZE</strong>-MN64 > 1000V Class IV<br />
LC4064<strong>ZE</strong>-TN100 > 1000V Class IV<br />
LC4064<strong>ZC</strong>-TN100 > 1000V Class IV<br />
LC4128<strong>ZC</strong>-TN100 > 1000V Class IV<br />
LC4128<strong>ZE</strong>-TN100 > 1000V Class IV<br />
LC4128<strong>ZE</strong>-TN144 > 1000V Class IV<br />
LC4128<strong>ZE</strong>-MN144 > 1000V Class IV<br />
LC4256<strong>ZE</strong>-TN100 > 1000V Class IV<br />
LC4256<strong>ZE</strong> -MN144 > 1000V Class IV<br />
LC4256<strong>ZE</strong>-TN144 > 900V Class III<br />
CDM classification for Commercial/Industrial products, per JESD22-C101D<br />
LA-<strong>ispMACH</strong><strong>4000</strong> Automotive Grade product family was tested and Classified per the AEC-Q100-011, Charge<br />
Device Model (CDM) Electrostatic Discharge Test criteria and the JESD22-C101, Field-Induced Charged-Device<br />
Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components procedure.<br />
All units were tested at 25˚C and +125˚C prior to reliability stress and after reliability stress. No failures were<br />
observed within the passing Classification.<br />
Table 3.4.4 LA-<strong>ispMACH</strong> <strong>4000</strong> (Automotive) ESD-CDM Data<br />
Device CDM Passing Voltage AEC-Q100-011 CDM Classification<br />
LA4032V-TN44 > 1000V C5<br />
LA4032B-TN48 > 1000V C5<br />
LA4032<strong>ZC</strong>-TN48 > 1000V C5<br />
LA4064C-TN44 > 1000V C5<br />
LA4064B-TN48 > 1000V C5<br />
LA4064V-TN100 > 1000V C5<br />
LA4064<strong>ZC</strong>-TN100 > 1000V C5<br />
LA4128V-TN100 > 750V C4<br />
LA4128<strong>ZC</strong>-TN100 > 750V C4<br />
LA4128V-TN144 > 750V C4<br />
CDM classification for Commercial/Industrial products, per AEC-Q100-011<br />
INDEX Return<br />
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