[James_H._Harlow]_Electric_Power_Transformer_Engin(BookSee.org)
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FIGURE 3.6.8 Impulse-test setup.<br />
seen at the tested terminals of the transformer, causing a deviation in the test waveforms compared with<br />
the reference waveforms. The act of comparing the reduced full-wave records and the full-wave records<br />
is sometimes called “matching” the waves. If they are identical, the waves are said to be matched. Any<br />
differences in the waves, judged to be significant, are said to be mismatches. If there are mismatches,<br />
something is not correct, either in the test setup or in the dielectric system of the transformer. Various<br />
waveforms of voltages and currents associated with different types of defects are presented in great detail<br />
in the IEEE impulse guide [4]. When digital recorders are employed, methods of waveform analysis using<br />
the frequency dependence of the transformer impedance, transformer transfer function, and other digital<br />
waveform-analysis tools are now being developed and used to aid failure detection. Measurements of the<br />
voltages and currents in various parts of the transformer under test can aid in location of dielectric<br />
defects. These schemes are summarized in Figure 3.6.9.<br />
3.6.5.1.3 Switching-Impulse Test<br />
Man-made transients, as opposed to nature-made transients, are often the result of switching operations<br />
in power systems. Switching surges are relatively slow impulses. They are characterized by a wave that:<br />
1. Rises to peak value in no less than 100 s<br />
2. Falls to zero voltage in no less than 1000 s<br />
3. Remains above 90% of peak value, before and after time of crest, for no less than 200 s<br />
This is shown in Figure 3.6.10. Generally, the crest value of the switching-impulse voltage is approximately<br />
83% of the BIL.<br />
Voltages of significant magnitude are induced in all windings due to core-flux buildup that results<br />
from the relatively long duration of the impressed voltage during the switching-impulse test. The induced<br />
voltages are approximately proportional to the turns ratios between windings. Depending upon the<br />
transformer construction, shell-form versus core-form, three-leg versus five-leg construction, etc., many<br />
connections for tests are possible. Test voltages at the required levels can be applied directly to the winding<br />
under test, or they can be induced in the winding under test by application of switching impulse voltage<br />
of suitable magnitude across another winding, taking into consideration the turns ratio between the two<br />
FIGURE 3.6.9 Impulse-current measurement locations.<br />
windings. The magnitudes of voltages between windings and between different phases depend on the<br />
connections. This is discussed in great detail in the IEEE impulse guide [4].<br />
Because of its long duration and high peak-voltage magnitude, application of switching impulses on<br />
windings can result in saturation of the transformer core. When saturation of the core occurs, the resulting<br />
waves exhibit faster-falling, shorter-duration tails. By reversing polarity of the applied voltages between<br />
successive shots, the effects of core saturation can be reduced. Failures during switching-impulse tests<br />
are readily visible on voltage wave oscillograms and are often accompanied by loud noises and external<br />
flashover.<br />
Switching-impulse tests are generally carried out with impulse generators having adequate energy<br />
capacity and appropriate wave-shaping resistors and loading capacitors.<br />
3.6.5.2 Low-Frequency Dielectric Tests<br />
3.6.5.2.1 Purpose of Low-Frequency Dielectric Tests<br />
When high-frequency impulse voltages are applied to transformer terminals, the stress distributions<br />
within the windings are not linear but depend on the inductances and capacitances of the windings. Also,<br />
the effects of oscillations penetrating the windings produce complex and changing voltage distributions.<br />
Low-frequency stresses that result from power-frequency overvoltage, on the other hand, result in stresses<br />
with a linear distribution along the winding. Because the insulation system is stressed differently at low<br />
frequency, a second set of tests is required to demonstrate dielectric withstand under power-frequency<br />
conditions. The low-frequency dielectric tests demonstrate that the power transformer insulation system<br />
© 2004 by CRC Press LLC<br />
© 2004 by CRC Press LLC