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Test & Measurement<br />
Real-time Profiling for Focusing, M 2 , Divergence & Alignment<br />
For an instrument with a single z-plane of measurement,<br />
finding the focus is a truly frustrating exercise. Setting multiple<br />
production assemblies to the identical focus is time consuming<br />
and costly. If the assembly does not adjust correctly,<br />
you have no real-time indication of what the problem might<br />
be. The BeamMap2 enables you to measure and correct<br />
these beam focus and alignment errors to μm accuracy.<br />
If these planes are around the focus position, even<br />
when not at the focus, the BeamMap2 can:<br />
• Measure the axial misalignment (pointing)<br />
• Indicate the current focus direction in X, Y & Z<br />
• Estimate the beamwaist diameter at the focus<br />
• Estimate M 2 and/or beam divergence<br />
• Do all this in real-time at a 5 Hz update rate<br />
Key Features<br />
• 190 to 1,150 nm, Silicon detector<br />
• 650 to 1,800 nm, InGaAs detector<br />
• 1,000 to 2,300 or 2,500 nm, InGaAs (extended) detector<br />
• Multiple plane spacing options available<br />
• Beam diameters 5 µm to 4 mm, to 2 µm<br />
in Knife Edge mode<br />
• Port-powered USB 2.0; flexible 3 m cable, no power brick<br />
• 0.1 µm sampling and resolution<br />
• Linear & log X and Y profiles, centroid<br />
• Profile zoom & slit width compensation<br />
• Real-time multiple Z plane scanning slit system<br />
• Real-time XYZ profiles, focus position<br />
• Real-time M², divergence, collimation, alignment<br />
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