Semrock Master Catalog 2018

MaxLine ® Laser-line Spectra and Specifications
Transmission (%)
100
90
80
70
60
50
40
30
20
10
Design
Measured
0
735 745 755 765 775 785 795 805 815 825 835
Wavelength (nm)
Optical Density
0
1
2
3
4
5
Design
Measured
Instrument Noise Limit
6
735 745 755 765 775 785 795 805 815 825 835
Wavelength (nm)
MaxLine Filter Blocking Performance (532 nm filter shown)
[1]
Optical Density
0
1
2
3
4
5
OD 5 Blue
Range
OD 6 Blue
Range
OD 6 Red
Range
OD 5 Red
Range
These graphs demonstrate the
outstanding performance of the
785 nm MaxLine laser-line filter,
which has transmission guaranteed
to exceed 90% at the laser line and
OD > 5 blocking less than 1% away
from the laser line. Note the excellent
agreement with the design curves.
6
7
532 nm Laser Line
Design
425 450 475 500 525 550 575 600 625 650 675 700
Wavelength (nm)
Common Specifications
Property Value Comment
Laser Wavelength λ L
Standard laser wavelengths available See page 98
Transmission at Laser Line > 90% Except λ L
< 400 nm; will typically be even higher
Bandwidth
Typical 0.38% of λ L Full Width at Half Maximum (FWHM)
Maximum 0.7% of λ L
Typical 0.7% and Maximum 0.9% for 248.6 & 266 nm
Blocking [1] OD > 5 from λ L
± 1% to 4500 cm –1
(red shift) and 3600 cm –1 (blue shift); OD = – log 10
(Transmission)
OD > 6 from λ L
± 1.5% to 0.92 and 1.10 × λ L
Angle of Incidence 0.0° ± 2.0° See technical note on page 105
Temperature Dependence < 5 ppm / °C < 0.003 nm / °C for 532 nm filter
Laser Damage Threshold 0.1 J/cm 2 @ 532 nm (10 ns pulse width) Tested for 532 nm filter only (see page 108)
Substrate Material Low autofluorescence NBK7 or better Fused silica for 248.6, 266, and 325 nm filters
Substrate Thickness
2.0 ± 0.1 mm
Overall Thickness 3.5 ± 0.1 mm Black-anodized aluminum ring
Coating Type
“Hard” ion-beam-sputtered
Outer Diameter
12.5 + 0.0 / – 0.1 mm
(or 25.0 + 0.0 / – 0.1 mm)
Black-anodized aluminum ring
Clear Aperture ≥ 10 mm (or ≥ 22 mm) For all optical specifications
Transmitted Wavefront Error < λ / 4 RMS at λ = 633 nm
Peak-to-valley error < 5 x RMS measured within
clear aperture
Beam Deviation
≤ 10 arcseconds
Surface Quality 60-40 scratch-dig Measured within clear aperture
Ion-beam-sputtered, hard-coating technology with epoxy-free, single-substrate construction for
Reliability and Durability unrivaled filter life. MaxLine filters are rigorously tested and proven to MIL-STD-810F and
MIL-C-48497A environmental standards.
The wavelengths associated with these red and blue shifts are given by l = 1/(1/λ L
– red shift ×10 –7 ) and l = 1/(1/l L
+ blue shift × 10 –7 ), respectively, where
l and λ L
are in nm, and the shifts are in cm –1 . Note that the red shifts are 3600 cm –1 for the 808 and 830 nm filters and 2700 cm –1 for the 980 nm filter, and
the red and blue shifts are 2400 and 800 cm –1 , respectively, for the 1047 and 1064 nm filters. See Technical Note on wavenumbers on page 101.
725
NIR Filters Mirrors Polarizers
Edge
Filters
Dichroic
Beamsplitters
Laser-line
Filters
Laser Diode
Filters
Notch
Filters
Lamp Clean-up
Filters
99
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