Try Nanotec´s exclusive technique “Jumping Mode plus”

Nanotec WSxM
Software
for Data Acquisition
& Processing
• The best software for the SPM
Community
• Free downloadable from nanotec
website
• Unlimited control options with Dulcinea
SPM Controller
Follow its regular updates through
Nanotec Forum
http://nanotec.es/forum/
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25.000 times/year
Nanotec Dulcinea
Control Unit
• Robust & powerful electronics
• 16 output and 16 input channels with 7
of them user accessible via BNCs
• Simultaneous control of multiple feedback
loops for advanced SPM techniques:
Combinable Frecuency Modulation,
E+MFM, Force Gradient KPM, 3d Modes
Spectroscopy, Drive Amplitude Modulation,...
www.nanotec.es
DESIGN: ADERAL
Nanotec
Solutions
Nanotec offers you its Customized
Development Service (CDS) to the most
challenging Scanning Probe objectives.
When Nanotec’s CDS solutions are
implemented with the powerful Dulcinea
Control Unit and the flexible WSxM
Software, you get the best option
for research innovation even
on the most difficult projects.
Contact us:
+34 91 804 33 26
sales@nanotec.es
www.nanotec.es
O. Custance
“The Nanotec
Dulcinea SPM
Control Unit has
been a pivotal
tool in achieving
our results”
Ref: Sugimoto et al.
Nature 446 Vol1. 2007
Chemical identification
of individual surface
atoms by atomic force
microscopy
TOGETHER
to success
J. Colchero
“Nanotec provides personalized
and effective SPM Systems
for all applications”
Ref: Palacios-Lidón et al.
Nanotehnology 20 2009
Enhancing dynamic scanning force
microscopy in air: as close as possible
M. Jaafar
“Nanotec´s R&D
Department always
helps me to get
the best solutions“
Ref: M. Jaafar et al.
Ultramicroscopy 109 2009
Variable-field magnetic
force microscopy

SURFACE SCIENCES
Enjoy the flexibility of Nanotec´s Dulcinea SPM Control Unit; couple
it with any SPM System you desire, we are specialized in interfacing
third part UHV/SPM. Together with the famous WSxM software it will
allow your AFM/STM to address any project that might arise.
Ref: A. J. Martinez-Galera et al. Nanolettes 2011. Vol 11, 3576 - 3580
Ethylene Irradiation: A New Route to Grow Graphene on Low Reactivity Metals
Discover state-of-the-art properties of nanostructures
using Cervantes FullMode and its advanced techniques
such as FM-KPM (Frequency Modulation with Kelvin Probe
Microscopy), Nanomanipulation, Conductive Mapping, and
many more.
Ref: M. Elices et al. Macromolecules 2011. Vol 44, 1166-1176
Bioinspired Fibers Follow the Track of Natural Spider Silk
SEMI
CONDUCTORS
Map out the surface potential by
implementing KPM with Nanotec’s
integrated double lock-in and Phase-
Locked Loop (PLL) capability. No
additional modules or upgrades are
required to perform the most sensitive
surface potential maps with the
Cervantes FullMode AFM. Enjoy the
repeatability and ease of use of our
system.
Images of 750 nm of copolymers in different
configurations
Ref: A.Gil Nanotec Electronica, and M.A.Gómez-Rodriguez, ICTP-CSIC
a) AFM image of a matrix containing site
controlled QDs with 2µm pitch period
b) 500x500 nm AFM image of a single QD
LT-STM-UHV image of Au(111) measured at 4K.
The Image has not been smoothed in any way.
The System is conntrolled by Dulcinea SPM Control
Unit and opearated by WSxM Software
Ref: M.M. Ugeda Doctoral Thesis. LNM-UAM
NANO
MATERIALS
Topographic (c) and corresponding force gradient
KPM image (d). Z scale is 10 nm and 100 mV,
respectively
Ref: B. Pérez-García et al. Nanotechnology 2008. Vol 19, 065709
Surface potential domains on lamellar P3OT structures
Topography and surface potential (KPM) Images of
a diode with the application of -30V in the drain
Ref: Y.Luo et al. Advanced Materials 2007. Vol 19, 2267- 2273
Probing Local Electronic Transport at the Organic Single-Crystal/Dielectric Interface
LIFE SCIENCES
JM+ Activated
JM+ Switched off at the red area
Ref: A. Ortega-Esteban et al. Ultramicroscopy 2012, vol
114 56-61 Minimizing tip–sample forces in jumping
mode AFM in liquid
CARBON
STRUCTURES
Ref: M. Moreno
Carbon Nanotubes wrapped with single strand RNA
Courtesy of Nanoforces Group - UAM
S5
S3
S2
Representation
25 nm
Ref: C. Carrasco et al. PNAS 2006. Vol 103, 37, 13706-13711 DNAmediated
anisotropic mechanical reinforcement of a virus
C. Carrasco et al. PNAS 2008. Vol 105, 11, 4151 Manipulation of the
mechanical properties of a virus
Try Nanotec´s exclusive technique “Jumping Mode plus”
(JM+) to have unprecedented control of relevant imaging
parameters. Obtain True Atomic Resolution in liquids using
Nanotec Lanza AFM head coupled with Special Liquid Holder.
X-ray
The use of AFM in carbon structures studies is widespread
throughout industry and academia. With the combination of
WSxM Software and the possibility of 16 analog input channels
and 16 analog output channels, Nanotec’s Systems can address
virtually any project.
Ref: M. C. Strus et al. Nanotechnology 2009, Vol 20 385709
Strain energy and lateral friction force distributions of CNTs
nanomanipulated into shapes by atomic force
Ref: D. Martinez-Martin et al. PRL 2011. Vol 106, Noninvasive Protein
Structural Flexibility Mapping by Bimodal Dynamic Force Microscopy
b) Strain energy ditribution
along the SWCNT
d) 3D topography of SWCNT
AFM Image of Graphene Oxide sheets.
The horizontal line indicates the section
corresponding to the trace shown on
the right
NANOELECTRONICS
Enjoy advanced techniques such as Conductive-AFM (C-AFM),
Spreading Current Maps and Spectroscopy Modes like I(V),
I(z) and I(V,z) to obtain 3d Mode Maps and Data Volume
images using Nanotec’s General Spectroscopy Imaging tools.
Combined C-SFM and KPM reading
strategy and High Resistivity (HR)
multilevel detection:
(a) Topographic view (total height 4 nm)
(b) Simultaneous current map. Total
current scale 100 nA
(c) Contact Potential Difference (CPD)
map as measured by KPM
Ref: C. Moreno et al. Nanoletters 2010. Vol 10, 3828 - 3835
Reversible Resistive Switching and Multilevel Recording in La0.7Sr0.3MnO3
Thin Films for Low Cost Nonvolatile Memories
Ref: D. Martinez-Martin et al. Physical Reviw Letters 2010 Vol 105, 257203
Upper Bound for the Magnetic Force Gradient in Graphite
(a) 3d Mode maps of differential conductance surface vs bias voltage and z
displacement dI/dz(V,z) for a 1.3 nm diameter SWNT
(b) Differential conductance for 3 different forces.
The force is calculated using F = kz, k = 2 N/m
(c) (d)
SWCNTS connected to electrode. Image c) Vtip = 0V; Image d) Vtip = 2V
Ref: P. J. de Pablo et al. APL 2001. Vol 79, 18, 2979 – 2981
Visualization of single-walled carbon nanotubes electrical networks
by scanning force microspy
NANO
MAGNETISM
Visualize High Resolution MFM images,
and create easily video of changes in
magnetic domains as a variable in-plane
or out-of-plane magnetic field is applied.
Make use of Nanotec High Vacuum-SPM
Systems to obtain even better results.
Ref: J. Martin-Sanchez et al. ACSNano 2009.
Ref: M. Jaafar et al. Nanotechnology 2008 . Vol 19, 285717 Field induced vortex dynamics in magnetic Ni nanotriangles
www.nanotec.es
Vol 3, No 6, 1513 - 1517 Site controlled Quantum Dots
www.nanotec.es
Ref: C.Botas et al. Carbon 2012, Vol 50 275-282
The effect of the parent graphite on the structure of graphene oxide
Phys Rew B 2010. Vol 81, 054439 Control of the chirality and polarity of magnetic vortices in triangular nanodots
www.nanotec.es
Nanotec AFM
Topography and Flexibility maps of a single IgM antibody
True Atomic Resolution of Mica in liquid
c)
3 µm x 3 µm AFM (a), KPFM (d), and MFM (e) images taken in high vacuum on HOPG.
With E+MFM the electrostatic and magnetic signals have been obtained simultaneously and
independently
b)
Experiment
Design
Ref: C. Gómez-Navarro et al. JMS - Mater Electron 2006. Vol 19, 475 -482
Studying electrical transport in carbon nanotubes by conductance atomic force microscopy
Variable Field MFM images of
a Ni nanotriangle core vortex dynamics
obtained at different magnetic fields (top row)
and micromagnetic simulations (bottom row)