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_____________________________________________________________ Results and Discussion<br />

The typical approach for SAM desorption is the polarization of SAM-modified Au surfaces to<br />

potentials that are either too positive or too negative, leading to the cleavage of the Au-S bond,<br />

that is, oxidative or reductive desorption, respectively. However, the exact potential values<br />

needed in order to provoke SAM desorption are under discussion for decades and a substantial<br />

variety of values is reported. According to our knowledge, applying both positive and negative<br />

potentials within the same desorption process by pulsing between these potentials was not yet<br />

reported. Even though fairly fast desorption times are reported in the literature 18 (down to 30 s)<br />

the aim of the study was to further improve the efficiency of desorption.<br />

Applying very high potentials seems a reasonably simple approach to achieve SAM desorption,<br />

however, another important condition for the development of a desorption process is to leave<br />

the electrode surface undamaged after polarization, especially in the case of multi-electrode<br />

chips where the Au layer thickness is in the order of nm. Therefore, the potential pulse-assisted<br />

desorption approach was developed by exposing the electrode to very short potential pulses<br />

within the range of ms. The modified electrode was exposed to potential pulsing between<br />

potential values of 0.9 V and -0.9 V (vs. Ag/AgCl/3 M KCl) with a pulse time of 10 ms. The<br />

influence of the applied pulse profile on a DNA-modified electrode is presented in Figure 3.41.<br />

Prior to desorption, a bare electrode was modified with ssDNA by incubation for 2 min to mimic<br />

the conditions that would be observed on the chip. Namely, during potential-assisted DNA<br />

immobilization on a selected chip electrode, the rest of the electrodes would be exposed to the<br />

same solution and the DNA molecules would immobilize at OCP. In order to prevent later<br />

cross-talk between electrodes, these surfaces need to be cleaned prior to further modification<br />

with a desired probe DNA. Even though short DNA immobilization at OCP leads to a minor<br />

Rct increase (Figure 3.41, a) and consequently to a small DNA coverage, it can behave as an<br />

impurity significantly affecting the surface modification. Subsequent modification with a DNA<br />

probe of interest is then leading to a less efficient hybridization since the probe DNA coverage<br />

is higher than the optimal one. Even though the optimized immobilization procedure is<br />

employed the hybridization will be hindered due to the contribution from the leftover DNA.<br />

After the treatment of the DNA-modified electrode with the developed desorption method for<br />

30 s Rct decreases to the value of the bare electrode and the voltammogram obtains the same<br />

shape as for the bare electrode, showing that all DNA was efficiently removed from the surface.<br />

3.3 Importance of controlling the surface 82

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