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_____________________________________________________________ Results and Discussion<br />

immobilization time employed in the experiment (30 s) is not optimal and already leads to a too<br />

high ssDNA coverage for the employed detection scheme resulting in a decreased hybridization<br />

efficiency. By doing this the rest of the electrodes were longer exposed to immobilization by<br />

incubation allowing to investigate, how a possible contamination influences the quality of the<br />

chip preparation. After potential-assisted immobilization of FRIZ ssDNA and passivation with<br />

MCU, region a was also exposed to E. coli ssDNA. There was no signal upon hybridization<br />

with E. coli tDNA showing the high integrity of the formed FRIZ/MCU films.<br />

Region b was exposed to FRIZ ssDNA solution, and subsequently to the MCU passivating<br />

solution and finally to the E. coli ssDNA solution, with immobilization occurring by incubation<br />

in all cases. Prior to the final potential-assisted passivation with MCU, the electrodes were<br />

cleaned using the potential-assisted desorption method. Thus, this region should be modified<br />

only with MCU. Figure 3.50, b and c confirm this by showing the absence of any signal from<br />

FRIZ and E. coli tDNA (grey curve). In order to prove that the absence of signals is due to a<br />

successful desorption and not due to an undetectable amount of immobilized DNA, region d<br />

was exposed to same conditions, without performing any desorption step. That region should<br />

be modified with both FRIZ and E. coli ssDNA sequences and passivated completely with<br />

MCU. In both cases (Figure 3.50, b and c, beige curve) a very small amount of tDNA is detected<br />

upon hybridization with both FRIZ and E. coli tDNA, however, this signal is negligible as<br />

compared to the signal obtained in the regions with potential-assisted immobilization.<br />

Nevertheless, the amount of contaminating DNA is measurable, proving that desorption in<br />

region b was done successfully.<br />

Finally, region c was initially exposed to FRIZ ssDNA solution at OCP, after which the<br />

electrodes were cleaned by potential-assisted desorption and subsequently immobilized with E.<br />

coli ssDNA and passivated with MCU by the potential-assisted method. Therefore, it is the only<br />

region that should show a signal upon hybridization with the E. coli tDNA sequence (Figure<br />

3.50, c, green curve). The absence of any peak upon hybridization with FRIZ tDNA (Figure<br />

3.50, b, green curve) also indicates that desorption was performed successfully in this region as<br />

well.<br />

Potential-assisted methods for immobilization and desorption allow for a fully<br />

electrochemically controlled preparation of DNA chips within a very short time. The big<br />

advantage of the potential-assisted immobilization method is that it provides the desired DNA<br />

coverage and blocking of the surface tremendously faster than the process at OCP and by this<br />

3.4 Potential-assisted preparation of DNA sensors 94

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