DISSERTATION
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_____________________________________________________________ Results and Discussion<br />
immobilization time employed in the experiment (30 s) is not optimal and already leads to a too<br />
high ssDNA coverage for the employed detection scheme resulting in a decreased hybridization<br />
efficiency. By doing this the rest of the electrodes were longer exposed to immobilization by<br />
incubation allowing to investigate, how a possible contamination influences the quality of the<br />
chip preparation. After potential-assisted immobilization of FRIZ ssDNA and passivation with<br />
MCU, region a was also exposed to E. coli ssDNA. There was no signal upon hybridization<br />
with E. coli tDNA showing the high integrity of the formed FRIZ/MCU films.<br />
Region b was exposed to FRIZ ssDNA solution, and subsequently to the MCU passivating<br />
solution and finally to the E. coli ssDNA solution, with immobilization occurring by incubation<br />
in all cases. Prior to the final potential-assisted passivation with MCU, the electrodes were<br />
cleaned using the potential-assisted desorption method. Thus, this region should be modified<br />
only with MCU. Figure 3.50, b and c confirm this by showing the absence of any signal from<br />
FRIZ and E. coli tDNA (grey curve). In order to prove that the absence of signals is due to a<br />
successful desorption and not due to an undetectable amount of immobilized DNA, region d<br />
was exposed to same conditions, without performing any desorption step. That region should<br />
be modified with both FRIZ and E. coli ssDNA sequences and passivated completely with<br />
MCU. In both cases (Figure 3.50, b and c, beige curve) a very small amount of tDNA is detected<br />
upon hybridization with both FRIZ and E. coli tDNA, however, this signal is negligible as<br />
compared to the signal obtained in the regions with potential-assisted immobilization.<br />
Nevertheless, the amount of contaminating DNA is measurable, proving that desorption in<br />
region b was done successfully.<br />
Finally, region c was initially exposed to FRIZ ssDNA solution at OCP, after which the<br />
electrodes were cleaned by potential-assisted desorption and subsequently immobilized with E.<br />
coli ssDNA and passivated with MCU by the potential-assisted method. Therefore, it is the only<br />
region that should show a signal upon hybridization with the E. coli tDNA sequence (Figure<br />
3.50, c, green curve). The absence of any peak upon hybridization with FRIZ tDNA (Figure<br />
3.50, b, green curve) also indicates that desorption was performed successfully in this region as<br />
well.<br />
Potential-assisted methods for immobilization and desorption allow for a fully<br />
electrochemically controlled preparation of DNA chips within a very short time. The big<br />
advantage of the potential-assisted immobilization method is that it provides the desired DNA<br />
coverage and blocking of the surface tremendously faster than the process at OCP and by this<br />
3.4 Potential-assisted preparation of DNA sensors 94