eldo_user

Chapter 15
Aging and Reliability Simulation
Reliability models are implemented in the Eldo UDRM (User Defined Reliability Model)
interface.
The objective of aging and reliability simulation is to be able to model the gradual damage,
which occurs to the devices in a certain design causing degradation in the performance of that
design. It is required to evaluate the amount of degradation occurring in a certain period of
operation and examine the circuit performance after this period. The modeled damage could
follow one or more of several damage mechanisms, which show gradual degradation in device
performance.
The reliability simulations follows the model defined by the user using the UDRM interface.
Degradation effects supported are: Hot-Carrier degradation, and NBTI (Negative Bias
Temperature Instability) degradation.
Tip
Refer to Eldo UDRM User’s Manual for more information.
Running Reliability Simulation in Eldo
Reliability simulation in Eldo can be used with any normal netlist provided that it contains a
.TRAN or .SST analysis. This .TRAN or .SST analysis is the analysis used for all the fresh and
aged simulations, and its outputs are also available for all the fresh and aged simulations.
The reliability simulation is invoked and controlled through the Eldo reliability commands,
summarized in Table 15-1. Clicking on a command link in the table will open the description
inside the Eldo Reference Manual.
Table 15-1. Eldo Reliability Commands
Command
Description
.AGE
Age analysis
.AGE_LIB
Define functions for reliability
.AGE_SENSITIVITY Provide information about the stress sensitivity
.AGEMODEL Reliability model parameter declaration
.SETKEY
Set reliability model key (password)
Eldo® User's Manual, 15.3 713