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See Also<br />

• .PLOT command in the Eldo Reference Manual<br />

Specifying Simulation Output<br />

Plotting, Printing and Probing States<br />

• Options LIMPROBE and NOCMPUNIX in the Eldo Reference Manual<br />

Related Topics<br />

Plotting, Printing and Probing States<br />

Plotting, Printing and Probing<br />

Output Variables<br />

Limiting Output Information<br />

Plotting, Printing and Probing States<br />

To monitor or plot an internal state of a device, use the following syntax:<br />

.PLOT analysis S(device->state)<br />

For example, to monitor In for a given transistor Q1, specify the following in the netlist for DC,<br />

AC or TRAN analyses respectively:<br />

.PLOT DC S(Q1->In)<br />

.PLOT AC S(Q1->In)<br />

.PLOT TRAN S(Q1->In)<br />

For example, to monitor the HICUM Level0 transistor device temperature change due to selfheating<br />

in a transient simulation, specify:<br />

.plot tran s(q1->vthermal)<br />

For example, to monitor the TFT Amorphous-Si MOSFET device transconductance in a DC<br />

simulation, specify:<br />

.plot dc s(M1->Gm)<br />

Internal states specific to each device model are documented in the Printing/Plotting States<br />

tables in the Eldo Device Equations Manual.<br />

Tip<br />

See “.PLOT” in the Eldo Reference Manual.<br />

Related Topics<br />

Plotting Internal Pin Values<br />

Plotting, Printing and Probing<br />

Eldo® User's Manual, 15.3 313

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