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Setting Up An Analysis<br />

Aging and Reliability Analysis<br />

Thus, the designer’s task is to discover what is the most appropriate model for their<br />

requirements.<br />

An objective is anything that can be extracted or measured from the output waveform. Regular<br />

.EXTRACT statements can be specified with additional optimization parameters, or the<br />

.OBJECTIVE command—specifically dedicated to optimization—can be used for more<br />

complex objectives.<br />

Tip<br />

See “.OPTIMIZE” in the Eldo Reference Manual.<br />

Optimization Results<br />

The results of optimization must be analyzed to verify whether the optimization has succeeded<br />

in its task of finding a solution. The results of optimization are output using the .EXTRACT and<br />

.PLOT commands and provided in two ways:<br />

• ASCII Output<br />

o<br />

o<br />

The Eldo standard output (.chi) file provides simplified information about the<br />

optimization process.<br />

The results of optimization are generated in a .otm file. This is a structured text file<br />

separated into three major sections: initialization (scaling of variables and<br />

objectives), optimization phase, and the results of the process (final variables and<br />

objectives). Run the utility named viewotm on the .otm file to display the results.<br />

• Graphical Output<br />

Extracted waveforms generated during an optimization process can be viewed using<br />

EZwave. These are implicitly declared waves which have the same name as the extract<br />

label they refer to.<br />

Related Topics<br />

Optimization<br />

Aging and Reliability Analysis<br />

Reliability models are implemented in the Eldo UDRM (User Defined Reliability Model)<br />

interface.<br />

The objective of aging and reliability simulation is to be able to model the gradual damage,<br />

which occurs to the devices in a certain design causing degradation in the performance of that<br />

design. It is required to evaluate the amount of degradation occurring in a certain period of<br />

operation and examine the circuit performance after this period. The modeled damage could<br />

follow one or more of several damage mechanisms, which show gradual degradation in device<br />

Eldo® User's Manual, 15.3 277

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