Deliverables and Services - IHP Microelectronics

E I N G E L A d E N E V O R T R ä G E – I N V I T E d P R E S E N T A T I O N S
(53) Base doping and dopant Profile Control
of SiGe NPN and PNP HBTs
B. tillack, B. Heinemann, D. Knoll, H. Rücker,
Y. Yamamoto
5 th International Symposium on Control of
Semiconductor Interfaces, tokyo, november
12-14, 2007, Japan
(54) Base doping and dopant Profile Control
of SiGe NPN and PNP HBTs
B. tillack, B. Heinemann, D. Knoll, H. Rücker,
Y. Yamamoto
3 rd International Workshop on new Group
IV Semiconductor nanoelectronics, Sendai,
november 07-08, 2007, Japan
(55) Erste Erfahrungen mit der Zeiss-FIB / SEM
NVision 40 für die STEM / TEM-Lamellen
Präparation
G. Weidner
präparationstreffen, potsdam, April 05, 2007,
Germany
(56) Skalierbare Kondensatoren in der
drahtlosen Kommunikationstechnik
Ch. Wenger
oberseminar des 2. Institutes für physik
der universität Göttingen, April 27, 2007,
Germany
(57) Skalierbare Kondensatoren in der
drahtlosen Kommunikationstechnik
Ch. Wenger
Kolloquium der Fakultät elektrotechnik & It,
tu Dresden, May 09, 2007, Germany
(58) Pole Figure Analysis for a Complex
Characterization of Heteroepitaxial
Structures of Silicon
p. Zaumseil
7 th Autumn School on X-Ray Scattering from
Surfaces and thin layers, Smolenice, october
04-06, 2007, Slovakia
(59) X-Ray Characterization of New High-k
dielectric Materials
p. Zaumseil
Monash university, Clayton, February 26,
2007, Australia
(60) X-Ray diagnostic for Microelectronics
Application at IHP in Frankfurt (Oder)
p. Zaumseil
Karlsruhe, December 13, 2007, Germany
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