GaN: Applications in RF Systems Beyond The PA - RF Micro Devices
GaN: Applications in RF Systems Beyond The PA - RF Micro Devices
GaN: Applications in RF Systems Beyond The PA - RF Micro Devices
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<strong>GaN</strong>: <strong>Applications</strong> <strong>in</strong> <strong>RF</strong><br />
<strong>Systems</strong> <strong>Beyond</strong> <strong>The</strong> <strong>PA</strong><br />
Rama Vetury, <strong>RF</strong>MD
Outl<strong>in</strong>e<br />
• Properties of <strong>GaN</strong><br />
• System Challenges<br />
• System Advantages Afforded by <strong>GaN</strong><br />
• <strong>GaN</strong> Components<br />
• Summary
• <strong>GaN</strong> Is Natural Fit For High Power <strong>Applications</strong><br />
Properties of <strong>GaN</strong><br />
High<br />
Voltage<br />
High<br />
Current<br />
Density<br />
High<br />
Frequency<br />
High<br />
Power<br />
Amp
• <strong>GaN</strong> Also Enables <strong>Applications</strong> <strong>Beyond</strong> <strong>The</strong> H<strong>PA</strong><br />
Properties of <strong>GaN</strong><br />
Ruggedness<br />
Power<br />
Handl<strong>in</strong>g<br />
Low Loss,<br />
Low Noise<br />
UNREALIZED<br />
Potential<br />
Other<br />
<strong>RF</strong><br />
Functions
Challenges <strong>in</strong> <strong>RF</strong> systems<br />
Civilian &<br />
Military Radar<br />
Electronic Warfare<br />
• Efficiency<br />
• Weight<br />
• Size<br />
COST<br />
-OR -<br />
• <strong>The</strong>rmal Management<br />
CATV<br />
Cellular and<br />
Broadcast<br />
Communications<br />
Military and Mobile<br />
Communications
Communication <strong>Systems</strong><br />
• Key System Requirements<br />
• Range<br />
• Weight & Form Factor<br />
• Efficiency<br />
• Inter-operability / Waveform Versatility / SDR<br />
• Key <strong>RF</strong> Component Requirements (apart from <strong>PA</strong>)<br />
• Broadband, High Power & High Efficiency Switch<strong>in</strong>g Function<br />
• Low Noise & High Power VCO<br />
• Robust & Wideband LNA
Radar <strong>Systems</strong><br />
Passive Phased Array<br />
BeamFormer<br />
• Active Phased Array Radar <strong>Systems</strong> Advantages<br />
Active Phased Array<br />
• Low Loss, Higher Sensitivity<br />
• More Reliable, Graceful Degradation<br />
• Increased capability (multiple digital beamform<strong>in</strong>g, improved clutter attenuation)<br />
• Solid State T/R module Key Enabler of Advanced Active <strong>PA</strong>R systems<br />
• Fully <strong>GaN</strong> MMIC T/R module improves system design tradeoffs<br />
• Range, Resolution, Efficiency<br />
• Size, Weight<br />
• Environmental Ruggedness<br />
LNA<br />
H<strong>PA</strong><br />
T/R<br />
T/R<br />
T/R<br />
BeamFormer<br />
Receiver<br />
Exciter
Radar <strong>Systems</strong><br />
GaAs<br />
LNA<br />
GaAs<br />
H<strong>PA</strong><br />
• All <strong>GaN</strong> MMIC T/R Enables<br />
• Limiter Reduction/Elim<strong>in</strong>ation<br />
• Circulator Elim<strong>in</strong>ation<br />
• Improved NF & Resolution<br />
• dc power distribution efficiency (48V)<br />
• System Benefits<br />
Limiter &<br />
Protection<br />
Circulator<br />
• Lower Cost<br />
• Improved Range & Search Volume<br />
<strong>GaN</strong><br />
Attenuator<br />
<strong>GaN</strong><br />
Phase Shifter<br />
<strong>GaN</strong><br />
Switch<br />
<strong>GaN</strong><br />
H<strong>PA</strong><br />
<strong>GaN</strong><br />
LNA<br />
<strong>GaN</strong><br />
Switch<br />
• Key <strong>GaN</strong> component Requirements<br />
– LNA<br />
– Robustness<br />
– Low NF, High DR<br />
– Switch<br />
– High Power, High Efficiency<br />
– H<strong>PA</strong><br />
– Power density, Efficiency, BW, Ga<strong>in</strong>
Commercial CATV Transmission<br />
• Key Next Gen System Requirements<br />
• ‘Fiber Deep’ architectures<br />
• Greater Throughput<br />
• Increased Bandwidth<br />
• <strong>GaN</strong> Enables<br />
• Better L<strong>in</strong>earity Amplifier<br />
• Fewer Repeaters<br />
• 20% Lower Energy Costs<br />
• System Insertion<br />
• Trunk Amplifiers<br />
• Optical Nodes<br />
• L<strong>in</strong>e Extenders<br />
Optical Node
<strong>GaN</strong> <strong>RF</strong> Components<br />
Ruggedness<br />
Power<br />
Handl<strong>in</strong>g<br />
Low Loss,<br />
Low Noise<br />
UNREALIZED<br />
Potential<br />
� <strong>GaN</strong> CATV Hi L<strong>in</strong>earity Amp<br />
� <strong>GaN</strong> LNA<br />
� <strong>GaN</strong> Switch<br />
� <strong>GaN</strong> VCO<br />
� <strong>GaN</strong> Mixer<br />
� <strong>GaN</strong> Ga<strong>in</strong> Block<br />
� <strong>GaN</strong> Phase shifters<br />
� <strong>GaN</strong> Var. Attenuators
CATV L<strong>in</strong>ear Amplifier Block Diagram<br />
Forward Path<br />
Input<br />
Return Path<br />
Output<br />
Push Pull Hybrid<br />
Duplex Filter<br />
Pre-Amplifier Output Amplifier<br />
Power Doubler Hybrid<br />
Return Path Amplifier Duplex Filter<br />
Reverse Hybrid<br />
Forward Path<br />
Output<br />
Return Path<br />
Input
CATV Hybrid L<strong>in</strong>ear Amplifier<br />
Block Diagram<br />
Simplified Schematic<br />
Port<br />
<strong>RF</strong><strong>in</strong><br />
TF<br />
TF1<br />
R<br />
R1<br />
R<br />
R2<br />
GaAsFET<br />
FET1<br />
R<br />
R3<br />
GaAsFET<br />
FET2<br />
� Ma<strong>in</strong>ta<strong>in</strong> L<strong>in</strong>earity<br />
� Increase Power<br />
� Elim<strong>in</strong>ate ESD protection<br />
� Lower Overall System Costs<br />
R<br />
R4<br />
GaAsFET<br />
FET3<br />
GaAsFET<br />
FET4<br />
Port<br />
24V<br />
XFERTAP<br />
XFer1<br />
Replace GaAs<br />
with <strong>GaN</strong><br />
Port<br />
<strong>RF</strong>out
L<strong>in</strong>earity Requirements<br />
• Key System Requirements<br />
• L<strong>in</strong>earity<br />
• Cost<br />
• L<strong>in</strong>earity Metrics<br />
• CIN<br />
• CTB<br />
• Xmod<br />
• Temperature Dependence<br />
• <strong>GaN</strong> Technology Advantages<br />
• Intr<strong>in</strong>sic L<strong>in</strong>earity<br />
• ESD Ruggedness<br />
• Temperature Capability<br />
550MHz 870MHz1GHz
Increase <strong>in</strong> L<strong>in</strong>ear Power<br />
3.5 dB<br />
For CIN = 67 dB<br />
Output level <strong>in</strong>creases 3.5 dB<br />
<strong>RF</strong>MD GaAs GaAs -1 GaAs -2<br />
equivalent to 13.5dB tilt and 56.5dBmV<br />
extrapolated to 1GHz<br />
� <strong>GaN</strong> - improved CIN - enables higher power capability
CIN over Temperature<br />
<strong>RF</strong>MD<br />
<strong>GaN</strong><br />
equivalent to 13.5dB tilt and 56.5dBmV extrapolated to<br />
1GHz<br />
Other<br />
GaAs<br />
Other<br />
GaAs<br />
� <strong>GaN</strong> - Improved Intr<strong>in</strong>sic L<strong>in</strong>earity vs GaAs<br />
� <strong>GaN</strong> - Ma<strong>in</strong>ta<strong>in</strong>s L<strong>in</strong>earity Over Temperature Better than GaAs
CATV Technology Revolution<br />
GaAs to <strong>GaN</strong><br />
Revolution<br />
Si to GaAs Revolution<br />
� <strong>GaN</strong> offers improved L<strong>in</strong>earity AND improved Bandwidth
Why <strong>GaN</strong> for LNA ?<br />
• LNA Design Goals<br />
• OIP3 and NF<br />
• Bandwidth & Input and Output Match<br />
• Robustness & Manufacturability<br />
• Technology Choice<br />
• GaAs E-mode pHEMT<br />
• Design Choices<br />
• Active bias circuitry<br />
• Fully Monolithic Integration<br />
• <strong>GaN</strong> Advantages<br />
• Sub 1dB NF<br />
• OIP3 higher -> higher DR<br />
• Wide Band Performance<br />
• Survivability & Robustness<br />
OIP3 (dBm)<br />
55<br />
50<br />
45<br />
40<br />
35<br />
30<br />
25<br />
<strong>GaN</strong> ?<br />
OIP3 vs. Noise Figure<br />
for Commercial LNAs, Discretes & GBs<br />
pHEMT<br />
FET<br />
Low Noise<br />
HFET<br />
0 2 4 6 8<br />
Noise Figure (dB)<br />
HFET<br />
HBT
Fabricated <strong>GaN</strong> MMIC LNA-<strong>PA</strong><br />
<strong>GaN</strong> LNA <strong>PA</strong><br />
• RC feedback<br />
• Ls noise match<br />
• Wg = 1.2 mm<br />
• Vdd = 5-15V<br />
• Idd = 200-400mA<br />
Chip size - 1.7x1.7 mm 2
Noise Figure - High Bias<br />
Ga<strong>in</strong> (dB)<br />
20<br />
18<br />
16<br />
14<br />
12<br />
10<br />
8<br />
6<br />
4<br />
2<br />
0<br />
Ga<strong>in</strong> & Noise Figure<br />
15V/400mA<br />
Ga<strong>in</strong><br />
NF<br />
T = 25C<br />
Ga<strong>in</strong> @ -30C<br />
Ga<strong>in</strong> @ 25C<br />
NF @ -30C<br />
NF @ 25C<br />
NF ~ 0.25-0.45 dB<br />
T = -30C<br />
1 2 3 4 5 6 7 8<br />
Frequency (GHz)<br />
2<br />
1.8<br />
1.6<br />
1.4<br />
1.2<br />
1<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0<br />
Noise Figure (dB)
Noise Figure - Medium Bias<br />
Ga<strong>in</strong> (dB)<br />
20<br />
18<br />
16<br />
14<br />
12<br />
10<br />
8<br />
6<br />
4<br />
2<br />
0<br />
Ga<strong>in</strong> & NF over Temperature<br />
12V/200mA<br />
Ga<strong>in</strong><br />
NF<br />
T = -30C<br />
T = 25C<br />
1 2 3 4 5 6 7<br />
Frequency (GHz)<br />
Ga<strong>in</strong> @ -30C<br />
Ga<strong>in</strong> @ 25C<br />
NF @ -30C<br />
NF @ 25C<br />
NF ~ 0.1-0.2 dB<br />
1<br />
0.9<br />
0.8<br />
0.7<br />
0.6<br />
0.5<br />
0.4<br />
0.3<br />
0.2<br />
0.1<br />
0<br />
Noise Figure (dB)
Wide-band S-par, High Bias<br />
Ga<strong>in</strong>, Return-Loss (dB)<br />
20<br />
10<br />
0<br />
-10<br />
-20<br />
-30<br />
S 21<br />
Vdd= 15V, Idd= 200mA<br />
Temperature = -30C, 0C, 25C<br />
S 11<br />
S 22<br />
0 1 2 3 4 5 6 7 8<br />
Frequency (GHz)
Output Compression at 2 GHz<br />
Pout (dBm), Ga<strong>in</strong>(dB),<br />
<strong>PA</strong>E(%)<br />
40<br />
35<br />
30<br />
25<br />
20<br />
15<br />
10<br />
5<br />
0<br />
Pout = -30C<br />
Ga<strong>in</strong> T=-30C<br />
<strong>PA</strong>E T=-30C<br />
Pout = 25C<br />
Ga<strong>in</strong> T= 25C<br />
<strong>PA</strong>E T= 25C<br />
Pout @ 2 GHz<br />
15V/400mA<br />
Ga<strong>in</strong><br />
Pout<br />
P1dB = 32.8 dBm<br />
<strong>PA</strong>E@P1= 25%<br />
1.59 W/mm @ P1dB<br />
<strong>PA</strong>E<br />
-20 -15 -10 -5 0 5 10 15 20 25<br />
P<strong>in</strong> (dBm)
Wide Band IP3 Performance<br />
Output IP3 (dBm)<br />
48<br />
46<br />
44<br />
42<br />
40<br />
38<br />
36<br />
34<br />
32<br />
30<br />
<strong>GaN</strong> MMIC Low Noise <strong>PA</strong><br />
15V, 400 mA<br />
12V, 400 mA<br />
5V, 400 mA<br />
5V, 200 mA<br />
1 2 3 4 5 6 7<br />
Frequency (GHz)<br />
IMS – Honolulu June 3-5, 2007,<br />
Kobayashi, et.al.
<strong>GaN</strong> LNA<br />
OIP3 (dBm)<br />
55<br />
50<br />
45<br />
40<br />
35<br />
30<br />
25<br />
OIP3 vs. Noise Figure<br />
for Commercial LNAs, Discretes & GBs<br />
This <strong>GaN</strong> LNA<br />
0 2 4 6 8<br />
Noise Figure (dB)<br />
�LNA Result Validates <strong>GaN</strong> promise
Why <strong>GaN</strong> for <strong>RF</strong> Switches ?<br />
• <strong>GaN</strong>:<br />
• Eng<strong>in</strong>eer C OFF, low R on<br />
• high BKDN<br />
• high ID,max • Low R TH<br />
• High Max T CH<br />
• Si PIN:<br />
• Drive Current Dependence<br />
• GaAs pHEMT:<br />
• Lower BKDN<br />
Si PIN GaAs FET <strong>GaN</strong> FET<br />
Small Signal<br />
Insertion Loss<br />
Isolation<br />
Large Signal<br />
0.1dB Compression V & I Marg<strong>in</strong><br />
Switch<strong>in</strong>g Speed<br />
L<strong>in</strong>earity<br />
IIP3, 2nd & 3rd Harmonic<br />
Robustness<br />
High Power <strong>RF</strong> Switch Technology<br />
Comparision 1<br />
Need High<br />
Drive Current<br />
Degrade at<br />
Higher Power<br />
V & I Marg<strong>in</strong><br />
VSWR ruggedness<br />
Lower Max<br />
Temp<br />
BKDN, Max T<br />
Max <strong>RF</strong> Power<br />
System Factors<br />
Size<br />
Efficiency<br />
Complexity<br />
BKDN, Max T<br />
1 compared at f= 2GHz
S<br />
<strong>RF</strong>MD Switch Model<br />
TL3 R21<br />
R20<br />
TL4<br />
SRC4 PRC2<br />
SRC3<br />
• Simple small signal model<br />
chosen<br />
• Power Performance<br />
Estimated By<br />
• Device breakdown<br />
• Maximum Current<br />
• Good agreement between<br />
model & measurement<br />
G<br />
D<br />
(dB)<br />
(dB)<br />
0<br />
‐1<br />
‐2<br />
‐3<br />
‐4<br />
‐5<br />
‐6<br />
0<br />
‐10<br />
‐20<br />
‐30<br />
‐40<br />
‐50<br />
Insertion Loss<br />
Model<br />
Meas<br />
0 5 10 15 20<br />
Isolation<br />
Frequency (GHz)<br />
0 5 10 15 20<br />
Frequency (GHz)<br />
Model<br />
Meas<br />
40<br />
30<br />
20<br />
10<br />
0<br />
‐10<br />
‐20<br />
120<br />
100<br />
80<br />
60<br />
40<br />
20<br />
degree<br />
degree
<strong>RF</strong>MD SPDT Switch<br />
Model Validation<br />
Bias Ron(Ohm‐mm)<br />
(V) Coff(pF/mm)<br />
Switch FOM<br />
(GHz)<br />
0 2.24 NA<br />
10 0.27 268<br />
20 0.20 359<br />
30 0.17 431<br />
40 0.14 508<br />
• SS FOM comparable to GaAs pHEMT<br />
•C OFF Bias Dependence<br />
• SPDT switch design<br />
- ss model based<br />
- Power based on Technology Metrics<br />
X9<br />
Simplified Topology<br />
Recieve1<br />
R2<br />
X6 X7<br />
R1 R4<br />
Port<br />
Vcontrol1<br />
Antenna1<br />
R<br />
R3<br />
Port<br />
Vcontrol2<br />
X8<br />
Transmit1
(dB)<br />
0<br />
‐0.2<br />
‐0.4<br />
‐0.6<br />
‐0.8<br />
‐1<br />
<strong>RF</strong>MD <strong>GaN</strong> Switch – Insertion Loss<br />
Insertion Loss<br />
Model<br />
Meas<br />
0.5 1 1.5 2 2.5 3<br />
Frequency (GHz)<br />
• Good agreement to Model<br />
• Excellent Performance to 3GHz<br />
(dB)<br />
0<br />
‐5<br />
‐10<br />
‐15<br />
‐20<br />
‐25<br />
‐30<br />
‐35<br />
Input Return Loss<br />
Model<br />
Meas<br />
0.5 1 1.5 2 2.5 3<br />
Frequency (GHz)
<strong>RF</strong>MD <strong>GaN</strong> Switch – Isolation<br />
(dB)<br />
0<br />
‐10<br />
‐20<br />
‐30<br />
‐40<br />
‐50<br />
Isolation (<strong>RF</strong>C-<strong>RF</strong>)<br />
Model<br />
Meas<br />
0.5 1 1.5 2 2.5 3<br />
Frequency (GHz)<br />
• Measured Isolation less than simulated<br />
• Excellent Performance to 3GHz
<strong>RF</strong>MD <strong>GaN</strong> Switch - L<strong>in</strong>earity<br />
• Basic Limitations<br />
• On State: Resistance Increase<br />
• Off State:<br />
• Diode Turn On<br />
• Breakdown<br />
• <strong>GaN</strong> advantages<br />
• Higher Idss, Idmax<br />
• Decreased Ron non l<strong>in</strong>earity<br />
• BKDN > 100V<br />
• Allows for Voltage Marg<strong>in</strong><br />
• Eng<strong>in</strong>eer C OFF for Low Distortion
Power Handl<strong>in</strong>g (W)<br />
Power Performance<br />
250<br />
200<br />
150<br />
100<br />
50<br />
0<br />
Switch Off‐State Power Handl<strong>in</strong>g<br />
0 50 100 150<br />
Vbr‐Vpo (V)<br />
Off State Power<br />
Handl<strong>in</strong>g<br />
50% DeRated<br />
Power Handl<strong>in</strong>g (W)<br />
100<br />
80<br />
60<br />
40<br />
20<br />
0<br />
Switch Power Handl<strong>in</strong>g vs Control<br />
‐100 ‐80 ‐60 ‐40 ‐20 0<br />
Control Voltage (V)<br />
Key <strong>GaN</strong> advantages<br />
- Higher Breakdown Voltage -> High Off State Power Handl<strong>in</strong>g<br />
- Larger Vcontrol possible<br />
- More Voltage Marg<strong>in</strong> for VSWR mismatch & process variation<br />
50% DeRated<br />
Power Handel<strong>in</strong>g
Insertion Loss (dB)<br />
Power Performance<br />
0<br />
‐0.1<br />
‐0.2<br />
‐0.3<br />
‐0.4<br />
‐0.5<br />
‐0.6<br />
‐0.7<br />
‐0.8<br />
‐0.9<br />
‐1<br />
Insertion Loss vs Power<br />
0 10 20 30 40<br />
Input Power (W)<br />
ON State Compression<br />
• Measured Insertion Loss<br />
- bias -40V<br />
• IL change < 0.1dB<br />
-Input Power ~ 38 W<br />
• Measurement System Limited
Summary<br />
�<strong>GaN</strong> CATV L<strong>in</strong>ear Amp<br />
�<strong>GaN</strong> LNA<br />
�<strong>GaN</strong> Switch<br />
� <strong>GaN</strong> VCO<br />
� <strong>GaN</strong> Mixer<br />
� <strong>GaN</strong> Ga<strong>in</strong> Block<br />
� <strong>GaN</strong> Phase shifters<br />
� <strong>GaN</strong> Var. Attenuators<br />
� Successful Demonstration of key <strong>GaN</strong> based components<br />
� Expect Successful Launch of other <strong>GaN</strong> based <strong>RF</strong> components <strong>in</strong><br />
Future<br />
Contributions by Kev<strong>in</strong> Kobayashi (<strong>GaN</strong> LNA) and Ra<strong>in</strong>er Hillermeier<br />
(<strong>GaN</strong> CATV amp) and David Hodge (<strong>GaN</strong> Switch) are acknowledged<br />
<strong>RF</strong>MD acknowledges support of AFRL (Monitor: Dr. John Blev<strong>in</strong>s)<br />
and ONR (Monitor: Dr. Paul Maki) <strong>in</strong> develop<strong>in</strong>g its core <strong>GaN</strong><br />
technology used <strong>in</strong> some of this work
References<br />
• www.microwaves101.com<br />
• International <strong>Micro</strong>wave Symposium, June 3-5, 2007, Kobayashi et.<br />
al.