HCI / NBTI - Celestry Design Technologies, Inc.

RelXpert
5
Step 3: Reliability Simulation
Clear Results!
RelXpert lists all measured
transistors, their age degradation,
maximum Igate and Isub, and many
other device characteristics. You
can use device degradation results
to track which devices are more
prone to HCI and NBTI degradation,
and even quantify their individual
immunity to HCI and NBTI effects.
The resulting list of transistors will
give you an accurate picture of
transistor degradation, immediately
enabling you to detect and identify
the weakest spots.
Gate Level HC and NBTI Reliability Simulation
Fresh waveform vs. aged waveform with fresh
SDF and aged SDF back annotation
Here is how it works: RelPro+ will allow you to take stress data, using BSIMPro+ to get fresh
and AgeMOS models for HCI and NBTI. RelXpert, the circuit level simulator, will allow you to
analyze the circuit and view the results.
Fres
Aged
HCI and NBTI continue to be important reliability issues that
need to be properly addressed. The RelXpert tool makes it easy
for designers to assess and prevent circuit level issues caused
by these effects.
The Ultimate Design at Your Fingertips!
"Before and after degradation" waveforms give you accurate images of the circuit
degradation. This will allow you to reevaluate the status of the design and give you the
opportunity to redesign for faster, more reliable performance.