HCI / NBTI - Celestry Design Technologies, Inc.

Step 2: Reliability Model Options
Option 1: Aged Model
The Aged model is simply an extension
of the traditional SPICE model for HCI.
Here is how it works: After calculating
the "age" of each individual device in
your circuit, Aged model parameters
are automatically generated for the
degraded devices.
RelXpert also has options to limit the number of SPICE models generated to optimize
simulation time with accuracy.
Option 2: AgeMOS Model
The AgeMOS model from Celestry is a new
reliability analysis method for HCI and NBTI
circuit reliability simulation. AgeMOS is
transparent to any MOS SPICE model and
compatible with any simulator platform. The
AgeMOS model is a significant improvement
over other reliability models in the areas of
model generation and accurate, efficient, and
consistent circuit simulation. (Addtional
AgeMOS model information, see section on
"More on Built-in Reliability with the AgeMOS
Model"
Here is how it works: RelPro+ will allow you to take stress data, BSIMPro+ extracts the fresh
and AgeMOS models for HCI and NBTI. RelXpert, the circuit level simulator, will allow you to
analyze the circuit and view the results.
More on Built-in Reliability with the AgeMOS Model
Celestry's AgeMOS model is a methodology for deep submicron CMOS reliability modeling
and circuit simulation analysis. Using this methodology, IC manufacturers can provide a
universal model to all of their IC design customers without SPICE model or simulator platform
compatibility issues. The AgeMOS model for HCI and NBTI enables designers to do accurate
and efficient reliability simulation analysis. This ensures optimal trade-off between yield and
performance before product tape out. HCI and NBTI reliability analysis with the AgeMOS
model prevents unnecessary reliability issues. Designers can create designs and design
shrinks that are more aggressive without overly pessimistic design guard bands and
unnecessary silicon loss.
RelXpert
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