HCI / NBTI - Celestry Design Technologies, Inc.
HCI / NBTI - Celestry Design Technologies, Inc.
HCI / NBTI - Celestry Design Technologies, Inc.
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<strong>Celestry</strong>'s Reliability Solutions<br />
RelPro+ TM and BSIMPro+ TM allow the designer to generate <strong>HCI</strong> and <strong>NBTI</strong> AgeMOS TM SPICE<br />
models for circuit simulation that factors in reliability. RelXpert TM allows designers and<br />
technology developers to reduce performance stealing design margins by accurately simulating<br />
<strong>HCI</strong> and <strong>NBTI</strong> degradation under realistic circuit operating conditions. RelXpert is the rule<br />
generator and design checker you have been waiting for! The result is an optimized design that<br />
delivers:<br />
◆ best possible performance<br />
◆ improved yield<br />
◆ reliable operation<br />
Additionally, for today's largest designs, UltraSim TM , a high-performance hierarchical circuit<br />
simulator, provides full-chip transistor-level reliability simulations UltraSim gives the designer<br />
real-time simulation capability:<br />
◆ Built-in support for <strong>HCI</strong> and <strong>NBTI</strong> simulations<br />
◆ Full-chip view of <strong>HCI</strong> effects on timing<br />
<strong>HCI</strong> / <strong>NBTI</strong> Simulation is the<br />
Path to Higher Performance<br />
Without accurate <strong>HCI</strong> and <strong>NBTI</strong> simulations, you can only approximate the circuit<br />
degradation, and will result either in excessive design margins, or design failure.<br />
Correct <strong>HCI</strong> and <strong>NBTI</strong> simulation allows you to accurately predict a circuit's<br />
degradation over time, enabling you to create a faster design without sacrifice of<br />
reliability. Furthermore, guard banding (or product binning) during product test will also<br />
be more accurate.<br />
◆ The result is a faster chip with better <strong>HCI</strong> and <strong>NBTI</strong> reliability.<br />
Calculate the Degradation of Each Transistor<br />
Simply provide the SPICE netlist, Isub and Igate parameters, and one of the following<br />
reliability model options:<br />
◆ Degraded SPICE model parameters*<br />
◆ AgeMOS model parameters**<br />
RelXpert and UltraSim will use the results of SPICE simulations in its calculation of the<br />
individual device degradation, and optionally overall circuit degradation, for a user-specified<br />
number of years. It's like getting a sneak preview at your circuit's future performance.<br />
*Can be obtained from BSIMProTM or BSIMPro+.<br />
** Can be obtained from BSIMPro+<br />
Contact <strong>Celestry</strong> <strong>Design</strong> <strong>Technologies</strong>, <strong>Inc</strong>. for details.<br />
RelXpert<br />
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