Technical Note 79_17 - EISCAT

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- 4 -FIGURE 2 . TEST STATION AT RAMFJ ORDMOEN S ITE .Duri ng testing the following test equipmen t is used :Lo g i c state analyzer : Hewlett Pa c ka r d l6 0 0AHewlett Packard 160 7A32-channe ld ispl a y4- c h a n ne l analog o s c i Llo s cope : Hewlett Pack a r d ,mainframe 182c, p l ug - i n : 4- c h a nne l (50 r-ilz)Log i c p r obe set: Hewlett Pa c k a r d 50 21 A .
- 5 -3. HARDNARE TESTSThe ha r-dwa t-e tests are divided into t wo q r oupa : preparationand subsystem t ests . Preparation tests include fundamentalfunctions f or system o pe r a t ion and the hardware section f orloading c o r r e Le t o r f r om the CAMAC output moduLe . Subsystemtests include t esting the different function-modules o f thecorre1ator and t estpr ograms have been prepared o n a fi1esystemf or Load i nq t estparameters t o the c c rre La t o r by theCORES IM program .3.1 Preparation tests.3 .1 .1 Syste m cloc k .The interna1 6 MH z c loc k- s i g na l is generated from the crystalclock- osci11ator o n card-module CMl .Clock-signal distribution on ba c k-wi r i ng :SIGNAL NAME CARD- MODULE , TERM THECLOCK CMI , IA32 SOURCECLOCK CM2 , l A32 SINKCf'.14 , IA32 SINKCM5 , IA32 SINKLe i , IA32 SINKCLOCK CM4 , IB31 SOlJRCECLOCK Ct-t3 , IBJ! SINKIn manue I mode o f o pera t ion and clock-function CONTINUOUSon f r o n t - pa ne l . t he clock-signals are always active when thecorrelator is in stup-mode . In Figure 3, the two s ourcesignals for clock opera t ion are shown .
Page 1: 79/17EISCATTECHNICALNOTEEISCAT DIGI
Page 5 and 6: EISCAT Technical Note 79/17Printed
Page 7 and 8: - l -l. I NTRODUCTIONDuring 1978 a
Page 9: . 1 _-~ -VISUr.L rr~srECTI O:\lAN A
Page 13 and 14: - 7 -A r-e l a t c d st qn c I f ro
Page 15 and 16: BUSNAME- 9 -S QURCE-TERMINALS SINK-
Page 17 and 18: - 11 -Test-l slit n l ading t.h c A
Page 19 and 20: - 13 -Tes t on loading to all RAM-m
Page 21 and 22: - 15 -Af te r the puwer is turned o
Page 23 and 24: - j 7 -i s p l ay :3 .2 .2 FIXED- F
Page 25 and 26: - 1 9 -Simulation parame ters :RE G
Page 27 and 28: - 21 -1 A,10 0 8Tes t o n c orrelat
Page 29 and 30: - 23 -3 .:2 .3 TU1ING-DIAGRAM FOR P
Page 31 and 32: - 25 -3 .3 . TESTS ON TH E ADORESS
Page 33 and 34: - 27 -listing:(1F'B- ·l US"' RI JC
Page 35 and 36: - 29 -Stab i l i t y - test us i nq
Page 37 and 38: - 31 -Test-rcsults with subruutine
Page 39 and 40: - 33 -Subrvu t t n. lt s t i no f r
Page 41 and 42: SubroutLm .1s tr t.63 (USlS8), is ~
Page 43 and 44: - J7 -r o c r a m-Iis t i n er I 'j
Page 45 and 46: - 19 -ui s p lY fU1
Page 47 and 48: - 4 l -De l a )' == ~b27:Mix ed l o
Page 49 and 50: - 4 3 -Th e last 16 values o n the
Page 51 and 52: - 45 -TESTPROGRAM 4 (SUBROUT I NE 4
Page 53 and 54: - 47 -For the APB-stack the registe
Page 55 and 56: - 49 -h' RI T ERl'lMb: 20 nsec T y
Page 57 and 58: - 51 -4. S YSTEM 'rESTSA set o f CO
Page 59 and 60: - 5 3-Sl mul a t.i 0 n o f p roq ra
Page 61 and 62:
- 5 5 -4. 2 SYS TEM-TEST 5 2 : BASI
Page 63 and 64:
• ••• A LISTI NG OF A O A T
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- 91 -Pa rameters c an b e s e t o
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- 125 -4.5 EXTENDED TESTSTh e given
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- 127 -MICRO-PROGRAM FOR DIGITAL CO
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- 1 29 -I MICRO-PROGRAM FOR DIGITAL
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- 131 -I MICRO-PROGRAM FOR DIGITAL
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- 133 -I MICRO-PROGRAM FOR DIGITAL
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- 135 -I MICRO- PROGRAM FOR DIGITAL
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EISCAT publicationsF . du Castel ,
Page 180:
S. We s t erlund (editor) :Proceedi
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Technical Note 79_17 - EISCAT

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