Documento PDF - UniCA Eprints - Università degli studi di Cagliari.
Documento PDF - UniCA Eprints - Università degli studi di Cagliari.
Documento PDF - UniCA Eprints - Università degli studi di Cagliari.
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42 polymer/semiconductor interfaceFigure 3.12.: Structure factor in the three crystallographic <strong>di</strong>rectionsfor the 100 HDR interface at low and room temperature.Figure 3.13.: Final configuration of the 100 HDR system at 300 K.molecules on ZnO. In conclusion, present results showsthat the 010/ZnO surface is the most likely to occur inP3HT/ZnO systems.In order to better connect present analysis to experimentaldata we average the structure factor in the interfaceplane (xy) by calculating the S xy quantity. S xy recalls theGrazing Incident X-ray Diffraction (GIXD) measurementwhere X rays are <strong>di</strong>ffracted by scattering parallel to the interface.For the 010 HDR interface, the peaks of the polymerbackbone and that of the inter<strong>di</strong>gitation perio<strong>di</strong>city are stillwell recognizable in S xy curve ( right panel of Figure 3.14).