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Cortex-A8 R2P2.pdf - ARM Information Center

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List of TablesTable 3-150 Functional bits of I-L1 or D-L1 Data 0 Register for a TLB PA array operation ...... 3-166Table 3-151 Functional bits of I-L1 or D-L1 Data 0 Register for an HVAB array operation ....... 3-166Table 3-152 Functional bits of I-L1 or D-L1 Data 0 Register for an L1 tag array operation ....... 3-167Table 3-153 Functional bits of I-L1 or D-L1 Data 0 Register for L1 data array operation .......... 3-167Table 3-154 Functional bits of I-L1 or D-L1 Data 1 Register for L1 data array operation .......... 3-167Table 3-155 Functional bits of I-L1 Data 0 Register for a BTB array operation ......................... 3-168Table 3-156 Functional bits of I-L1 Data 1 Register for a BTB array operation ......................... 3-168Table 3-157 Functional bits of I-L1 Data 0 Register for a GHB array operation ........................ 3-168Table 3-158 Functional bits of L2 Data 0 Register for an L2 parity/ECC operation ................... 3-180Table 3-159 Functional bits of L2 Data 0 Register for a tag RAM operation ............................. 3-180Table 3-160 Functional bits of L2 Data 0 Register for a data RAM operation ........................... 3-181Table 3-161 Functional bits of L2 Data 1 Register for a data RAM operation ........................... 3-181Table 3-162 Functional bits of L2 Data 2 Register for a data RAM operation ........................... 3-181Table 3-163 Address field values .............................................................................................. 3-182Table 4-1 NEON normal memory alignment qualifiers .............................................................. 4-4Table 6-1 CP15 register functions ............................................................................................. 6-8Table 7-1 Memory types affecting L1 and L2 cache flows ........................................................ 7-6Table 8-1 L2 cache transfer policy ............................................................................................ 8-4Table 8-2 Cacheable and noncacheable memory region types ................................................ 8-9Table 9-1 Read address channel AXI ID ................................................................................... 9-4Table 9-2 Write address channel AXI ID ................................................................................... 9-5Table 9-3 AXI master interface attributes .................................................................................. 9-5Table 9-4 A64n128 encoding .................................................................................................... 9-6Table 9-5 AXI address channel for instruction transactions ...................................................... 9-7Table 9-6 AXI address channel for data transactions - excluding load/store multiples ............. 9-9Table 9-7 AXI address channel for data transactions for load/store multiples ........................ 9-16Table 10-1 Reset inputs ............................................................................................................ 10-5Table 10-2 Valid power domains ............................................................................................. 10-17Table 11-1 MBIST register summary ........................................................................................ 11-3Table 11-2 Selecting a test pattern with pttn[5:0] ...................................................................... 11-4Table 11-3 Selecting the L1 arrays to test with L1_array_sel[22:0] .......................................... 11-5Table 11-4 L1_config[14:0] ........................................................................................................ 11-6Table 11-5 Configuring the number of L1 array rows with L1_config[14:0] ............................... 11-7Table 11-6 Selecting L2 RAMs for test with L2_ram_sel[4:0] ................................................... 11-8Table 11-7 L2_config[22:0] ........................................................................................................ 11-9Table 11-8 Selecting L2 data array latency with L2DLat[3:0] .................................................... 11-9Table 11-9 Selecting L2 tag array latency with L2TLat[1:0] .................................................... 11-10Table 11-10 Selecting the L2 RAMs with L2Rows[11:0] ........................................................... 11-10Table 11-11 Configuring the number of L2 RAM rows with L2Rows[11:0] ................................ 11-11Table 11-12 Valid L2 array row numbers .................................................................................. 11-11Table 11-13 Selecting the L2ValSer test type ........................................................................... 11-12Table 11-14 Selecting L2 RAMs for LSB control ....................................................................... 11-12Table 11-15 Selecting counting sequence of L2 RAM column address LSBs .......................... 11-13Table 11-16 GNG[10:0] field ..................................................................................................... 11-14Table 11-17 L2 cache way grouping ......................................................................................... 11-17Table 11-18 Identifying failing L2 bits with failing_bits[32:0] ..................................................... 11-18Table 11-19 Summary of MBIST patterns ................................................................................. 11-25<strong>ARM</strong> DDI 0344E Copyright © 2006-2008 <strong>ARM</strong> Limited. 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