program self-study report - Lamar University Electrical Engineering

ELEN 3321 Electronics I(Required)Catalog Description: Design and analysis of circuits using diodes, transistors, and linear and digitalintegrated circuits.Prerequisites:By course: ELEN 2311 Circuits I with grade of C or better.By topic: KCL, KVL, basic circuit analysis including DC, AC, and transient analysis.Courses that require this as a prerequisite: ELEN 3322Credits: 3Offered: Fall AnnuallyInstructors:Primary: Selahattin SayilSecondary: Wendell BeanTextbook: Electronic Circuit Analysis & Design, Donald A. Neaman, McGraw Hill Publishers, SecondEdition, 2001, ISBN 0-07-245194-7.References: Schematic Capture with Electronics Workbench Multisim, Marc E. Herniter, Prentice Hall,2004, ISBN 0-13-049614-6.Microelectronic Circuit, Adel S. Sedra and Kenneth C. Smith, Oxford University Press, Fifth Edition,2004, ISBN 0-19-514251-9.Objectives (with corresponding ABET Criteria/outcomes):Ensure students:• Are familiar with current and future applications of electronics with an emphasis onmicroelectronics. (Criterion 3(h),(i))• Understand basic physics and operation of diodes, BJTs, MOSFETs and JFETs. (Criterion 3(a))• Understand the concepts of DC and small-signal analysis. (Criterion 3(a))• Understand the analysis and design of basic amplifier configurations. (Criterion 3(a),(c))• Are able to use the circuit simulator SPICE for analysis of electronic circuits. (Criterion3(a),(b),(k))• Understand the ideal op-amp and various op-amp applications. (Criterion 3(a),(c))Topics (approximate number of lecture hours):• Introduction to semiconductors and diode physics. (3 hours)• Diodes: physics, DC and small-signal model, applications. (5 hours)• BJTs: physics, biasing, small-signal model. (6 hours)• BJT single-stage amplifiers: analysis and design. (6 hours)• MOSFETs, JFETs: physics, DC analysis, small-signal model. (8 hours)• MOSFET single-stage amplifiers: analysis and design. (6 hours)• The Ideal Operational amplifier. (4 hours)• Digital electronics (3 hours)EE Program Self-Study Report-2006 59