Metasys® for Validated Environments (MVE ... - Johnson Controls
Metasys® for Validated Environments (MVE ... - Johnson Controls
Metasys® for Validated Environments (MVE ... - Johnson Controls
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Figure 9 is an example of event-driven trending. Apoint is sampled once every half hour while it is inthe normal state. When the point enters anon-normal state, the sample is recorded (to thesecond) and a more rapid sampling rate begins. Thisis called fast scan and allows <strong>for</strong> high resolutioncollection during periods of interest while keepingthe total data size manageable. These subsequentfast scan samples are also recorded to the second.Figure 9: M-Trend Graphically Displaying Data from the FX VE Secure DatabaseIn addition to Graphical displays, tabular views of thesame reports are available through M-Trend, whichcan view up to 6 attributes in the graphical view and32 attributes in the tabular view.8 Metasys <strong>for</strong> <strong>Validated</strong> <strong>Environments</strong> (<strong>MVE</strong>) Product Bulletin