Power Grid Analysis in VLSI Designs - SERC
Power Grid Analysis in VLSI Designs - SERC Power Grid Analysis in VLSI Designs - SERC
and confidence levels. Experimental results show that this method typically produces maximumpower estimates within 5% of the actual value and with a 90% confidence level by onlysimulating less than 2500 input vectors. Another technique described in [31] computes peakpowers of design while maintaining the current waveform accuracy. It models logic gates bybreaking the gates into various nodes. It then models various currents in terms of these nodeswhich are evaluated quickly during logic simulation to measure power. However, this is basedon logical simulation so extremely difficult to scale.Chen and Ling [36] proposed an approach to estimate the power supply noise based on anintegrated package-level and chip-level power bus model. Chang, Gupta, and Breuer [37]proposed an analytical model to estimate the ground bounce caused by the switching in theinternal circuitry for sub-micron VLSI circuits. Jiang, Cheng, and Deng [38] proposed aGenetic Algorithm-based approach that considered the dependence of switching noise on inputpatterns under a distributed RC model of the PG network. Zhao, Roy, and Kho proposed anevent-driven simulation based approach to calculate the worst case power supply noise under adistributed RLC model [39].There are still more challenges in this area where very little work has been done.First, to analyze Power Ground (PG) noise, worst case vectors are required using which theparasitic network of chip is simulated. Not only the whole approach needs lot of data andmemory but today’s SPICE simulators are not able to handle such complexity in terms ofruntime and capacity. Many times (read as all the time) determining the worst case vectors isnot straightforward.20
Second, today’s design has huge PG network. It is known that the voltages seen at variousnodes in this network will vary. A resultant voltage across power-ground bus for a macroimpacts the delay as shown in Figure 1.5. Note that delay is non-linear at low voltages. Further,the change in delay to change is voltage is more non linear compare to delay – this is of veryimportant to designers as it can cause delay issues or design failures. Due to high dependencyof delay to voltage, dynamic V-drop in PG network is fast becoming a critical concern for thechip designers [41][59-60].normalized delay and normalizeddelay2voltageRise DelayFall Delayrisedelay2voltage_changefalldelay2voltage_change1.2 1.15 1.1 1.05 1 0.95 0.9 0.85 0.8VoltageFigure 1.5 Normalized delay and normalized delay to voltage ratioThird aspect to PG noise problem is that it is an iterative phenomenon [41]. When voltageacross cell decreases due to sudden rise in switching activity, it also changes the delays andhence the simultaneous switching. This in turn can reduce/increase the dynamic noise issues.Reduce in a sense that the simultaneous switching may reduce all together or increase becauseit can move one hot spot of the design to some other hot spot. Handling of this is not a trivialtask from analysis perspective.21
- Page 1: Power Grid Analysis in VLSI Designs
- Page 6 and 7: 4.4.1 Timing Information Generation
- Page 8 and 9: Figure 3 1GHz, Peak: 838.2 uW......
- Page 11 and 12: AbstractPower has become an importa
- Page 13 and 14: 1 Introduction1.1 MotivationVLSI in
- Page 15 and 16: Further, Figure 1.3 shows that ther
- Page 17 and 18: proposed in a few papers. In this t
- Page 19: • Degradation in switching speeds
- Page 23 and 24: Figure 1.6 Total power break up int
- Page 25 and 26: CMOSDieAcronym for Complimentary Me
- Page 27 and 28: 2 Toggle Activity Estimation2.1 Ove
- Page 29 and 30: For large T, D(x) becomes time inva
- Page 31 and 32: done hierarchically or there is reu
- Page 33 and 34: A Sample SDC file with above comman
- Page 35 and 36: Some of the care needs to be taken
- Page 37 and 38: Figure 2.5 Timing Arcs in extracted
- Page 39 and 40: 3 Power Estimation3.1 OverviewAccur
- Page 41 and 42: In this work, above power component
- Page 43 and 44: on the required accuracy, different
- Page 45 and 46: Based on power sensitivity and tool
- Page 47 and 48: with SPICE. Power Mill is dynamic s
- Page 49 and 50: DREPGENDREPFILE+ DATAGENFUNCTDLRAND
- Page 51 and 52: 3.4.3 Interconnect setupAll the cir
- Page 53 and 54: DesignNameIN OUT Flops Boolean(gate
- Page 55 and 56: Design TFC + Power Compiler Runtime
- Page 57 and 58: Design Name CLK Power Total Power %
- Page 59 and 60: DesignNamePowerCompilerProposedAppr
- Page 61 and 62: We can approximate the average powe
- Page 63 and 64: 4 Power Supply Noise Analysis4.1 Ov
- Page 65 and 66: to be absolutely in complete alignm
- Page 67 and 68: In this work, we have maintained te
- Page 69 and 70: Figure 4.6 Load vs. peak power for
and confidence levels. Experimental results show that this method typically produces maximumpower estimates with<strong>in</strong> 5% of the actual value and with a 90% confidence level by onlysimulat<strong>in</strong>g less than 2500 <strong>in</strong>put vectors. Another technique described <strong>in</strong> [31] computes peakpowers of design while ma<strong>in</strong>ta<strong>in</strong><strong>in</strong>g the current waveform accuracy. It models logic gates bybreak<strong>in</strong>g the gates <strong>in</strong>to various nodes. It then models various currents <strong>in</strong> terms of these nodeswhich are evaluated quickly dur<strong>in</strong>g logic simulation to measure power. However, this is basedon logical simulation so extremely difficult to scale.Chen and L<strong>in</strong>g [36] proposed an approach to estimate the power supply noise based on an<strong>in</strong>tegrated package-level and chip-level power bus model. Chang, Gupta, and Breuer [37]proposed an analytical model to estimate the ground bounce caused by the switch<strong>in</strong>g <strong>in</strong> the<strong>in</strong>ternal circuitry for sub-micron <strong>VLSI</strong> circuits. Jiang, Cheng, and Deng [38] proposed aGenetic Algorithm-based approach that considered the dependence of switch<strong>in</strong>g noise on <strong>in</strong>putpatterns under a distributed RC model of the PG network. Zhao, Roy, and Kho proposed anevent-driven simulation based approach to calculate the worst case power supply noise under adistributed RLC model [39].There are still more challenges <strong>in</strong> this area where very little work has been done.First, to analyze <strong>Power</strong> Ground (PG) noise, worst case vectors are required us<strong>in</strong>g which theparasitic network of chip is simulated. Not only the whole approach needs lot of data andmemory but today’s SPICE simulators are not able to handle such complexity <strong>in</strong> terms ofruntime and capacity. Many times (read as all the time) determ<strong>in</strong><strong>in</strong>g the worst case vectors isnot straightforward.20