SP88/SP98 Spectrophotometer Operating Manual ... - X-Rite
SP88/SP98 Spectrophotometer Operating Manual ... - X-Rite SP88/SP98 Spectrophotometer Operating Manual ... - X-Rite
SECTION 2INSTRUMENT POSITIONING &MEASUREMENT TECHNIQUESGeneralThe variety of items that the SP88/SP98 can measure is almost endless.However, in order to obtain accurate and repeatable measurements, thebottom of the shoe must be:Parallel with the surface to be measured if the surface is flat.Tangent to the surface to be measured if the surface is curved.The reason for this is that any movement during measurement can causethe reading to vary. To obtain the most accurate and repeatablemeasurements, there are a few guidelines you can follow.If the item to be measured is smaller than the shoe, you may want tomake a platform (the same height of the item) for the instrument to sit on.If the item to measure is curved, you may want to make a jig for the itemto rest in.Specular Excluded ModeMeasurements taken in the specular component excluded mode areinherently geometry sensitive. The specular excluded mode will detectslight differences in surface texture. If specular excluded is used, theaveraging mode should also be used (e.g., average 3-5 readings permeasurement).Dark ColorsFor best accuracy and repeatability when measuring dark or high chromacolors, the instrument should be calibrated more frequently. Also, the ‘‘autoaveraging’’ mode should be used when measuring dark and high chromacolors. When set to auto averaging, the instrument will automaticallyrequire three measurements if an X, Y, or Z value of 2.5% or less isdetected. Refer to Section 7.2 for averaging setup.2-1
Instrument Positioning & Measurement Techniques . . . continuedNon-Uniform SamplesNon-uniform samples such as plaids and patterned materials should alsobe measured using the averaging mode (3-5 readings), for both thespecular included and excluded modes.Positioning ExampleShown below is one method that can be used to position the instrumentwhen measuring a paint chip.Measuring a Paint ChipCORRECTPaint ChipPlatformINCORRECT2-2
- Page 2 and 3: WARNING: Shielded interface cables
- Page 4 and 5: Dear Customer:Congratulations! We a
- Page 8 and 9: Table of Contents . . . continued7.
- Page 10 and 11: User InterfaceThis information will
- Page 12 and 13: What To Do First . . . continuedApp
- Page 14 and 15: Packaging Illustration1-2
- Page 16 and 17: 1.3 Installing the Battery PackThe
- Page 18 and 19: 1.5 Charging the Battery Pack‘‘
- Page 20 and 21: 1.6 Menu Page SelectionThe main men
- Page 24: Instrument Positioning & Measuremen
- Page 27 and 28: Positioning the Instrument on the W
- Page 29 and 30: 3.3 Calibration ProcedureTo perform
- Page 31 and 32: Calibration Procedure . . . continu
- Page 33 and 34: 4.2 Illuminant/Observer SelectionTh
- Page 35 and 36: Reference Entry . . . continued5) M
- Page 37 and 38: Sample Measurement . . . continued4
- Page 39 and 40: Using Measurement Averaging . . . c
- Page 41 and 42: Adjusting Tolerance Values . . . co
- Page 43 and 44: Adjusting Tolerance Values . . . co
- Page 45 and 46: 5.2 Pass/Fail MeasurementThe Pass/F
- Page 47 and 48: SECTION 6STORAGE OPERATIONSubjects
- Page 49 and 50: Storing Measurements . . . continue
- Page 51 and 52: Deleting Stored Measurements . . .
- Page 53 and 54: 6.3 Printing Stored MeasurementsThe
- Page 55 and 56: Printing Stored Measurements . . .
- Page 57 and 58: Tagging and Storing Operation . . .
- Page 59 and 60: Tagging and Storing Operation . . .
- Page 61 and 62: 6.5 QA-Master ‘‘Run Job’’ O
- Page 63 and 64: Setting RS-232 Communication Option
- Page 65 and 66: 7.2 Setting Operation OptionsThere
- Page 67 and 68: Setting Operation Options . . . con
- Page 69 and 70: Setting Operation Options . . . con
- Page 71 and 72: Setting Printout Options . . . cont
Instrument Positioning & Measurement Techniques . . . continuedNon-Uniform SamplesNon-uniform samples such as plaids and patterned materials should alsobe measured using the averaging mode (3-5 readings), for both thespecular included and excluded modes.Positioning ExampleShown below is one method that can be used to position the instrumentwhen measuring a paint chip.Measuring a Paint ChipCORRECTPaint ChipPlatformINCORRECT2-2
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