Materials Measurement Phil Bartley Shelley Begley

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Non-Contacting method for High or LowTemperature Tests.Free Space with FurnaceThe free-space technique is ideal for measuring materials that are heated orcooled to temperatures that would cause problems for the network analyzer,cables and connectors. The sample can be placed inside a Temperaturecontrol unit with microwave windows allowing the energy radiating from theantennae to transmit through and reflect off the sample.52
Transmission Free-SpaceReflection(S )11lTransmission(S )21Material assumptions: Flat parallel faced samples Sample in non-reactive region Beam spot is contained in sample Known thickness > 20/360 λThe free space technique is best for thin flat parallel faced materials, or othermaterials that can be formed into this shape. Just like the transmission linetechnique, the sample size scales with frequency, but with free space thesamples are larger. They must be large enough to contain the 3dB beamspot. At low frequencies, it can be a problem to get samples large enough.But, at high frequencies this is a benefit, as the sample does not have to beso tiny. Focused beam antennas can help with sample size. In addition,they condition the beam to improve performance, but reasonableperformance can be obtained without them. Just like transmission linemeasurements, the sample must be thick enough to contain enough of thewavelength of interest to be measurable, 20 degrees at least, but ideally 180degrees, or ½ λ. At mm-wave frequencies, samples thicker than 1 λ cancreate multiple root mathematical errors. The sample must be far enoughaway from the antennae to be out of the reactive region, ideally at least2d 2 /λ, where d is the largest dimension of the antenna.53
Page 3: Extremely Diverse Applications“Ma
Page 6 and 7: Maxwell’s Equations∇× E=−∂
Page 8 and 9: Permittivity and Permeability Defin
Page 10 and 11: Definition of Dielectric Constant o
Page 12 and 13: Dielectric MechanismsIonic Polariza
Page 14 and 15: Consider Dipole RotationRandom Orie
Page 16 and 17: Electric Field Changed DirectionEDi
Page 18 and 19: Small and Large MoleculesMany mater
Page 20 and 21: ε rε' '',r6040Debye Relaxation fo
Page 22 and 23: Cole-Cole Plot Explanation"ε r3020
Page 24 and 25: Other Empirical ModelsταβOnly fe
Page 26 and 27: Dielectric Properties (at 3 GHz)100
Page 28 and 29: Which Technique is Best? Frequency
Page 30 and 31: Impedance Analyzers and FixturesHer
Page 32 and 33: Measurement Techniques that use a V
Page 34 and 35: Transmission LineMaterial assumptio
Page 36 and 37: Transmission Algorithms in 85071EOp
Page 38 and 39: Problems with N-R Model• This set
Page 40 and 41: NIST Model• Technique uses all fo
Page 42 and 43: Transmission (Fast) Model• This t
Page 44 and 45: Weakness of both the NIST and Trans
Page 46 and 47: Transmission Line Measurement Error
Page 48 and 49: Typical Errors Caused By Air GapsPe
Page 50 and 51: Transmission Line Technique Summary
Page 54 and 55: 40 - 60GHz Free Space System54
Page 56 and 57: Free Space W-band SystemHere is a p
Page 58 and 59: Free Space Quasi-Optical SystemHere
Page 60 and 61: Before a Measurement Can be Made…
Page 62 and 63: TRL CalibrationThruReflectMove the
Page 64 and 65: Gated Reflect Line (GRL) Calibratio
Page 66 and 67: MUT and GRL Error AdaptersAfter 2-P
Page 68 and 69: MUT and GRL Error AdaptersAfter O11
Page 70 and 71: GRL Thru Standard (Air)A 11 =A 22 =
Page 72 and 73: QO System SchematicAdditional infor
Page 74 and 75: Measurement Results0.03Imaginary pa
Page 76 and 77: Measurement with NRL Arch andoption
Page 78: Free Space LabWith u-band calibrati

Materials Measurement Phil Bartley Shelley Begley

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