Materials Measurement Phil Bartley Shelley Begley

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Transmission Algorithms in 85071EOptimumAlgorithm Measured OutputLengthNicolson-Ross S 11 ,S 21 ,S 12 ,S 22 λ g /4 ε r and µ r(PN 8510-3) (or S 11 ,S 21 )Precision (NIST) S 11 ,S 21 ,S 12 ,S 22 nλ g /2 ε rFast S 21 ,S 12 nλ g /2 ε r(S 21 )(85071E also has three reflection algorithms)These are the algorithms used in 85070E. They will convert the measured S-parameters to permittivity or permeability. The first three require a two-portfixture. The last two require a one-port fixture which may be better for liquidsor powders where a shorted waveguide section can be turned on end andfilled. One-port fixtures may also be better for measurements at hightemperatures where one end of the waveguide can be heated while coolingmechanisms keep the network analyzer cool.36
Nicolson-Ross ModelTechnique is based on solving the two equationsbelow for the two unknownsM 21 +M 11 =S 21 (φ,ε,µ) + S 11 (φ,ε,µ)M 21 -M 11 =S 21 (φ,ε,µ) - S 11 (φ,ε,µ)A. M. Nicolson and G. F. Ross, "<strong>Measurement</strong> of the intrinsic properties of materials bytime domain techniques, " IEEE Trans. Instrum. Meas., IM-19(4), pp. 377-382, 1970.The Nicolson-Ross model solves for both permittivity and permeability by makingtransmission and reflection coefficient measurements on a single sample of thematerial. The M xx in the equations above refers to the measured values of the s-parameters while S xx refers to the values calculated from the previously mentionedequations. Nicolson and Ross showed by taking the sum and difference oftransmission and reflection coefficients the values for u and e can be determined.37
Page 3: Extremely Diverse Applications“Ma
Page 6 and 7: Maxwell’s Equations∇× E=−∂
Page 8 and 9: Permittivity and Permeability Defin
Page 10 and 11: Definition of Dielectric Constant o
Page 12 and 13: Dielectric MechanismsIonic Polariza
Page 14 and 15: Consider Dipole RotationRandom Orie
Page 16 and 17: Electric Field Changed DirectionEDi
Page 18 and 19: Small and Large MoleculesMany mater
Page 20 and 21: ε rε' '',r6040Debye Relaxation fo
Page 22 and 23: Cole-Cole Plot Explanation"ε r3020
Page 24 and 25: Other Empirical ModelsταβOnly fe
Page 26 and 27: Dielectric Properties (at 3 GHz)100
Page 28 and 29: Which Technique is Best? Frequency
Page 30 and 31: Impedance Analyzers and FixturesHer
Page 32 and 33: Measurement Techniques that use a V
Page 34 and 35: Transmission LineMaterial assumptio
Page 38 and 39: Problems with N-R Model• This set
Page 40 and 41: NIST Model• Technique uses all fo
Page 42 and 43: Transmission (Fast) Model• This t
Page 44 and 45: Weakness of both the NIST and Trans
Page 46 and 47: Transmission Line Measurement Error
Page 48 and 49: Typical Errors Caused By Air GapsPe
Page 50 and 51: Transmission Line Technique Summary
Page 52 and 53: Non-Contacting method for High or L
Page 54 and 55: 40 - 60GHz Free Space System54
Page 56 and 57: Free Space W-band SystemHere is a p
Page 58 and 59: Free Space Quasi-Optical SystemHere
Page 60 and 61: Before a Measurement Can be Made…
Page 62 and 63: TRL CalibrationThruReflectMove the
Page 64 and 65: Gated Reflect Line (GRL) Calibratio
Page 66 and 67: MUT and GRL Error AdaptersAfter 2-P
Page 68 and 69: MUT and GRL Error AdaptersAfter O11
Page 70 and 71: GRL Thru Standard (Air)A 11 =A 22 =
Page 72 and 73: QO System SchematicAdditional infor
Page 74 and 75: Measurement Results0.03Imaginary pa
Page 76 and 77: Measurement with NRL Arch andoption
Page 78: Free Space LabWith u-band calibrati

Materials Measurement Phil Bartley Shelley Begley

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