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2007 ieee international symposium on electromagnetic compatibility

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EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 9EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> TECHNICAL PAPER ABSTRACTS10-12 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>The informati<strong>on</strong> is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>, visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updates.Note: N/A after an author name indicates “no affiliati<strong>on</strong>;” informati<strong>on</strong> was not provided by author.SPECIAL SESSION: HISTORYEstablishing EMC Educati<strong>on</strong>: The Ten-Year C<strong>on</strong>tributi<strong>on</strong> ofthe University Grant ProgramThomas Jerse, The Citadel; and Mark Steffka, University of Michigan-DearbornThe University Grant Program was first funded by the IEEE EMCSociety in 1997. Over the past 10 years it has provided seed m<strong>on</strong>eyfor the establishment of eight courses in the basic principles of <strong>electromagnetic</strong><strong>compatibility</strong> at academic instituti<strong>on</strong>s <strong>on</strong> two c<strong>on</strong>tinents.All past recipients were surveyed, and the collected data wasused to assess the impact and excepti<strong>on</strong>al return <strong>on</strong> investment of theprogram. Brief descripti<strong>on</strong>s of some of the experiments developed arealso included.A Historical Perspective of System-Level TDFD EME Simulati<strong>on</strong>Rodney Perala, Electro Magnetic Applicati<strong>on</strong>s, Inc.Computati<strong>on</strong>al <strong>electromagnetic</strong>s (CEM) and particularly the timedomainfinite-difference method (TDFD), began to be used for system-levelsimulati<strong>on</strong>s of <strong>electromagnetic</strong> effects (EME) in the 1970s.From that time until now, there have been dramatic advances resultingin large capability growth with simultaneous reducti<strong>on</strong>s in computingcost. The net result is that the TDFD method can form thecore of a powerful simulati<strong>on</strong> capability, useful for virtual EME system-levelverificati<strong>on</strong> and dem<strong>on</strong>strati<strong>on</strong>.EMC Absorbers Through the Years with Respect to the NewSite Validati<strong>on</strong> Procedure in the Frequency Range from 1 to18 GHz — A Practical ApproachFriedrich-Wilhelm Trautnitz, Albatross Projects GmbHThis paper describes the development of EMC absorbers and EMCchambers until today. The first anechoic chamber in Europe was builtin the mid sixties. Due to the fact that absorber chambers were notnecessary in the early sixties, EMC measurements were easily possible<strong>on</strong> open area test sites (OATS). This project was for many years the<strong>on</strong>ly EMC chamber in Europe. The market for EMC chambersincreased with increasing radio services because of ambient noise. Inthe mid eighties the market for EMC chambers again awoke. Thetechnical requirement for EMC chambers was to fulfill the VDE 0871.At the end of the eighties VDE founded a special committee discussingthe requirements of alternate test sites. The volume methodfor validating test sites first was integrated in ANSI C 63.4 – 1988.In Cenelec – the European committee – a working group was alsofounded for establishing an EN standard for alternate test sites. Theresult was the EN 50147-1 (shielding) and -2 (NSA site validati<strong>on</strong>).The volume method was integrated in CISPR 16 in the mid nineties.Meanwhile the volume method for NSA measurement of alternate testsites is well established. The technical development of EMC absorberswill be described discussing pyramidal foam absorbers, hollow pyramidalfoam absorbers, and hybrid absorbers – a combinati<strong>on</strong> of severalabsorbers (ferrite and foam absorber). New inventi<strong>on</strong>s like pyramidalfoil absorbers will also be discussed. The new site validati<strong>on</strong> (siteVSWR) procedure from 1 to 18 GHz is shown.Fifty Years of EMC Research at Georgia TechHugh Denny, Georgia Tech Research InstituteResearch studies in <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC) have beenunderway at GTRI since 1953. Investigati<strong>on</strong>s have ranged fromstudies of the n<strong>on</strong>linear properties of solid state juncti<strong>on</strong>s to thedevelopment of c<strong>on</strong>trol methods for widely dispersed systems.Highlights of accomplishments and c<strong>on</strong>tributi<strong>on</strong>s during this halfcenturyplus are presented.EMC of Integrated Circuits: A Historical ReviewEtienne Sicard, Institut Nati<strong>on</strong>al des Sciences Appliquées (INSA) of ToulouseThis paper provides a n<strong>on</strong> exhaustive review of the research work c<strong>on</strong>ductedin the field of integrated circuit <strong>electromagnetic</strong> <strong>compatibility</strong>over the past 40+ years.Military Aircraft Electromagnetic Compatibility: Release toService Testing in the United Kingdom, Past, Present and FutureTimothy J. Duggan, Systems Evaluati<strong>on</strong> Services, QinetiQRelease to Service (RTS) Electromagnetic Compatibility (EMC) testingof military aircraft in the United Kingdom (UK), can be tracedback as far as 1932 c<strong>on</strong>cerning the effect of engine interference <strong>on</strong> anaircraft’s communicati<strong>on</strong> systems. However, it was interference seento aircraft weap<strong>on</strong>s and electrical systems during operati<strong>on</strong>s from aircraftcarriers in the 1960s that resulted in the significant expansi<strong>on</strong>of the EMC assessment and test capabilities by QinetiQ (and its predecessororganizati<strong>on</strong>s) at Boscombe Down, Farnborough, and by aircraftprime c<strong>on</strong>tractors. This paper describes the evoluti<strong>on</strong> of EMCtest methods and facilities used to assess UK military aircraft fromthe 1960s to the present and into the future, taking into account theadvances in avi<strong>on</strong>ics technology and the associated challenges inassessing their suitability for RTS.EMC MEASUREMENTS IDevelopment and Applicati<strong>on</strong> of a High-Resoluti<strong>on</strong> Thin-Film ProbeKuifeng Hu, University of Missouri-RollaA high-resoluti<strong>on</strong> thin film probe was developed and compared to ac<strong>on</strong>venti<strong>on</strong>al single loop probe, and showed a 250 µm spatialimprovement measured at a height of 250 µm over 118 µm differentialtraces. A 180 degree hybrid juncti<strong>on</strong> was used in the measurementcircuit to separate the electric and magnetic coupling from theprobe. A network analyzer with narrow band filtering was used todetect the weak signal from the probe and further determine thephase. The developed thin-film probe was successfully used to detectthe package pin current with phase informati<strong>on</strong> at clock frequencyharm<strong>on</strong>ics.The Design of an Electro-optical Modulator Used in EMCMeasurementsYinan Geng; R<strong>on</strong>g Zeng; Jinliang He; Shuiming Chen; and Bo Zhang, —Department of Electrical Engineering, Tsinghua University©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org

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