8EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMDO WE HAVE A TECHNICAL PROGRAMFOR YOU AT EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>!D<strong>on</strong> Heirman, D<strong>on</strong> HEIRMAN C<strong>on</strong>sultantsTodd Hubing, Clems<strong>on</strong> UniversityTechnical Program Co-chairsOver 300 (yes 300!) papers weresubmitted for this year’s <str<strong>on</strong>g>symposium</str<strong>on</strong>g>in Hawai‘i. That’s more thandouble the number submitted for last year’s<str<strong>on</strong>g>symposium</str<strong>on</strong>g> and by far the largest numbersubmitted for any EMC <str<strong>on</strong>g>symposium</str<strong>on</strong>g> that wecould recall. As indicated in the advanceprogram <strong>on</strong> the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> web site, justunder 250 papers were accepted - anotherrecord. But records d<strong>on</strong>’t mean as much asthe quality of the accepted papers, whichthis year was noticeably higher than previousyears. Your Society technical committeeswent out of their way to ensure thatpapers were of the highest caliber. Onetechnique that was employed to make thishappen was to institute a system thatallowed the authors to get the reviewers’comments for improvements, make the necessarychanges, and resubmit for a sec<strong>on</strong>dround of reviews. Those papers that wereresubmitted for the sec<strong>on</strong>d round were usuallysignificantly improved and met thehigh standard of quality required to beincluded in the technical program.This year, many of the papers are associatedwith “technical area tracks” to allow anattendee the opportunity to follow a specifictechnical area throughout the week. Thetechnical tracks that have been identifiedfor this program are:• Automotive EMC• EM Modeling Techniques• New EMC Measurement Technologies• Printed Circuit Board Design• PCB and System Modeling• Signal Integrity• System EMC Test• System EMC Design.In additi<strong>on</strong> to the wealth of technical papersubmissi<strong>on</strong>s, we had over two dozen proposalsfor workshops and tutorials, again arecord number. Twenty workshops/tutorialswill be offered <strong>on</strong> Sunday and M<strong>on</strong>day of the<str<strong>on</strong>g>symposium</str<strong>on</strong>g> week, covering such topics as:• EMC and EM Modeling Fundamentals• Test Site Validati<strong>on</strong> Above 1 GHz• Advanced EMC Materials and Designs• Power and Signal Integrity• EMC and Wireless Devices• Managing Regulatory Access to the Asia-Pacific MarketsA very special workshop given by the IECAdvisory Committee <strong>on</strong> EMC (ACEC)focusing <strong>on</strong> “a c<strong>on</strong>versati<strong>on</strong> with ACEC” <strong>on</strong>their work and the work of IEC TC77(immunity focus) and IEC/CISPR (emissi<strong>on</strong>focus).The ACEC workshop will be held <strong>on</strong>M<strong>on</strong>day evening where there will not be anyparallel workshop/tutorial activity so thatmany who are not familiar with the <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g>EMC standardizati<strong>on</strong> program cancome and hear what that is all about.Since this is also the 50th anniversary ofthe Society, we have set aside a special sessi<strong>on</strong>that will focus <strong>on</strong> historical papers,including the following topics:• System Level Electromagnetic Envir<strong>on</strong>mentSimulati<strong>on</strong>s• Military Aircraft EMC in the UnitedKingdom• EMC Absorbers Through the Years andTheir Impact <strong>on</strong> New Site Validati<strong>on</strong>Techniques• The History of Integrated Circuit EMC• 50 Years of EMC at Georgia Institute ofTechnologyAnother exciting area is our invited speakerspecial sessi<strong>on</strong>s. This year is especiallyimportant since special sessi<strong>on</strong> papers werepeer reviewed in the same manner as theopen call for papers. So key technical expertswill present the cream of the crop of specialsessi<strong>on</strong> papers. Here is a partial list ofspecial sessi<strong>on</strong> topics:• Power Integrity/Signal Integrity for NextGenerati<strong>on</strong> Systems• Industry Standard Cables and ShieldingPerformance• Emerging EMC Technologies in Japan• Automotive EMC• EMC/EM Effects in Waveform DiversityApplicati<strong>on</strong>s• Advanced EMC MeasurementsA new additi<strong>on</strong> to the technical programthis year is the Global EMC University. Theobjective of this special track is to provide acomprehensive discussi<strong>on</strong> of the basic c<strong>on</strong>ceptsand skills that are used in the EMCprofessi<strong>on</strong>. Clayt<strong>on</strong> Paul and FlavioCanavero are in charge of this event, whichis open to a limited number of attendeeswho sign up ahead of the <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. Moreinformati<strong>on</strong> <strong>on</strong> the Global EMC Universityand the rest of the technical program can befound in the following pages and <strong>on</strong> the c<strong>on</strong>ferencewebsite at http://www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org.In summary this is a “can’t miss” <str<strong>on</strong>g>symposium</str<strong>on</strong>g>,not <strong>on</strong>ly for the outstanding technicalprogram, but to also celebrate a halfcenturyof our EMC Society. We are lookingforward to seeing you in Hawai’i!Carl Baum, recipient of the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Electromagnetics Award, will present a speciallecture <strong>on</strong> Wednesday, July 11, from 12:30 - 1:30 pm at the Hawai'i C<strong>on</strong>venti<strong>on</strong> Centertitled: Low- and High-Frequency Soluti<strong>on</strong>s of the Telegrapher Equati<strong>on</strong>s for N<strong>on</strong>uniformMultic<strong>on</strong>ductor Transmissi<strong>on</strong> Lines. All <str<strong>on</strong>g>symposium</str<strong>on</strong>g> registrants are invited to attend.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org
EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 9EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> TECHNICAL PAPER ABSTRACTS10-12 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>The informati<strong>on</strong> is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>, visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updates.Note: N/A after an author name indicates “no affiliati<strong>on</strong>;” informati<strong>on</strong> was not provided by author.SPECIAL SESSION: HISTORYEstablishing EMC Educati<strong>on</strong>: The Ten-Year C<strong>on</strong>tributi<strong>on</strong> ofthe University Grant ProgramThomas Jerse, The Citadel; and Mark Steffka, University of Michigan-DearbornThe University Grant Program was first funded by the IEEE EMCSociety in 1997. Over the past 10 years it has provided seed m<strong>on</strong>eyfor the establishment of eight courses in the basic principles of <strong>electromagnetic</strong><strong>compatibility</strong> at academic instituti<strong>on</strong>s <strong>on</strong> two c<strong>on</strong>tinents.All past recipients were surveyed, and the collected data wasused to assess the impact and excepti<strong>on</strong>al return <strong>on</strong> investment of theprogram. Brief descripti<strong>on</strong>s of some of the experiments developed arealso included.A Historical Perspective of System-Level TDFD EME Simulati<strong>on</strong>Rodney Perala, Electro Magnetic Applicati<strong>on</strong>s, Inc.Computati<strong>on</strong>al <strong>electromagnetic</strong>s (CEM) and particularly the timedomainfinite-difference method (TDFD), began to be used for system-levelsimulati<strong>on</strong>s of <strong>electromagnetic</strong> effects (EME) in the 1970s.From that time until now, there have been dramatic advances resultingin large capability growth with simultaneous reducti<strong>on</strong>s in computingcost. The net result is that the TDFD method can form thecore of a powerful simulati<strong>on</strong> capability, useful for virtual EME system-levelverificati<strong>on</strong> and dem<strong>on</strong>strati<strong>on</strong>.EMC Absorbers Through the Years with Respect to the NewSite Validati<strong>on</strong> Procedure in the Frequency Range from 1 to18 GHz — A Practical ApproachFriedrich-Wilhelm Trautnitz, Albatross Projects GmbHThis paper describes the development of EMC absorbers and EMCchambers until today. The first anechoic chamber in Europe was builtin the mid sixties. Due to the fact that absorber chambers were notnecessary in the early sixties, EMC measurements were easily possible<strong>on</strong> open area test sites (OATS). This project was for many years the<strong>on</strong>ly EMC chamber in Europe. The market for EMC chambersincreased with increasing radio services because of ambient noise. Inthe mid eighties the market for EMC chambers again awoke. Thetechnical requirement for EMC chambers was to fulfill the VDE 0871.At the end of the eighties VDE founded a special committee discussingthe requirements of alternate test sites. The volume methodfor validating test sites first was integrated in ANSI C 63.4 – 1988.In Cenelec – the European committee – a working group was alsofounded for establishing an EN standard for alternate test sites. Theresult was the EN 50147-1 (shielding) and -2 (NSA site validati<strong>on</strong>).The volume method was integrated in CISPR 16 in the mid nineties.Meanwhile the volume method for NSA measurement of alternate testsites is well established. The technical development of EMC absorberswill be described discussing pyramidal foam absorbers, hollow pyramidalfoam absorbers, and hybrid absorbers – a combinati<strong>on</strong> of severalabsorbers (ferrite and foam absorber). New inventi<strong>on</strong>s like pyramidalfoil absorbers will also be discussed. The new site validati<strong>on</strong> (siteVSWR) procedure from 1 to 18 GHz is shown.Fifty Years of EMC Research at Georgia TechHugh Denny, Georgia Tech Research InstituteResearch studies in <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC) have beenunderway at GTRI since 1953. Investigati<strong>on</strong>s have ranged fromstudies of the n<strong>on</strong>linear properties of solid state juncti<strong>on</strong>s to thedevelopment of c<strong>on</strong>trol methods for widely dispersed systems.Highlights of accomplishments and c<strong>on</strong>tributi<strong>on</strong>s during this halfcenturyplus are presented.EMC of Integrated Circuits: A Historical ReviewEtienne Sicard, Institut Nati<strong>on</strong>al des Sciences Appliquées (INSA) of ToulouseThis paper provides a n<strong>on</strong> exhaustive review of the research work c<strong>on</strong>ductedin the field of integrated circuit <strong>electromagnetic</strong> <strong>compatibility</strong>over the past 40+ years.Military Aircraft Electromagnetic Compatibility: Release toService Testing in the United Kingdom, Past, Present and FutureTimothy J. Duggan, Systems Evaluati<strong>on</strong> Services, QinetiQRelease to Service (RTS) Electromagnetic Compatibility (EMC) testingof military aircraft in the United Kingdom (UK), can be tracedback as far as 1932 c<strong>on</strong>cerning the effect of engine interference <strong>on</strong> anaircraft’s communicati<strong>on</strong> systems. However, it was interference seento aircraft weap<strong>on</strong>s and electrical systems during operati<strong>on</strong>s from aircraftcarriers in the 1960s that resulted in the significant expansi<strong>on</strong>of the EMC assessment and test capabilities by QinetiQ (and its predecessororganizati<strong>on</strong>s) at Boscombe Down, Farnborough, and by aircraftprime c<strong>on</strong>tractors. This paper describes the evoluti<strong>on</strong> of EMCtest methods and facilities used to assess UK military aircraft fromthe 1960s to the present and into the future, taking into account theadvances in avi<strong>on</strong>ics technology and the associated challenges inassessing their suitability for RTS.EMC MEASUREMENTS IDevelopment and Applicati<strong>on</strong> of a High-Resoluti<strong>on</strong> Thin-Film ProbeKuifeng Hu, University of Missouri-RollaA high-resoluti<strong>on</strong> thin film probe was developed and compared to ac<strong>on</strong>venti<strong>on</strong>al single loop probe, and showed a 250 µm spatialimprovement measured at a height of 250 µm over 118 µm differentialtraces. A 180 degree hybrid juncti<strong>on</strong> was used in the measurementcircuit to separate the electric and magnetic coupling from theprobe. A network analyzer with narrow band filtering was used todetect the weak signal from the probe and further determine thephase. The developed thin-film probe was successfully used to detectthe package pin current with phase informati<strong>on</strong> at clock frequencyharm<strong>on</strong>ics.The Design of an Electro-optical Modulator Used in EMCMeasurementsYinan Geng; R<strong>on</strong>g Zeng; Jinliang He; Shuiming Chen; and Bo Zhang, —Department of Electrical Engineering, Tsinghua University©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org