2007 ieee international symposium on electromagnetic compatibility

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46EMC <strong>2007</strong> ADVANCE PROGRAM5. Professor Guili He, China Telecommunication TechnologyLaboratories, China6. Mr. K. Santhosh Kumar, Dell India R&D Center, India7. Mr. Satoshi Shibata, Voluntary Control Council for Interference(VCCI) International Relations SC Chair, Panasonic, Japan8. Ms. Melinda Tan, Info-Communication Development Authority,Singapore9. Mr. Su-Jin Song, Radio Research Laboratory, Ministry ofInformation and Communication, Korea10. Mr. Andy Kwan, Industry Canada, Ottawa, Canada11. Mr. Yung-Chi Tang, Bureau of Standards, Metrology andInspection, Taiwan12. Mr. Mick Owens, Australian Communications and MediaAuthority, Australia13. Mr. W. K. Luk, Office of the Telecommunications Authority,Hong KongTUTORIALS — 8 and 9 July <strong>2007</strong>The information is current as of 30 April <strong>2007</strong>; visit www.emc<strong>2007</strong>.org for updatesLimitations of Simulation Techniques and Proper ModelValidation for Both Signal Integrity and EMCFormat: Half-day TutorialChair: Bruce Archambeault, IBM, North CarolinaAbstractThis tutorial discusses the limitations and applications of different simulationtechniques, as well as how to properly validate simulation results.It is intended to help SI and EMC engineers who know the basics of themodeling techniques learn the details of the method limitations, and tohelp them run simulations properly and efficiently. Experienced modelerscan also benefit from the discussions of model validation.Planned Speakers1. Bruce Archambeault, IBM, North Carolina2. Jim Drewniak, University of Missouri-Rolla, Missouri3. Colin Brench, Hewlett-Packard, Richardson, Texas4. Charles Bunting, Oklahoma State University, Oklahoma5. Jim Nadolny, Samtec, Pennsylvania6. Jun Fan, NCR, San Diego, CaliforniaIntroduction to EMI Modeling TechniquesFormat: Half-day TutorialChair: Charles Bunting, Oklahoma State University, OklahomaAbstractThis tutorial will provide an introduction to all of the commonly used numericalEMC modeling techniques, beginning with circuit based approaches andending with Maxwell’s equation – full field solution methods. Each techniquewill be presented along with their strengths and weakness.Planned Speakers and Topics1. The Transmission Line MethodDr. David Johns, Flomerics, Massachusetts2. Introduction to the Partial Element Equivalent Circuit TechniqueGiulio Antonini, University of L’Aquila, Italy3. The Finite-Difference Time-Domain TechniqueDr. Bruce Archambeault, IBM, North Carolina4. Understanding the Finite Element MethodDr. Charles F. Bunting, Oklahoma State University, Oklahoma5. Introduction to the Method of MomentsDr. Ji Chen, University of Houston, TexasEMC and Modern Power Electronic SystemsFormat: Half-day TutorialChair: Dr. Firuz Zare, Queensland University of Technology, AustraliaAbstractThe purpose of this tutorial is to address basic and advanced conceptsof EMC in modern power electronic systems that help EMC experts toanalyze EMC problems of power electronics used in different applications.Introducing power electronics in details such as transformer andmotor design, modulation strategy, and switching losses to EMCexperts may open a new research area and help development engineersto find better solutions to minimize sources of EMI noise at the developmentphase and improve cost, size and performance of the system.Planned Topics• Power Electronics: topologies, applications, pulse width modulation• Major EMI problems in power electronic systems• Active EMI filters used in motor drives• Methods to predict and minimize conducted emission noise inmotor drive systems• Important feedbacks from EMC experts to development engineersBasic EMC MeasurementsFormat: Half-day TutorialChair: Don Heirman, Don HEIRMAN Consultants, New JerseyAbstractThe tutorial will present an introduction to basic EMC measurementswith primary focus on emission testing. While intended for those newto this discipline, the tutorial will provide to the attendees the latestactivity in national and <strong>international</strong> standards related to EMC measurementsand standards. A special focus continues to be on measurementsand associated test facility and calibration issues above 1 GHzas well as associated measurement uncertainties.Planned Speakers and Topics1. Table Top EUT Emission MeasurementsSteve Koster, Washington Laboratories, Maryland2. Floor Standing EUT Emission MeasurementsBob Hofmann, Hofmann EMC Engineering, Illinois3. Transient Immunity TestingTom Braxton, Braxton EMC Consulting, Illinois4. Continuous RF Immunity TestingJohn Maas, IBM, Minnesota5. Measurement Sites and Associated ErrorsDon Heirman, Don HEIRMAN Consultants, New Jersey6. Selecting a Quality Test LabDan Hoolihan, Hoolihan EMC Consulting, Minnesota7. Measurement Uncertainty as it Applies to Pass/Fail ResultsDon Heirman, Don HEIRMAN Consultants, New JerseyEMC Aspects of LightningPart 1: Lightning Characteristics and ModelingFormat: Half-day TutorialChairs:Dr. Farhad Rachidi, Swiss Federal Institute of Technology,©<strong>2007</strong> IEEE www.emc<strong>2007</strong>.org
EMC <strong>2007</strong> ADVANCE PROGRAM 47SwitzerlandVladimir Rakov, University of Florida, FloridaRajeev Thottappillil, Uppsala University, SwedenAbstractLightning represents one of the most important sources of electromagneticdisturbances. The objective of this tutorial is to give anoverview of measured and modeled lightning parameters and todescribe lightning’s major EMC interactions with systems for engineeringapplications with an insight into protection methods.Planned Speakers and Topics1. Lightning Currents for Engineering ApplicationsAlberto Borghetti, University of Bologna, ItalyGerhard Diendorfer, Austrian Electrotechnical Association, AustriaVladimir Rakov, University of Florida, Florida2. Lightning Electric and Magnetic FieldsVladimir Rakov, University of Florida, Florida3. Lightning Return Stroke Models and Electromagnetic FieldComputationRajeev Thottappillil, Uppsala University, SwedenVernon Cooray, Uppsala University, SwedenNelson Theethayi, Uppsala University, Sweden4. Lightning to Tall StructuresYoshihiro Baba, Doshisha University, JapanFridolin Heidler, University of the Federal Armed Forces, Munich,GermanyFarhad Rachidi, Swiss Federal Institute of Technology, SwitzerlandRajeev Thottappillil, Uppsala University, Sweden5. Lightning Location SystemsGerhard Diendorfer, Austrian Electrotechnical Association, AustriaMarcos Rubinstein, University of Applied Sciences, SwitzerlandEMC Aspects of LightningPart 2: Lightning Interaction with Systems and ProtectionFormat: Half-day TutorialChairs:Dr. Farhad Rachidi, Swiss Federal Institute of Technology,SwitzerlandVladimir Rakov, University of Florida, FloridaRajeev Thottappillil, Uppsala University, SwedenAbstractLightning represents one of the most important sources of electromagneticdisturbances. The objective of this tutorial is togive an overview of measured and modeled lightning parametersand to describe lightning’s major EMC interactions with systemsfor engineering applications with an insight into protectionmethods.Planned Speakers and Topics1. Grounding Systems for High Frequencies and TransientsLeonid Grcev, Sts. Cyril and Methodius University, Skopje,Macedonia2. Lightning Protection of Buildings and Laboratory TestingStanislaw Grzybowski, Mississippi State University, Mississippi3. Lightning-Induced Voltages on Overhead LinesCarlo Alberto Nucci, University of Bologna, ItalyFarhad Rachidi, Swiss Federal Institute of Technology, Switzerland4. Lightning Protection of Power SystemsCarlo Alberto Nucci, University of Bologna, ItalyMario Paolone, University of Bologna, Italy5. Lightning Interaction with Electrified RailwaysNelson Theethayi, Uppsala University, SwedenRajeev Thottappillil, Uppsala University, Sweden6. Lightning Interaction with AircraftAnders Larsson, Swedish Defence Research Agency, SwedenFundamentals of EMC and NARTE Exam PreparationFormat: Full-day TutorialChair: Randy Jost, Utah State University, UtahAbstractOrganized by the EMC Society Education and Student ActivitiesCommittee, this tutorial is designed to present the basics ofEMC to those who are new to the field of EMC, for those whoare seeking information on an aspect of EMC that they have notpreviously encountered, or for those who desire a refresher onthe proposed EMC topics. The last 90 minutes of this tutorial isdevoted to providing assistance to those who are preparing totake the examination to become NARTE certified EMC engineersor technicians.Speakers and Topics1. EM RadiationJohn Norgard, University of Colorado, Colorado Springs, Colorado2. Electrostatic DischargeDavid Pommerenke, University of Missouri-Rolla, Missouri3. EMI TroubleshootingDavid Hockanson, Sun Microsystems, Menlo Park, California4. EMC Case HistoriesLee Hill, SILENT Solutions, Amherst, New Hampshire5. NARTE Overview and Exam PreparationBrian Lawrence, NARTE Executive DirectorFundamentals and Applications of Antennas and FieldProbes in Radiated MeasurementsFormat: Half-day TutorialChair: Zhong Chen, ETS-Lindgren, Cedar Park, TexasAbstractThis tutorial provides an introduction to antenna and probe theoryand application relevant to EMC. This tutorial covers fundamentalprinciples of operation for various common antenna and field probeconfigurations covering the frequency spectrum associated withEMC testing. The essential descriptive characteristics of antennasand probes are defined. The implications of the antenna characteristicson EMC testing are discussed including the nature and use ofantenna factors, gain, radiation resistance, VSWR, etc.Applications of the antennas in radiated emissions and immunitiestests, and radiated site validations measurements are covered.Processing and interpretation of antenna signals by receivers andanalyzers are discussed including discussions of signal type, signalbandwidth, and filtering of signals. This tutorial will also providethe latest updates on ANSI and <strong>international</strong> standards on calibrationof the antennas and applications of antennas in radiated emissionsand immunities measurements.Planned Speakers1. Dr. Vince Rodriguez, ETS-Lindgren, Cedar Park, Texas2. Mike Windler, Chairman of ANSI ASC C63 Subcommittee 1(C63.4/C63.5), Underwriters Laboratories, Illinois3. Zhong Chen, ETS-Lindgren, Cedar Park, Texas4. Tom Holmes, Agilent Technologies, Ohio5. Dr. Qin Yu, Lucent Technologies, Ohio©<strong>2007</strong> IEEE www.emc<strong>2007</strong>.org
Page 3 and 4: WELCOME FROM THE CHAIRJanet O’Nei
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