44EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMLCL Characteristics of Power Line for Power LineCommunicati<strong>on</strong> Using the Four Port Network TheoryJun Karino; Yosuke Watanabe; Akira Mori; and Masamitsu Tokuda, —Musashi Institute of TechnologyWe calculated the transmissi<strong>on</strong> characteristics and the degree ofunbalance to the ground of the power line in the high frequencyband, in order to obtain the characteristics of the power line. The calculati<strong>on</strong>model of the power line is made by a four port network theory,which has a circuit c<strong>on</strong>stant as a chain matrix of the distributedc<strong>on</strong>stant <strong>on</strong> the transmissi<strong>on</strong> line. And we compared the calculatedvalue with the measured value. As a result, in the transmissi<strong>on</strong> losscharacteristic, it is c<strong>on</strong>firmed that the calculated value agrees wellwith the measured value, by c<strong>on</strong>sidering the c<strong>on</strong>ductance of the insulatingdielectrics of a power line. From the comparis<strong>on</strong> of the measuredand calculated values with the four port network, it is revealedthat the frequency and the level occurring hump in the L<strong>on</strong>gitudinalC<strong>on</strong>versi<strong>on</strong> Loss (LCL) characteristics agree well with each other.Comparing the calculated results from the Method of Moment(MoM) and the four port network theory, it was shown that the fourport network theory is better than MoM in calculati<strong>on</strong> accuracy.Transmissi<strong>on</strong> Characteristics of an OFDM Signal for aPower Line Communicati<strong>on</strong> System with High Bit RateAkira Mori; Yosuke Watanabe; and Masamitsu Tokuda, — MusashiInstitute of Technology; and Koji Kawamoto, Sumitomo Electric Industries, Ltd.In this paper, we measured what influence the transmissi<strong>on</strong> loss characteristicsof the electric power line with various forms gave to thetransmissi<strong>on</strong> rate of the Orthog<strong>on</strong>al Frequency Divisi<strong>on</strong>Multiplexing (OFDM) signal through the power line communicati<strong>on</strong>system (PLC) modem. We classified the electric power transmissi<strong>on</strong>line with various forms in a real envir<strong>on</strong>ment into two basic elements,which are an outlet type branch and a switch type branch.Next, the transmissi<strong>on</strong> rate is measured for a c<strong>on</strong>cise power linemodel composed of the outlet type and the switch type branches,which is c<strong>on</strong>nected with the PLC modem. As a result, it is revealedthat the transmissi<strong>on</strong> rate is marginally affected by the two branchesmenti<strong>on</strong>ed above. At this time, the transmissi<strong>on</strong> characteristics ofthe electric power line are simulated from measured data. TheOFDM sending and receiving systems are composed <strong>on</strong> the computerand the transmissi<strong>on</strong> rate is simulated. It is clear that the transmissi<strong>on</strong>rates simulated agree with that measured.EMC Analysis of a Wind Turbine Blade’s LightningProtecti<strong>on</strong> SystemBastian Lewke; Josef Kindersberger; Sebastian Krämer; and Fernando PuenteLeón, — Technische Universität München; Yarú Méndez Hernández, GE GlobalResearch; and Jörg Kirchhof, Institut fuer Solare EnergieversorgungstechnikAn <strong>electromagnetic</strong> analysis of a wind turbine blade’s lightning protecti<strong>on</strong>system will be given. Impedance measurements <strong>on</strong> a 16 mblade tip are performed for a frequency sweep up to 30 MHz. Theinfluence of the blade’s positi<strong>on</strong> is analyzed. Measurement data isused to derive a method-of-moments model with a commercial tool.The method-of-moments model will be compared to a finite elementmodel. Both models will be used to derive the <strong>electromagnetic</strong> interferencecaused by the <strong>electromagnetic</strong> fields radiated by the lightningprotecti<strong>on</strong> system after a lightning strike.Effect of Subject’s Size <strong>on</strong> Electromagnetic Radiati<strong>on</strong> froma Source in the Human Body Following a 2450 MHz RadioFrequency (RF) ExposureLisheng Xu; Qinghu Meng; and H<strong>on</strong>gliang Ren, — The Chinese Universityof H<strong>on</strong>g K<strong>on</strong>gFor assessment of compliance with the safety guidelines, the radiati<strong>on</strong>effects and efficiencies of ingested wireless devices in human body trunkmodels of five-year-old children, ten-year-old children, and adults arestudied using several homogenous models and a half-wavelength dipoleat the frequency of 2450 MHz in this paper. The finite-difference timedomain(FDTD) method was used for analyzing the radiati<strong>on</strong> effects andefficiencies. Results show that radiati<strong>on</strong> efficiencies decrease with theincrement of body size greatly, ranging from -53 db to -116 db.C<strong>on</strong>sidering the signal efficiency of wireless devices and safety guidelinesof radiati<strong>on</strong> exposure, we recommend to set the ingested wirelessdevice to different power levels for users with different body size such asfive-year-old children, ten-year-old children, and adults.Evaluati<strong>on</strong> of the Genotoxic Potential of MicrowaveElectromagnetic Fields in Oni<strong>on</strong> (Allium Cepa)Mirta Tkalec; Zeljka Vidakovic-Cifrek; and Branka Pevalek-Kozlina, —Department of Botany, University of Zagreb; Kresimir Malaric; RomanMalaric; — Department of Wireless Communicati<strong>on</strong>, University of ZagrebAllium cepa seeds were exposed to 900 MHz EMF in a GTEM cellat four different field strengths (10, 23, 41 and 120 V m-1) for 2hours. The effects of a l<strong>on</strong>ger exposure time (4 hours) and modulati<strong>on</strong>was also investigated. The germinati<strong>on</strong> rate and root lengthdid not change significantly after EMF exposure. However, the EMFat higher strengths (41 and 120 V m-1) and with modulati<strong>on</strong>, aswell as l<strong>on</strong>ger exposure, significantly increased mitotic index comparedto corresp<strong>on</strong>ding c<strong>on</strong>trols. The percentage of mitotic abnormalities,mainly c<strong>on</strong>sisting of laggards, anaphase bridges, C-mitosis,vagrants and unequal distributi<strong>on</strong>, increased with all the given fieldc<strong>on</strong>diti<strong>on</strong>s.The Study of Electric Field Effect to Bending <strong>on</strong> the Growthof the Primary Root of RiceThyanuch Rotcharoen, Phetchabun Rajabhat UniversityThe growing of rice seeds (Oryza sativa L.) <strong>on</strong> a primary root stage aretested under the c<strong>on</strong>diti<strong>on</strong>s of an electric field at 28.5 kV/m, a varyingelectrode in the horiz<strong>on</strong>tal directi<strong>on</strong>, and without an electric field.This work focused <strong>on</strong> examining the bending of the root directi<strong>on</strong> andmeasuring the space angle after 8, 16 and 24 hours. The values withE-field and without E-field are compared. The results indicate that thepreferred directi<strong>on</strong> of root bending is toward the negative electrode.Analysis <strong>on</strong> the Propagati<strong>on</strong> of Wideband EM WavesEmitted from a Partial Discharge Using the C<strong>on</strong>strainedInterpolati<strong>on</strong> Profile (CIP) MethodMasatake Kawada, The University of Tokushima; and Katsuo Isaka, N/AMeasurements of partial discharge (PD) have been used to assess thec<strong>on</strong>diti<strong>on</strong> of insulati<strong>on</strong> material used in electric power equipment.Analysis of the <strong>electromagnetic</strong> (EM) waves emitted by the PD is usefulfrom the viewpoint of n<strong>on</strong>-c<strong>on</strong>tact diagnosis because a PD emitswideband EM waves. The c<strong>on</strong>strained interpolati<strong>on</strong> profile (CIP)method is used to visualize the EM waves emitted from a PD forunderstanding the physical mechanisms. The PD is numericallyobtained by the total amount of charge and the rise time. Numericalresults show that the CIP is useful for analyzing the relati<strong>on</strong>shipbetween the PD current and the EM waves.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org
WORKSHOPS - 8 and 9 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>The informati<strong>on</strong> is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>; visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updatesNanotechnologies and Advanced MaterialsFormat: Half-day WorkshopEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 45Advanced EMC Technologies in the Pan-Pacific Regi<strong>on</strong>Format: Half-day WorkshopChairs: Dr. Christopher L. Holloway, NIST, Boulder, ColoradoProf. Maria Sabrina Sarto, University of Rome “La Sapienza”, Rome,ItalyAbstractNanotechnology is functi<strong>on</strong>al engineering <strong>on</strong> an extremely smallscale that can be used to develop innovative advanced materials (e.g.metamaterials, frequency selective surfaces, phot<strong>on</strong>ic band gap, etc.),comp<strong>on</strong>ents and devices, and implants for numerous industrial applicati<strong>on</strong>s.It involves the c<strong>on</strong>trol of materials with a nanoscale finestructure, and with the manipulati<strong>on</strong> of tiny objects at the dimensi<strong>on</strong>of molecules and atoms. Nanotechnology is currently exploited inmicroelectr<strong>on</strong>ics, optoelectr<strong>on</strong>ics, and material science, but its applicati<strong>on</strong>in EMC is still not very wide.Planned Topics• The applicati<strong>on</strong> of carb<strong>on</strong> nanotube based nanodevices and nanostructuredmaterials for nanointerc<strong>on</strong>nects and shielding materials.Issues related to the fabricati<strong>on</strong>, the measurement of the electricaland <strong>electromagnetic</strong> properties, and the <strong>electromagnetic</strong> modelingat radio frequency will be treated.• The applicati<strong>on</strong> of metamaterial for antennas and <strong>electromagnetic</strong> filters.EMC and Wireless DevicesFormat: Full-day WorkshopChair: Dan Hoolihan, Hoolihan EMC C<strong>on</strong>sulting, MinnesotaAbstractThe overall workshop will provide key informati<strong>on</strong> <strong>on</strong> EMC c<strong>on</strong>cernsas they pertain to present and future wireless/cellular ph<strong>on</strong>e technologiesand associated packaging issues. More specifically, thisworkshop will address the <strong>electromagnetic</strong> interference (EMI) aspectsof the proliferati<strong>on</strong> of modern wireless devices such as current radioand cell ph<strong>on</strong>e technologies. It will address both EMI from productto product such as cellular ph<strong>on</strong>es, wireless radio devices, and packaging,as well as relevant spectrum allocati<strong>on</strong> issues.Planned Topics• EMI from Licensed Cell and Wireless Transmitters• EMI for Unlicensed Cell and Wireless Transmitters• Telecom Certificati<strong>on</strong> Body (TCB) Issues with Wireless/Telecommunicati<strong>on</strong>s Devices• EMI and Future Wireless and Cellular Technologies• Internati<strong>on</strong>al and Regulatory Aspects of EMI AndWireless/Cellular Devices• The New ANSI C63.10 Standard For Testing Unlicensed WirelessDevicesPlanned Speakers1. Dave Case, Cisco Systems, Richm<strong>on</strong>d, Ohio2. Mike Violette, Washingt<strong>on</strong> Laboratories, Maryland3. Michael Foegelle, ETS-Lindgren, Cedar Park, Texas4. Kevin Slattery, Intel Corporati<strong>on</strong>, Oreg<strong>on</strong>5. Harry Skinner, Intel Corporati<strong>on</strong>, Oreg<strong>on</strong>6. Steve Berger, TEM C<strong>on</strong>sulting, Georgetown, Texas7. Andrew Drozd, ANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>s, Rome, New York8. Art Wall, Radio Regulatory C<strong>on</strong>sultants, Inc., MarylandChair: Professor Ryuji Koga, Okayama University, JapanAbstractTaking the opportunity of <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium <strong>on</strong>EMC being held in Hawaii, to focus <strong>on</strong> and introduce the latest EMCtechnologies in the Pan-Pacific regi<strong>on</strong>, EMCJ Technical Group in theInstitute of Electr<strong>on</strong>ics, Informati<strong>on</strong> and Communicati<strong>on</strong> Engineersproposed the workshop entitled “Advanced EMC Technologies in thePan-Pacific Regi<strong>on</strong>”.Planned Topics• Crosstalk in Complex Printed Circuits• Envir<strong>on</strong>mental EMC• PCB analysis• EMC in Power Electr<strong>on</strong>ics• Biological EMCPlanned Speakers1. D<strong>on</strong>g Chul Park, Chungnam Nati<strong>on</strong>al University, Daeje<strong>on</strong>, Korea2. Gao Yougang, Beijing University of Posts & Telecommunicati<strong>on</strong>s,Beijing, China3. Werachet Khan-ngern, King M<strong>on</strong>gkut’s Institute of TechnologyLadkrabang, Thailand4. Osamu Fujiwara, Nagoya Institute of Technology, Japan5. Le-Wei Li, Nati<strong>on</strong>al University of Singapore, Singapore6. Shuichi Nitta, Salesian Polytechnic, JapanManaging Regulatory Access to Asia Pacific MarketsFormat: Full-day WorkshopChairs:Mr. Kwok Soohoo, Site EMC Coordinator, IBM, Poughkeepsie, New YorkMs. Mary Jo DiBernardo, Program Manager, Nati<strong>on</strong>al Institute ofStandards and Technology (NIST), MarylandMr. William Hurst, Chief of Technical Research Branch, FederalCommunicati<strong>on</strong>s Commissi<strong>on</strong> (FCC), Washingt<strong>on</strong> D.C.AbstractMarkets in the Asia Pacific regi<strong>on</strong> are heavily sought after, butkeeping up with technical regulati<strong>on</strong>s around the world can be achallenge. EMC regulatory requirements vary widely, and rulesregarding testing, product certificati<strong>on</strong>, declarati<strong>on</strong> of c<strong>on</strong>formity,registrati<strong>on</strong>, and MRAs (Mutual Recogniti<strong>on</strong> Agreements) can bec<strong>on</strong>fusing and costly for manufacturers – and the test labs and certificati<strong>on</strong>bodies who serve them – to effectively market their productsin these countries. In this workshop, participants will learnabout the EMC regulatory requirements of various Asia Pacificcountries, as well as the U.S. and Canada, and the steps that are necessaryin order to successfully market a product to some of the countriesin this regi<strong>on</strong>.Planned Speakers1. Mr. Kwok Soohoo, IBM, Poughkeepsie, New York2. Ms. Mary Jo DiBernardo, Nati<strong>on</strong>al Institute of Standards andTechnology, Maryland3. Mr. William Hurst, Federal Communicati<strong>on</strong>s Commissi<strong>on</strong>,Washingt<strong>on</strong> D. C.4. Mr. Wei Chen, China Quality Certificati<strong>on</strong> Center, China©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org